DLA SMD-5962-99616 REV A-2006 MICROCIRCUIT HYBRID DIGITAL-LINEAR 14-BIT DUAL CHANNEL ANALOG TO DIGITAL CONVERTER《微型电路 混合型 数字线型 14位双通道模数转换器 单块硅》.pdf

《DLA SMD-5962-99616 REV A-2006 MICROCIRCUIT HYBRID DIGITAL-LINEAR 14-BIT DUAL CHANNEL ANALOG TO DIGITAL CONVERTER《微型电路 混合型 数字线型 14位双通道模数转换器 单块硅》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-99616 REV A-2006 MICROCIRCUIT HYBRID DIGITAL-LINEAR 14-BIT DUAL CHANNEL ANALOG TO DIGITAL CONVERTER《微型电路 混合型 数字线型 14位双通道模数转换器 单块硅》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Updated drawing to the latest requirements. -sld 06-10-25 Raymond Monnin REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICRO

2、CIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 14-BIT, DUAL CHANNEL, ANALOG TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFEN

3、SE DRAWING APPROVAL DATE 01-02-02 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-99616 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E040-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99616 DEFENSE SUP

4、PLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in

5、 the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 99616 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish des

6、ignator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a

7、non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AD10465BZ Dual channel, 14-bit, 65 MSPS, MCM, analog to digital converter 1.2.3 Device class designator. This device class designator shall be a single le

8、tter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentat

9、ion K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality c

10、lass. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based

11、upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system

12、performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive

13、designator Terminals Package style X See figure 1 68 Leaded ceramic chip carrier Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99616 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A

14、 SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (AVCC). 0 V dc to +7.0 V dc Digital positive supply voltage (DVCC) 0 V dc to +7.0 V dc Negative supply voltage (AVEE) 0 V dc to -7.0 V dc

15、 Analog input voltage -7.0 V dc to +7.0 V dc Analog input current. -10 mA to +10 mA Digital input voltage (ENCODE). 0 V dc to +7.0 V dc ENCODE, ENCODE differential voltage . 4 V dc Digital output current -10 mA to +10 mA Gain and offset adjust voltage range . -VEEto +VCCDigital input voltage range .

16、 +0.5 V to -VEEPower dissipation (PD) . 3.8 W Thermal resistance junction-to-case (JC) 2.22C/W Thermal resistance junction-to-ambient (JA). 24.3C/W Junction temperature (TJ) +175C Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds). +300C 1.4 Recommended operating conditions.

17、Positive supply voltage (AVCC). +4.85 V dc to +5.25 V dc Digital positive supply voltage (DVCC) +3.14 V dc to +3.47 V dc Negative supply voltage (AVEE) -5.25 V dc to -4.75 V dc Case operating temperature range (TC). -40C to +85C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and ha

18、ndbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplemen

19、t thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. HANDB

20、OOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliabi

21、lity. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99616 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 (Copies of these documents are available onl

22、ine at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited her

23、ein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall

24、be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the test

25、s and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, a

26、nd physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on

27、 figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements sha

28、ll be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor simi

29、lar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device t

30、ype listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3

31、.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and h

32、erein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as

33、 modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

34、5962-99616 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -40C TC+85C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Offset error OFFERROR

35、1,2,3 01 -2.2 +2.2 %FS Offset error channel match OFFECM1,2,3 01 -1.0 +1.0 %FS 1 -3 +1 Gain error AVERROR2/ 2,3 01 -5 +5 %FS 1 -1.5 +1.5 2 -3.0 +3.0 Gain error channel match AVECM3 01 -5.0 +5.0 %FS ARIN199 101 ARIN2198 202 Analog input resistance ARIN33/ 1,2,3 01 396 404 ENCODE input (differential i

36、nput voltage) VIN3/ 4/ 1,2,3 01 0.4 Vp-p Supply currents ICCTOTAL1,2,3 01 403 mA Digital output voltage (logic “1“ voltage) VOHDVCC= +3.3 V 5/ 1,2,3 01 2.5 V Digital output voltage (logic “0“ voltage) VOLDVCC= +3.3 V 5/ 1,2,3 01 0.5 V Input capacitance CINTA= +25C 3/ 6/ 4 01 7.0 pF ENCODE pulse widt

37、h high ENCHI3/ 4,5,6 01 6.2 9.2 ns ENCODE pulse width low ENCLO3/ 4,5,6 01 6.2 9.2 ns Aperture delay matching tADMTA= +25C 3/ 4 01 500 ps Maximum conversion rate CNVMAX7/ 4,5,6 01 65 MSPS See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

38、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99616 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -40C TC +85C Group A subgroups Device type L

39、imits Unit unless otherwise specified Min Max 4 73 Analog input at 9.9 MHz 5,6 70 4 72 Analog input at 19.5 MHz 5,6 70 4 62 Spurious free dynamic range 8/ SFDR Analog input at 32.1 MHz 5,6 01 60 dBFS 4 69 Analog input at 9.9 MHz 5,6 68 4 68 Analog input at 19.5 MHz 5,6 67 Signal-to-noise ratio 9/ SN

40、R Analog input at 32.1 MHz 4,5,6 01 67 dBFS Analog input at 9.9 MHz 4,5,6 67.5 Analog input at 19.5 MHz 4,5,6 65 4 60 Signal-to-noise and distortion 10/ SINAD Analog input at 32.1 MHz 5,6 01 58 dB 4 78 fIN= 10 MHz and 11 MHz, f1 and f2 are -7 dB 5,6 78 4 68 Two tone intermodulation distortion reject

41、ion 11/ IMD fIN= 31 MHz and 32 MHz, f1 and f2 are -7 dB 5,6 01 60 dBFS See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99616 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-

42、3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -40C TC +85 Group A subgroups Device type Limits Unit unless otherwise specified Min Max Channel to channel isolation 3/ 12/ ISO TA= +25C 4 01 90 dB 1/ AVCC(anal

43、og) = +5 V dc, AVEE(analog) = -5 V dc, and DVCC(digital) = +3.3 V dc, unless otherwise specified. AVCCmay be varied from +4.85 V to +5.25 V. However, rated AC (harmonics) performance is valid only over the range; AVCC= 5.0 V to 5.25 V. 2/ Gain tests are performed on AIN1 input voltage range. 3/ Para

44、meter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 4/ All AC specifications tested by driving ENCODE and ENCODE differentially. 5/ Digital output

45、 logic levels: VCC(digital) = +3.3 V dc, CLOAD= 10 pF. Capacitive loads 10 pF will degrade performance. 6/ Input capacitance combines die and package capacitance. 7/ Maximum conversion rate allows for variation in ENCODE DUTY CYCLE of 50%, 5%. 8/ Analog input signal equals -1 dBFS; SFDR is the ratio

46、 of converter full scale to worst spur. 9/ Analog input signal power at -1 dBFS; signal-to-noise ratio (SNR) is the ratio of signal level to total noise (first 5 harmonics removed). ENCODE = 65 MSPS. SNR is reported in dBFS, related back to converter full scale. 10/ Analog input signal power at -1 d

47、BFS; signal-to-noise and distortion (SINAD) is the ratio of signal level to total noise plus harmonics. ENCODE = 65 MSPS. 11/ Two tone intermodulation distortion rejection is the ratio of the rms value of either input tone to the rms value of the worst third order intermodulation product; reported i

48、n dBFS. 12/ Channel to channel isolation tested with A channel grounded and a full scale signal applied to B channel. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99616 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A