DLA SMD-5962-99617 REV B-2002 MICROCIRCUIT LINEAR RADIATION HARDENED FULL BRIDGE N-CHANNEL FET DRIVER MONOLITHIC SILICON《微型电路 线型 辐射加固 全桥式N通道FET驱动器 单块硅》.pdf
《DLA SMD-5962-99617 REV B-2002 MICROCIRCUIT LINEAR RADIATION HARDENED FULL BRIDGE N-CHANNEL FET DRIVER MONOLITHIC SILICON《微型电路 线型 辐射加固 全桥式N通道FET驱动器 单块硅》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-99617 REV B-2002 MICROCIRCUIT LINEAR RADIATION HARDENED FULL BRIDGE N-CHANNEL FET DRIVER MONOLITHIC SILICON《微型电路 线型 辐射加固 全桥式N通道FET驱动器 单块硅》.pdf(27页珍藏版)》请在麦多课文档分享上搜索。
1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make change to peak pull-up current test as specified in table I. - ro 00-02-08 R. MONNIN B Make changes to paragraph 1.5. Paragraph 4.4.4.3 Dose rate upset testing deleted. Drawing updated to reflect current requirements. gt 02-08-30 R. Monnin R
2、EV SHET REV B B B B B B B B B B B B SHEET 15 16 17 18 19 20 21 22 23 24 25 26 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY RAJESH PITHADIA COLUMBUS
3、, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY RAYMOND MONNIN AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 00-01-12 MICROCIRCUIT, LINEAR, RADIATION HARDENED, FULL BRIDGE N-CHANNEL FET DRIVER, MONOLITHIC SILICON AMSC N/A REVISIO
4、N LEVEL B SIZE A CAGE CODE 67268 5962-99617 SHEET 1 OF 26 DSCC FORM 2233 APR 97 5962-E399-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN
5、G SIZE A 5962-99617 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and
6、for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class T
7、, the user is encouraged to review the manufacturers Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application. 1.2 PIN. The PIN is as shown in the following example: 5962 F 99617 01 V S C Federal stock class designator RHA designator
8、 (see 1.2.1) Devicetype (see 1.2.2) Device class designator Caseoutline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q, T and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator
9、. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit
10、 function 01 HS-4080ARH Radiation hardened, DI, full bridge N-channel FET driver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the require
11、ments for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q, V Certification and qualification to MIL-PRF-38535 T Certification and qualification to MIL-PRF-38535 with performance as specified in the device manufacturers approved quality manage
12、ment plan. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style S CDFP3-F20 20 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q, T and V or MIL-PRF-
13、38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99617 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute
14、 maximum ratings. 1/ 2/ 3/ Supply voltage (VDDand VCC). -0.3 V to 16 V Logic I / O voltages. -0.3 V to VDD+0.3 V Voltage on AHS, BHS. -6.0 V (transient) to 80 V (-55C to +125C) Voltage on ALS, BLS -2.0 V (transient) to + 2.0 V (transient) Voltage on AHB, BHB. VAHS, BHS0.3 V to VAHS, BHS+VDDVoltage o
15、n ALO, BLO. VALS, BLS0.3 V to VCC+0.3 V Voltage on AHO, BHO VAHS, BHS0.3 V to VAHB, BHB+0.3 V Input current, HDEL and LDEL. -5 mA to 0 mA Maximum power dissipation (PD) (TA +25C) 1.8 W Junction temperature (TJ). +175C Storage temperature range -55C to +150C Lead temperature (soldering, 10 seconds).
16、+300C Thermal resistance, junction-to-case (JC) 7C/W Thermal resistance, junction-to-ambient (JA) . 80C/W 1.4 Recommended operating conditions. 2/ 3/ Supply voltage (VDDand VCC). +12.0 V to +15.0 V Voltage on ALS, BLS . -1.0 V to +1.0 V Voltage on AHS, BHS. VAHS, BHS+ 5 V to VAHS, BHS+15 V Input cur
17、rent, HDEL and LDEL. -500 A to 50 A Ambient operating temperature range (TA) -55C to +125C 1.5 Radiation features: Single Event Phenomenon (SEP) effective LET no upset . -IN, IOH= -250 A 1,2,3 01 VDD0.4 V V M,D,P,L,R,F 2/ 1 VDD0.4 V OUTPUT low level output voltage VOL+IN -IN, IOL= 250 A 1,2,3 0.4 V
18、M,D,P,L,R,F 2/ 1 0.4 High level output current IOHVOUT= 6 V 1,2,3 01 -1.5 mA M,D,P,L,R,F 2/ 1 -1.5 Low level output current IOLVOUT= 6 V 1,2,3 01 2.5 mA M,D,P,L,R,F 2/ 1 2.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
19、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99617 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups D
20、evice type Limits Unit Min Max INPUT pins: DIS section Low level input voltage VIL1,2,3 01 0.8 V M,D,P,L,R,F 2/ 1 0.8 High level input voltage VIH1,2,3 01 3.0 V M,D,P,L,R,F 2/ 1 3.0 Low level input current IILVIN= 0 V 1,2,3 01 -160 A M,D,P,L,R,F 2/ 1 -160 High level input current IIHVIN= 5 V 1,2,3 0
21、1 -150 A M,D,P,L,R,F 2/ 1 -150 INPUT pins: HEN section Low level input voltage VIL1,2,3 01 0.8 V M,D,P,L,R,F 2/ 1 0.8 High level input voltage VIH1,2,3 01 3.0 V M,D,P,L,R,F 2/ 1 3.0 Low level input current IILVIN= 0 V 1,2,3 01 -160 A M,D,P,L,R,F 2/ 1 -160 High level input current IIHVIN= 5 V 1,2,3 0
22、1 -150 A M,D,P,L,R,F 2/ 1 -150 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99617 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 9 DSCC FORM
23、2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Turn-on delay pins: LDEL and HDEL section LDEL, HDEL voltage VHDEL, VLDELIHDEL= ILDEL= -100 A 1,2,3 01 5.0 5.5 V
24、 M,D,P,L,R,F 2/ 1 5.0 5.5 Gate driver output pins; ALO, BLO AHO, and BHO section Low level output voltage VOLIOUT= 100 mA 1,2,3 01 1.4 V M,D,P,L,R,F 2/ 1 1.4 High level output voltage VCC- IOUT= -100 mA 1,2,3 01 1.6 V VOHM,D,P,L,R,F 2/ 1 1.6 Peak pull-up current +IOVOUT= 0 V 1,2,3 01 0.4 A M,D,P,L,R
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