ETSI TS 102 230-1-2016 Smart Cards UICC-Terminal interface Physical electrical and logical test specification Part 1 Terminal features (V11 0 0 Release 11)《智能卡 通用集成电路卡终端接口 物理、电气和逻辑_1.pdf
《ETSI TS 102 230-1-2016 Smart Cards UICC-Terminal interface Physical electrical and logical test specification Part 1 Terminal features (V11 0 0 Release 11)《智能卡 通用集成电路卡终端接口 物理、电气和逻辑_1.pdf》由会员分享,可在线阅读,更多相关《ETSI TS 102 230-1-2016 Smart Cards UICC-Terminal interface Physical electrical and logical test specification Part 1 Terminal features (V11 0 0 Release 11)《智能卡 通用集成电路卡终端接口 物理、电气和逻辑_1.pdf(97页珍藏版)》请在麦多课文档分享上搜索。
1、 ETSI TS 102 230-1 V11.0.0 (2016-06) Smart Cards; UICC-Terminal interface; Physical, electrical and logical test specification; Part 1: Terminal features (Release 11) TECHNICAL SPECIFICATION ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)2 Reference RTS/SCP-00102230Tvb00 Keywords smart card, testing ETSI 6
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4、rence in contents between such versions and/or in print, the only prevailing document is the print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat. Users of the present document should be aware that the document may be subject to revision or cha
5、nge of status. Information on the current status of this and other ETSI documents is available at https:/portal.etsi.org/TB/ETSIDeliverableStatus.aspx If you find errors in the present document, please send your comment to one of the following services: https:/portal.etsi.org/People/CommiteeSupportS
6、taff.aspx Copyright Notification No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm except as authorized by written permission of ETSI. The content of the PDF version shall not be modified without the written authorizatio
7、n of ETSI. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2016. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTMand the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM and LTE are Tr
8、ade Marks of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)3 Contents Intellectual Property Rights 12g3Foreword . 12g3Modal verbs termin
9、ology 12g3Introduction 12g31 Scope 14g32 References 14g32.1 Normative references . 14g32.2 Informative references 15g33 Definitions, symbols, abbreviations and coding conventions 15g33.1 Definitions 15g33.2 Symbols 15g33.3 Abbreviations . 16g33.4 Coding conventions 17g33.5 Applicability . 17g33.5.1
10、Applicability of the present document 17g33.5.2 Applicability of the individual test cases 17g33.5.3 Applicability to terminal equipment . 17g33.6 Definitions 17g33.6.1 Format of table of the table of optional features . 17g33.6.2 Format of the applicability table . 18g33.6.3 Status and Notations .
11、18g33.7 Table of optional features . 19g33.8 Applicability table 20g34 Physical characteristic tests 24g34.1 Contact pressure . 24g34.1.1 Definition and applicability 24g34.1.2 Conformance requirement 24g34.1.2.0 Description 24g34.1.2.1 Reference 24g34.1.3 Test purpose 24g34.1.4 Method of test . 24g
12、34.1.4.1 Initial conditions . 24g34.1.4.2 Procedure 24g34.1.5 Acceptance criteria . 24g34.2 Curvature of the contacting elements . 24g34.2.1 Definition and applicability 24g34.2.2 Conformance requirement 25g34.2.2.0 Description 25g34.2.2.1 Reference 25g34.2.3 Test purpose 25g34.2.4 Method of test .
13、25g34.2.4.1 Initial conditions . 25g34.2.4.2 Procedure 25g34.2.5 Acceptance criteria . 25g35 Electrical characteristic tests 25g35.1 Test of the power transition phases 25g35.1.1 Phase preceding Terminal power on . 25g35.1.1.1 Definition and applicability . 25g35.1.1.2 Conformance requirement. 25g35
14、.1.1.3 Reference 25g35.1.1.4 Test purpose 26g35.1.1.5 Method of test . 26g35.1.1.5.1 Initial condition . 26g3ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)4 5.1.1.5.2 Procedure . 26g35.1.1.6 Acceptance criteria 26g35.1.2 Phase during UICC power on . 26g35.1.2.1 Phase during UICC power on: 3 V - 5 V 26g35.
15、1.2.1.1 Definition and applicability . 26g35.1.2.1.2 Conformance requirement . 26g35.1.2.1.3 Reference . 26g35.1.2.1.4 Test purpose 27g35.1.2.1.5 Method of test 27g35.1.2.1.6 Acceptance criteria 27g35.1.2.2 Phase during UICC power on: 1,8 V - 3 V . 27g35.1.2.2.1 Definition and applicability . 27g35.
16、1.2.2.2 Conformance requirement . 27g35.1.2.2.3 Reference . 27g35.1.2.2.4 Test purpose 27g35.1.2.2.5 Method of test 28g35.1.2.2.6 Acceptance criteria 28g35.1.3 Phase during Terminal power off . 28g35.1.3.1 Phase during Terminal power off: 3 V - 5 V . 28g35.1.3.1.1 Definition and applicability . 28g3
17、5.1.3.1.2 Conformance requirement . 28g35.1.3.1.3 Reference . 28g35.1.3.1.4 Test purpose 29g35.1.3.1.5 Method of test 29g35.1.3.1.6 Acceptance criteria 29g35.1.3.2 Phase during Terminal power off: 1,8 V - 3 V 29g35.1.3.2.1 Definition and applicability . 29g35.1.3.2.2 Conformance requirement . 29g35.
18、1.3.2.3 Reference . 30g35.1.3.2.4 Test purpose 30g35.1.3.2.5 Method of test 30g35.1.3.2.6 Acceptance criteria 30g35.1.4 Warm reset timing 30g35.1.4.1 Definition and applicability . 30g35.1.4.2 Conformance requirement. 30g35.1.4.2.0 Description 30g35.1.4.2.1 Reference . 31g35.1.4.3 Test purpose 31g35
19、.1.4.4 Method of test . 31g35.1.4.4.1 Initial conditions 31g35.1.4.4.2 Procedure . 31g35.1.4.5 Acceptance criteria 31g35.1.5 UICC type recognition and voltage switching 31g35.1.5.1 Reaction of 3 V technology Terminals on type recognition of 3 V technology UICCs 31g35.1.5.1.1 Definition and applicabi
20、lity . 31g35.1.5.1.2 Conformance requirement . 31g35.1.5.1.3 Reference . 31g35.1.5.1.4 Test purpose 32g35.1.5.1.5 Method of test 32g35.1.5.1.6 Acceptance criteria 32g35.1.5.2 Reaction of 3 V technology Terminals on type recognition of 1,8 V technology UICCs . 32g35.1.5.2.1 Definition and applicabili
21、ty . 32g35.1.5.2.2 Conformance requirement . 32g35.1.5.2.3 Reference . 32g35.1.5.2.4 Test purpose 33g35.1.5.2.5 Method of test 33g35.1.5.2.6 Acceptance criteria 33g35.1.5.3 Reaction of 1,8 V technology Terminals on type recognition of 1,8 V technology UICCs 33g35.1.5.3.1 Definition and applicability
22、 . 33g35.1.5.3.2 Conformance requirement . 33g35.1.5.3.3 Reference . 33g35.1.5.3.4 Test purpose 33g3ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)5 5.1.5.3.5 Method of test 34g35.1.5.3.6 Acceptance criteria 34g35.1.5.4 Reaction of 1,8 V technology Terminals on type recognition of 3 V technology UICCs . 34
23、g35.1.5.4.1 Definition and applicability . 34g35.1.5.4.2 Conformance requirement . 34g35.1.5.4.3 Reference . 34g35.1.5.4.4 Test purpose 34g35.1.5.4.5 Method of test 35g35.1.5.4.6 Acceptance criteria 35g35.1.5.5 Void. 35g35.1.5.6 Reaction of Terminals receiving no ATR . 35g35.1.5.6.1 Reaction of Term
24、inals receiving no ATR, 3 V - 5 V . 35g35.1.5.6.2 Reaction of Terminals receiving no ATR, 1,8 V - 3 V 36g35.2 Electrical tests on each Terminal contact . 37g35.2.1 Nominal test conditions 37g35.2.2 Electrical tests on contact C1 (Card power supply - VCC). 37g35.2.2.1 Electrical tests on contact C1,
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