DLA SMD-5962-91513 REV A-2009 MICROCIRCUIT DIGITAL HIGH SPEED CMOS AND-OR-INVERT GATES MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct functional test condition and footnote 4/ in the Table I. Update boilerplate paragraphs to current requirements of MIL-PRF-38535. - MAA 09-08-07 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A A A OF SHEETS SHEET 1

2、 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Wanda L. Meadows DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas J. Ricciuti THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRC

3、UIT, DIGITAL, HIGH SPEED CMOS, AND-OR-INVERT GATES, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-03-05 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-91513 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E413-09 Provided by IHSNot for ResaleNo reproduction or

4、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high

5、reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. Th

6、e PIN is as shown in the following example: 5962 - 91513 01 M C A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA

7、 marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 D

8、evice type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54HC51 2-wide, 2-input and 2-wide, 3-input AND-OR-INVERT gates 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance le

9、vel as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). Th

10、e case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classe

11、s Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 223

12、4 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input diode current (IIK) (VI 0 V, VI VCC) 20 mA DC output diode current (IOK) (VO 0 V, VO VCC) 20 mA DC drain current (IOUT) (0 V VO VCC) (per output) . 25 mA DC VCCor GND current (ICCor IGND) per p

13、in 50 mA Maximum power dissipation (PD) . 500 mW 4/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 1/ 2/ 3/ Supply voltage

14、 range (VCC) 2.0 V dc to +6.0 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) . +0.0 V dc to VCCCase operating temperature range (TC) . -55C to +125C Minimum high level input voltage (VIH): VCC= 2.0 V 1.5 V dc VCC= 4.5 V 3.15 V dc VCC= 6.0 V 4.2 V dc Maximum low level inpu

15、t voltage (VIL): VCC= 2.0 V 0.3 V dc VCC= 4.5 V 0.9 V dc VCC= 6.0 V 1.2 V dc Input rise or fall time (tr, tf): VCC= 2.0 V 1000 ns VCC= 4.5 V 500 ns VCC= 6.0 V 400 ns Maximum high level output current (IOH) -5.2 mA at VCC= 6.0 V Maximum low level output current (IOL) +5.2 mA at VCC= 6.0 V 1/ Stresses

16、 above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. The maximum junction temperature may be exceeded for allowable short duration burn-in screening conditions in accordance with method 5

17、004 of MIL-STD-883. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For packages with multiple VCCand GND pins, this value represents the tota

18、l current into all VCC or GND. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUM

19、ENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFE

20、NSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List

21、of Standard Microcircuit Drawings MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Governmen

22、t publications. The following document(s) form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. ELECTRONIC INDUSTRIES ALLIANCE (EIA) JESD 7A - Standard for Description of 54/74HCXXXX and

23、 54/74HCTXXXX High-Speed CMOS Devices. (Copies of these documents are available online at http:/www.eia.org/ or from the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the refe

24、rences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in

25、accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance w

26、ith MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and

27、herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 2. 3.2.4 Logic diagram. The

28、 logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI

29、ZE A 5962-91513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation p

30、arameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The

31、 part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product

32、using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes

33、Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer

34、in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-V

35、A prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conforma

36、nce. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to

37、DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacture

38、rs facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 40 (see MIL-PRF-38535,

39、appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Table I. Electrical performance chara

40、cteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +6.0 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOH1 For all inputs affecting output under test VIN= VIHor VIL, VIH= 1.5 V, VIL= 0.3 V For a

41、ll other inputs, VIN= VCCor GND IOH= -20A 2.0 V 1, 2, 3 1.9 V VOH2 For all inputs affecting output under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOH= -20A 4.5 V 1, 2, 3 4.4 VOH3 For all inputs affecting output under test VIN= VIHor VIL, VIH= 4.2 V, VIL= 1.2

42、V For all other inputs, VIN= VCCor GND IOH= -20A 6.0 1, 2, 3 5.9 VOH4 For all inputs affecting output under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOH= -4 mA 4.5 V 1 3.98 2, 3 3.7 VOH5 For all inputs affecting output under test VIN= VIHor VIL, VIH= 4.2 V, V

43、IL= 1.2 V For all other inputs, VIN= VCCor GND IOH= -5.2 mA 6.0 V 1 5.48 2, 3 5.2 Low level output voltage 3007 VOL1For all inputs affecting output under test VIN= VIHor VIL, VIH= 1.5 V, VIL= 0.3 V For all other inputs, VIN= VCCor GND IOL= +20A 2.0 V 1, 2, 3 0.1 V VOL2For all inputs affecting output

44、 under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOL= +20A 4.5 V 1, 2, 3 0.1 VOL3For all inputs affecting output under test VIN= VIHor VIL, VIH= 4.2 V, VIL= 1.2 V For all other inputs, VIN= VCCor GND IOL= +20A 6.0 1, 2, 3 0.1 VOL4For all inputs affecting outpu

45、t under test VIN= VIHor VIL, VIH= 3.15 V, VIL= 0.9 V For all other inputs, VIN= VCCor GND IOL= +4 mA 4.5 V 1 0.26 2, 3 0.4 VOL5For all inputs affecting output under test VIN= VIHor VIL, VIH= 4.2 V, VIL= 1.2 V For all other inputs, VIN= VCCor GND IOL= +5.2 mA 6.0 V 1 0.26 2, 3 0.4 Input leakage curre

46、nt high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VCCor GND 6.0 V 1 +0.1 A 2, 3 +1.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91513 DEFENSE SUPPLY CENTE

47、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Table I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +6.0 V unless otherwise specified VCCGroup A subgroups Limits 3/ Uni

48、t Min Max Input leakage current low 3009 IILFor input under test, VIN= VCCFor all other inputs, VCCor GND 6.0 V 1 -0.1 A 2, 3 -1.0 Quiescent supply current output high 3005 ICCHFor all inputs, VIN= VCCor GND 6.0 V 1 2.0 A 2, 3 40 Quiescent supply Current output low 3005 ICCLFor all inputs, VIN= VCCor GND 6.0 V 1 2.0 A 2, 3 40 Input capacitance CINTA= +25C, VIN= VCCor GND; see 4.4.1c GND 4 10 pF Functional tests 3014 4/ Verify output VOSee 4.4.1b 2.0 V 7, 8 L H 4.5 V 6.0 V Propagation delay time, 3003 tPLH, tPHLCL= 50 pF minimum See