DLA SMD-5962-96866 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH-SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf

《DLA SMD-5962-96866 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH-SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-96866 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH-SPEED CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to current requirements as specified in MIL-PRF-38535. - jak 08-11-05 Thomas M. Hess REV SHET REV A A A A A SHEET 15 16 17 18 19 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PM

2、IC N/A PREPARED BY Charles F. Saffle Jr. STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFE

3、NSE DRAWING APPROVAL DATE 96-09-06 MICROCIRCUIT, DIGITAL, ADVANCED HIGH-SPEED CMOS, OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-96866 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E021-09 Provided by IHSNot for ResaleNo

4、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96866 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels con

5、sisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the

6、PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96866 01 Q R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device class

7、es Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA d

8、evice. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54AHC373 Octal transparent D-type latch with three-state outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the prod

9、uct assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Cas

10、e outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead fin

11、ish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96866 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,

12、OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc 4/ DC input clamp current (IIK)

13、 (VINVCC) 20 mA DC output clamp current (IOK) (VOUTVCC) . 20 mA Continuous output current (IO) (VOUT= 0 V to VCC) . 25 mA Continuous current through VCCor GND 75 mA Maximum power dissipation at TA= +55C (instill air) (PD) . 500 mW Storage temperature range (TSTG) -65C to +150C Lead temperature (sold

14、ering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. 2/ 3/ 5/ Supply voltage range (VCC) . +2.0 V dc to +5.5 V dc Input voltage range (VIN) . +0.0 V dc to +5.5 V dc Output voltage range (VOUT) +0

15、.0 V to VCCMinimum high level input voltage (VIH): VCC= 2.0 V . +1.5 V VCC= 3.0 V . +2.1 V VCC= 5.0 V 0.5 V . +3.85 V Maximum low level input voltage (VIL): VCC= 2.0 V . +0.5 V VCC= 3.0 V . +0.9 V VCC= 5.0 V 0.5 V . +1.65 V Maximum high level output current (IOH): VCC= 2.0 V . -50 A VCC= 3.3 V 0.3 V

16、 . -4 mA VCC= 5.0 V 0.5 V . -8 mA Maximum low level output current (IOL): VCC= 2.0 V . +50 A VCC= 3.3 V 0.3 V . +4 mA VCC= 5.0 V 0.5 V . +8 mA Minimum input rise or fall rate (t/V): VCC= 3.3 V V 0.3 V . 100 ns/V VCC= 5.0 V V 0.5 V . 20 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stre

17、sses above the absolute maximum rating may cause permanent damage to the device, Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over

18、the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage ratings may be exceeded providing that the input and output current ratings are observed. 5/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo

19、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96866 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. Th

20、e following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufact

21、uring, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Mic

22、rocircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this d

23、rawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q

24、 and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall

25、 be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-385

26、35, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic dia

27、gram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on fig

28、ure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96866 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics

29、and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test r

30、equirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN nu

31、mber is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class

32、 M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 C

33、ertificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in

34、 order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements

35、 of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with

36、 each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and

37、 review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group as

38、signment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 38 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96866 DEFE

39、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ U

40、nit Min Max2.0 V 1.9 3.0 V 2.9 IOH= -50 A 4.5 V 1, 2, 3 4.4 1 2.58 IOH= -4 mA 3.0 V 2, 3 2.48 1 3.94 High level output voltage 3006 VOHFor all inputs affecting outputs under test, VIN= VIHor VILFor all other inputs, VIN= VCCor GND IOH= -8 mA 4.5 V 2, 3 3.8 V 2.0 V 0.10 3.0 V 0.10 IOH= 50 A 4.5 V 1,

41、2, 3 0.10 1 0.36 IOH= 4 mA 3.0 V 2, 3 0.50 1 0.36 Low level output voltage 3007 VOLFor all inputs affecting outputs under test, VIN= VIHor VILFor all other inputs, VIN= VCCor GND IOH= 8 mA 4.5 V 2, 3 0.50 V 1 +0.1 Input current high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VIN= VC

42、Cor GND 5.5 V 2, 3 +1.0 A 1 -0.1 Input current low 3009 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor GND 5.5 V 2, 3 -1.0 A 1 +0.25 Three-state output leakage current, high 3021 IOZHOE = VIHFor all other inputs, VIN= VCCor GND VOUT= VCC5.5 V 2, 3 +2.5 A 1 -0.25 Three-state outpu

43、t leakage current, low 3020 IOZLOE = VIHFor all other inputs, VIN= VCCor GND VOUT= GND 5.5 V 2, 3 -2.5 A 1 4.0 Quiescent supply current, 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0 A 5.5 V 2, 3 40 A Input capacitance 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Output capacitance 30

44、12 COUTTC= +25C VOUT= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Power dissipation capacitance CPD4/ CL= 50 pF minimum f = 1 MHz see figure 4 5.0 V 4 18.0 pF VOLP5/ 5.0 V 4 1500 Low level ground bounce noise VOLV5/ 5.0 V 4 -1500 mV VOHP5/ 5.0 V 4 750 High level VCCbounce noise VOHV5/ VIH= VCC, VIL= 0.0 V

45、TA= +25C See 4.4.1d See figure 4 5.0 V 4 -1250 mV See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96866 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A

46、 SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol VCCGroup A subgroups Limits 3/ Unit Test conditions 2/ -55C TC +125C +2.0 VCC +5.5 V unless otherwise specified Min Max 2.0 V 3.0 V Functional tests 3014 6/ VIN= VIHor

47、 VILVerify output VOSee 4.4.1b 5.5 V 7, 8 L H 3.0 V and 3.6 V 9, 10, 11 5.0 Pulse duration, LE high twCL= 50 pF minimum See figure 5 4.5 V and 5.5 V 9, 10, 11 5.0 ns 3.0 V and 3.6 V 9, 10, 11 4.0 Setup time, data high or low before LE tsuCL= 50 pF minimum See figure 5 4.5 V and 5.5 V 9, 10, 11 4.0 n

48、s 3.0 V and 3.6 V 1.0 Hold time, data high or low after LE thCL= 50 pF minimum See figure 5 4.5 V and 5.5 V 9, 10, 11 1.0 ns 9 11.4 3.0 V and 3.6 V 10, 11 1.0 13.5 9 7.2 CL= 15 pF minimum See figure 5 8/ 4.5 V and 5.5 V 10, 11 1.0 8.5 ns 9 14.9 3.0 V and 3.6 V 10, 11 1.0 17.0 9 9.2 tPLH17/ CL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 1.0 10.5 ns 9 11.4 3.0 V and 3.6 V 10, 11 1.0 13.5 9 7.2 CL= 15 pF minimum See figure 5 8/ 4.5 V and 5.5 V 10, 11 1.0 8.5 ns 9 14.9 3.0 V and 3.6 V 10, 11 1.0 17.0 9 9.2 Propagation dela