TIA-455-127-A-2006 FOTP-127-A Basic Spectral Characterization of Laser Diodes《FOTP-127 多模激光二极管的光学特性 光纤的性能》.pdf

《TIA-455-127-A-2006 FOTP-127-A Basic Spectral Characterization of Laser Diodes《FOTP-127 多模激光二极管的光学特性 光纤的性能》.pdf》由会员分享，可在线阅读，更多相关《TIA-455-127-A-2006 FOTP-127-A Basic Spectral Characterization of Laser Diodes《FOTP-127 多模激光二极管的光学特性 光纤的性能》.pdf（30页珍藏版）》请在麦多课文档分享上搜索。

1、 TIA-455-127-A-2006 APPROVED: NOVEMBER 30, 2006 REAFFIRMED: OCTOBER 6, 2014 TIA-455-127-A November 2006FOTP- 127-A Basic Spectral Characterization of Laser Diodes NOTICE TIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between

2、 manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for their particular need. The existence of such Standards and Publications shall not in any respect preclude any m

3、ember or non-member of TIA from manufacturing or selling products not conforming to such Standards and Publications. Neither shall the existence of such Standards and Publications preclude their voluntary use by Non-TIA members, either domestically or internationally. Standards and Publications are

4、adopted by TIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, TIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This Standard does not purport to addre

5、ss all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. Any use of trademarks in t

6、his document are for information purposes and do not constitute an endorsement by TIA or this committee of the products or services of the company. (From Project No. PN-3-2160-RV1-A-RF1, formulated under the cognizance of the TIA TR-42 Telecommunications Cabling Systems, TR-42.11 Subcommittee on Opt

7、ical Systems (568). Published by TELECOMMUNICATIONS INDUSTRY ASSOCIATION Technology (b) there is no assurance that the Document will be approved by any Committee of TIA or any other body in its present or any other form; (c) the Document may be amended, modified or changed in the standards developme

8、nt or any editing process. The use or practice of contents of this Document may involve the use of intellectual property rights (“IPR”), including pending or issued patents, or copyrights, owned by one or more parties. TIA makes no search or investigation for IPR. When IPR consisting of patents and

9、published pending patent applications are claimed and called to TIAs attention, a statement from the holder thereof is requested, all in accordance with the Manual. TIA takes no position with reference to, and disclaims any obligation to investigate or inquire into, the scope or validity of any clai

10、ms of IPR. TIA will neither be a party to discussions of any licensing terms or conditions, which are instead left to the parties involved, nor will TIA opine or judge whether proposed licensing terms or conditions are reasonable or non-discriminatory. TIA does not warrant or represent that procedur

11、es or practices suggested or provided in the Manual have been complied with as respects the Document or its contents. If the Document contains one or more Normative References to a document published by another organization (“other SSO”) engaged in the formulation, development or publication of stan

12、dards (whether designated as a standard, specification, recommendation or otherwise), whether such reference consists of mandatory, alternate or optional elements (as defined in the TIA Procedures for American National Standards) then (i) TIA disclaims any duty or obligation to search or investigate

13、 the records of any other SSO for IPR or letters of assurance relating to any such Normative Reference; (ii) TIAs policy of encouragement of voluntary disclosure (see TIA Procedures for American National Standards Annex C.1.2.3) of Essential Patent(s) and published pending patent applications shall

14、apply; and (iii) Information as to claims of IPR in the records or publications of the other SSO shall not constitute identification to TIA of a claim of Essential Patent(s) or published pending patent applications. TIA does not enforce or monitor compliance with the contents of the Document. TIA do

15、es not certify, inspect, test or otherwise investigate products, designs or services or any claims of compliance with the contents of the Document. ALL WARRANTIES, EXPRESS OR IMPLIED, ARE DISCLAIMED, INCLUDING WITHOUT LIMITATION, ANY AND ALL WARRANTIES CONCERNING THE ACCURACY OF THE CONTENTS, ITS FI

16、TNESS OR APPROPRIATENESS FOR A PARTICULAR PURPOSE OR USE, ITS MERCHANTABILITY AND ITS NONINFRINGEMENT OF ANY THIRD PARTYS INTELLECTUAL PROPERTY RIGHTS. TIA EXPRESSLY DISCLAIMS ANY AND ALL RESPONSIBILITIES FOR THE ACCURACY OF THE CONTENTS AND MAKES NO REPRESENTATIONS OR WARRANTIES REGARDING THE CONTE

17、NTS COMPLIANCE WITH ANY APPLICABLE STATUTE, RULE OR REGULATION, OR THE SAFETY OR HEALTH EFFECTS OF THE CONTENTS OR ANY PRODUCT OR SERVICE REFERRED TO IN THE DOCUMENT OR PRODUCED OR RENDERED TO COMPLY WITH THE CONTENTS. TIA SHALL NOT BE LIABLE FOR ANY AND ALL DAMAGES, DIRECT OR INDIRECT, ARISING FROM

18、 OR RELATING TO ANY USE OF THE CONTENTS CONTAINED HEREIN, INCLUDING WITHOUT LIMITATION ANY AND ALL INDIRECT, SPECIAL, INCIDENTAL OR CONSEQUENTIAL DAMAGES (INCLUDING DAMAGES FOR LOSS OF BUSINESS, LOSS OF PROFITS, LITIGATION, OR THE LIKE), WHETHER BASED UPON BREACH OF CONTRACT, BREACH OF WARRANTY, TOR

19、T (INCLUDING NEGLIGENCE), PRODUCT LIABILITY OR OTHERWISE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. THE FOREGOING NEGATION OF DAMAGES IS A FUNDAMENTAL ELEMENT OF THE USE OF THE CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS. TIA -455-127-A iiFOTP

20、-127-A Spectral Characterization of Laser Diodes Contents FOREWORDIII 1 INTRODUCTION .1 2 NORMATIVE REFERENCES1 3 APPARATUS.2 4 SAMPLING AND SPECIMENS .2 5 PROCEDURE A 3 6 PROCEDURE B 4 7 CALCULATIONS OR INTERPRETATION OF RESULTS 6 8 DOCUMENTATION .14 9 SPECIFICATION INFORMATION.15 ANNEX A16 REFEREN

21、CES .17 TIA -455-127-A iiiFOTP-127-ASpectral Characterization of Laser Diodes Foreword Continuation of FOTP 127, Spectral Characterization of Multimode Laser Diodes. This FOTP is part of the series of test procedures included within Recommended Standard TIA/EIA-455. Key words: Optical Spectrum Laser

22、 Diode Spectral Width TIA -455-127-A 11 Introduction 1.1 Intent This test procedure defines and updates the methodology for measuring the center (mean) wavelength, peak wavelength and the spectral width (rms1) of multilongitudinal mode (MLM), multitransverse mode (MTM), and single mode (SM) semicond

23、uctor lasers using a dispersive spectrophotometric method or other suitable methods. For SM lasers, only center wavelength should be used and it should be noted that other spectral characteristics, such as Side Mode Suppression Ratio (SMSR), Stop Band (SB) for distributed feedback (DFB) lasers for e

24、xample, are not covered by this document. Other measures of spectral width for MM lasers are also retained from previous versions of this document. Recent studies on the measurement of the optical spectrum from various coherent sources into multimode fiber have highlighted issues with measurement re

25、peatbility due to speckle pattern variations and launch conditioning of the optical source into the multimode optical fiber. In addition, using multitransverse mode sources, such as some VCSELs, with singelmode optical fiber can lead to undersampling of the complete optical spectrum. 1.2 Hazards Thi

26、s procedure involves potentially hazardous operations as discussed in this section. During the measurement, a laser may emit non-visible light. Personnel are strongly cautioned never to look directly into the laser or any fiber optic cabling at any time. Although the optical output power is generall

27、y not very high, virtually all the power is concentrated into a narrow frequency band, which implies that the energy can be focused into a very intense spot on the retina by the lens within the viewers eyes. For a complete review of laser safety guidelines, the reader is referred to the internationa

28、l standard IEC 60825-2. 2 Normative references Test or inspection requirements may include, but are not limited to, the following references: EIA/TIA-455-A, Standard test procedures for fiber optic fibers, cables, transducers, sensors, connecting and terminating devices, and other fiber optic. 1rms

29、refers to the standard deviation (1) of a distribution TIA -455-127-A 23 Apparatus The following apparatus and equipment is required to perform this test: 3.1 Optical spectrum analyzer Use a calibrated optical spectrum analyzer (OSA) following IEC/PAS 62129: This test equipment uses a dispersion spe

30、ctrophotometric method to resolve different wavelength components in the optical output of laser diodes. The various wavelength components are displayed by the OSA. Averaging the readings from the OSA will greatly increase the repeatability of the measurement. 3.2 Power supplies Use electrical power

31、 to operate the laser diode, which may include both continuous wave (CW) and modulated operating conditions. 3.3 Fiber cabling The OSA may support either or both SM and multimode (MM) fiber cabling as the optical source input. Use fiber jumper cabling between the optical source and the OSA utilizing

32、 either SM or MM cabling consistent with the optical source and OSA. The choice of fiber cabling can greatly influence the measured optical spectrum. In many cases, the optical fiber is the entrance aperature to the measurement system. For multitransverse mode lasers, the use of single mode optical

33、fiber is not recommended. When using multimode optical fiber, the user should be aware that the launch profile of the optical source into the optical fiber can effect the measured optical spectrum. In addition, coherent effects from the source and fiber interaction such as speckle can influence the

34、measurement repeatability. It is recommended that a fiber shaker as described in TIA/EIA-455-203 (FOTP-203) be employed in the measurement to mitigate these unwanted effects. 4 Sampling and specimens This document applies to all MLM , MTM and SM lasers. It therefore includes, but is not limited to,

35、Vertical Cavity Surface Emitting Lasers (VCSELs), Fabry-Perot (FP)lasers, distributed feedback (DFB) lasers, and distributed Bragg reflector (DBR) lasers. The detailed spectral characterization of single mode sources is beyond the scope of this FOTP. The test sample may consist of one of the followi

36、ng: (1) a laser chip with an arrangement to couple light into the OSA, or (2) a laser having a pigtailed optical connector, or TIA -455-127-A 3(3) a connectorized laser diode assembly, or (4) a laser diode with means to couple light into a fiber optic cable, or (5) a piece of equipment containing an

37、y of the above. In the case of MTM or MLM sources, care must be taken to eliminate any modal selectivity in the collection optics. An example of this is spatial filtering of the laser emission due to the low acceptance numerical aperture of the optical fiber or other lensing in the light collection

38、optics. In the case of low power laser diodes, care should be taken to avoid ambient light from affecting the measurement. Optical backreflections from connectors, splices, and test equipment may affect the emitted and measured optical spectrum. Care should be taken to minimize any backreflections f

39、rom the optical system to the laser. If a certain reflection level is specified by a relevant standard, then backreflections should be controlled as specified. 5 Procedure A Procedure A is more applicable to MTM laser diodes such as VCSELs. No simple test methodology will accurately measure the spec

40、tral width of an unmodulated SM source such as a DFB laser, or SM VCSEL sources, and the methodology presented herein will only provide the user with meaningful results for the center wavelength. For resolving the spectral width of SM lasers, use either a Fabry-Perot etalon, heterodyne, or homodynin

41、g techniques. These measurement techniques are beyond the scope of this FOTP, and more information can be found in the cited references. Some modulated SM sources may yield acceptable measurements using procedure A. 5.1 With the exception of ambient temperature, the standard ambient conditions of EI

42、A/TIA 455-A shall be used, unless otherwise specified. The ambient or reference point temperature shall be 23C 2C, unless otherwise specified. 5.2 Turn on the OSA and allow the recommended warm up and settling time to achieve the rated measurement level. 5.3 Unless otherwise specified, apply an inpu

43、t electrical signal to modulate the light output at the maximum rated frequency or using communication standard specified test patterns. If the measurement is to be done under DC conditions, apply the desired current. Allow sufficient time (per manufacturers TIA -455-127-A 4recommendations or as spe

44、cified in the detail specifications) for the laser transmitter assembly to reach a steady state temperature. 5.4 Connect the optical output of the laser under test to the optical input of the OSA. 5.5 Adjust the OSA controls as follows 5.5.1 Set the OSA wavelength step size (resolution) in order to

45、adequately sample/resolve any spectral detail in the optical spectrum of the laser under test. The OSA resolution bandwidth (RBW) should then be selected as at least two times the step size in the frequency domain (Hz) in order to comply to the Nyquist criterion. (A good rule of thumb is to have at

46、least 4 measurement points in the first 3dB to define each peak) 5.5.2 Set the OSA wavelength range in order to adequately incorporate all of the detectable modes. 5.5.3 Using the gain and reference level control, set an appropriate gain of the signal such that the peak mode extends over the vertica

47、l scale. 5.5.4 It is important to adjust the scanning time, the resolution bandwidth, and the video bandwidth (if implemented in the OSA) to obtain an adequate signal to noise ratio, generally with a noise floor at least 30dB below the maximum power reading. 5.6 If available, use a log scale for the

48、 amplitude measurement to achieve the maximum dynamic range. 5.7 If available, use signal averaging of at least 10 optical spectrum measurements to obtain a stable reading. The addition of signal averaging will significantly improve the measuement repeatability. To mitigate effects of laser speckle

49、in multimode fiber, it is further recommended that a fiber shaker as described in TIA/EIA-455-203 (FOTP-203) be employeed in the measurement. 5.8 For OSAs that are not capable of performing the calculation internally, download the measured optical spectra data to a computer for further analysis in a format that contains both the wavelength and amplitude of all points in the measurement. 6 Procedure B 6.1 With the exception of ambient temperature, the standard ambient conditions of EIA/TIA-455-A shall be used, unless otherwise specified. The ambient or reference point temperatu