DLA SMD-5962-90574-1990 MICROCIRCUITS DIGITAL HIGH SPEED CMOS 8-BIT SYNCHRONOUS BCD DOWN COUNTER TTL COMPATIBLE MONOLITHIC SILICON《硅单片 TTL可兼容输入 8位同步二-十进降值计数器 高速氧化物半导体 数字微型电路》.pdf

《DLA SMD-5962-90574-1990 MICROCIRCUITS DIGITAL HIGH SPEED CMOS 8-BIT SYNCHRONOUS BCD DOWN COUNTER TTL COMPATIBLE MONOLITHIC SILICON《硅单片 TTL可兼容输入 8位同步二-十进降值计数器 高速氧化物半导体 数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90574-1990 MICROCIRCUITS DIGITAL HIGH SPEED CMOS 8-BIT SYNCHRONOUS BCD DOWN COUNTER TTL COMPATIBLE MONOLITHIC SILICON《硅单片 TTL可兼容输入 8位同步二-十进降值计数器 高速氧化物半导体 数字微型电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、i LTR DESCRIPTION RCITE (MI-LIO-DA) APPROVED AMSC NIA SHEET i OF 14 I I *US. COVIRNMENT PRINTING OffKt: 1W7 - 74 distribution Is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-L SMD-5962-70574 59 m 999999b 0000978 4 m STANDARDIZED MILITAR

2、Y DRAWING 1. SCOPE Scope. This drawing describes device regUireMntS for class B microcircuits in accordance rith 1.mf MIL-STD-883, Provisions for the use of MIL-STD-883 in conjunction with compliant ion-JAN devices .2 Part number. The complete part number shall be as shown in the following example:

3、SIZE A 5962-90574 5462-90574 I I o1 -r I E -r I X T I I I I I Drawing number Device type Case outline Lead finish per (1.2.1) (1.2.2) MI L-M-38510 1.2.1 Device type. The device type shall identify the circuit function as follows: Device type Generic number Circuit function o1 54HCT40102 8-bit synchr

4、onous BCD down counter, TTL compati 61 e i nputc 1.2.2 Case outline. The case outline shall be as designated in appendix C of MIL-M-38510, and as Out1 i rie 1 etter 01 1 ows : Case outline E D-2 (16-lead, .840“ x .310“ x .200“), dual-in-line package 1.3 Absolute maximum ratings. - i/ Supply voltage

5、range (Vcc) - - - - - - - - - DC input voltage range - - - - - - - - - - - DC output voltage range- - - - - - - - - - - DC input diode current - - - - - - - - - - - DC output diode current (per pin1 - - - - - DC drain current (per pin) - - - - - - - - M: Vcc or GND current - - - - - - - - - - - Stor

6、age temperature range - - - - - - - - - Maximum power dissipation (P,) - - - - - - - Lead temperature (soldering, 10 seconds) - - Thema1 resi c tance, junction- to-case ( IJ,) - Junction temperature (TJ) - - - - - - - - - -0.5 V dc to +7.0 V dc -0.5 V dc to Vcc + 0.5 V dc -0.5 V dc to Vcc + 0.5 V dc

7、 *20 mA *20 mA *25 mA *50 mA -65C to +150C 500 mW g/ +3OO0C See MIL-M-38510, appendix C +175“C - i/ - 21 Unless otherwise specified, all voltages are referenced to ground, For TC = +lOOC to +125C, derate linearly at 8 mW/C. DEFENSE ELECTRONICS SUPPLY CENTER REMSiON LEVU SHEET I 2 DAYTON, OHIO 45444

8、* U. S. GOVERNMENT PRIMING OFFNE: lSBB-54P9op DESC FORM 193A SEP 87 , Y Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICC SUPPLY CEHIER DAYTON, OHIO 45444 1.4 Recormended operating conditions. supply

9、voltage range (Vcc) - - - - - - - - SIZE A 5962-90574 RMSION LEVEL SHEET 3 Input voltage range (VIN) - - - - - - - - Output voltage range VouT) - - - - - - - Lase operatiiiy temperature range (TC)- - - t4.5 V dc to t5.5 V dc 0.0 V dc to Vcc 0.0 V dc to Vcc -55C to +125OC Input rise or fall time (tr,

10、 tf): vcc= 4,5y - - - - - - - - - - - - - - Maximum CP frequency (fmx): TC = +25C, Vcc = 4.5 V T - -55C to +125“C, Vcc = 4.5 V - - - - - - - - - - - C- Minimum pulse width, 19-W SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1.4 Recommended o

11、perating conditions - Continued, Rinimum hold time,. Pn to CP (thIl: I Tc = *%Cy Vcc = 4.5 Vr - - - - - - - - Te, = -55C to +125=C, Vcc =i 4.5 V - - - 5 ns 5 n. Mfnimum hold time, “E to CP (th2): Tc. = +25OC, Vcc = 4.5 V - - - - - - - - o. nc 0. ns Tc = -55C to +125OC, Vcc. = 4.5 V - - - Irlinimum h

12、oTd. tiriie,. PF ta CP (thSI: TC = +2ScC, Vcc = 4.5. V+ - - - - - - - - IE = -55C to *125c, YCG = 4.8 v- - - - 2 ns 2 ns 2. APPLICABLE DOCUMENTS Unless otherwise specified, the ssue Tisted in that fscue of the ards specffied in the salicitatiian, form a part of thls drawing to the extent specified h

13、erein MIL 1.TARY MIL-M-38510 - Microcircui ts, General Specification for. STANDARD M1 LI TARY ML-ST-883 - Test Methods and Procedures for MicroeTectronics. BULLETIN MLLIBARY M1L-BUL-ZO3. - Lis at Stendardized M ary rawi ngs ( SMD s) . (Copies of the specification, standard, and budletin requfred by

14、manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as di rected by the contract1 ng activity references cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence, In the event of a con t beween the text af t

15、his drawing and the SIZE . A 5962-90574 STANDARDIZU) MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY Cm REVISION LEVEL SHEET DAYTON, OHIO 45444 4 b *V. 8. QOVERNMENT PRINTiNQ OFicE 1888-549-904 DECC FORM T93A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro

16、m IHS-,-,-* I z STANDARDIZED SIZE 3, REQUIREMENTS 3.1 Item requirements, The individual item requirements shall be in accordance with 1.2.1 of IIL-STD- ind as sp%fi!d hlrein. I rov sions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ 3.2 Design, construction, and hysical d

17、imensions. The design, construction, and physical MIL-lq-385m and herein. iimensions shal I be as specified 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Logic diagram. The logic dia

18、gram shall be as specified on figure 3. 3.2.4 Timing diagram. The timing diagram shall be as specified on figure 4. 3.2.5 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical ierformance

19、 characteristics are as specified in table I and apply over the full case operating ;emperatwe range. pxified in table II. The electrical tests for each subgroup are described in table I. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups 3.5 Marking, Marking s

20、hall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall In addition, the manufacturers part number le marked with the part number listed in 1.2 herein. lay also be marked as listed in MIL-BUL-103 (see 6.6 herein). 3.6 Certificate of compliance. A certificate of compliance shall be re

21、quired from a ianufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.6 ierein). The certificate of compliance submitted to DESC-ECS prior to listing as an approved ource of supply shall affirm that the manufacturers product meets the requirements of IIL-STD-883 ( se

22、e 3.1 herein) and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see .1 herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DESC-ECS shall be requi

23、red in accordance ith MIL-STD-883 ( see 3.1 herein). 3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option o review the manufacturers facility and applicable required documentation. Offshore ocumentation shall be made available onshore at the option of the revi

24、ewer. I I I - itiJ.S.GoMRNMEHTPfdHTINaoFFNE: 1wo-MB-M DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE I. Electrical performance characteristics. I I I I Lmits I I I -55C Tc +125OC i/ Isubgroupsl Min I Max I I I I unless ot

25、herwise speciVied I II I 1 I I I I I VCC 4.5 V, High level output voltaye I VOH 1 I I 1-1 I 1 3.7 I I I I I 1101 = 4.0 MI I I I I II I 0.1 i I I 1 I I 1-1 I I I 1101 = 4.0 mAl I I 0.4 I I I I I I I I I I 1 Test I Symbol I Candi tions IGroup A I I Uni4 I I101 = 20 MA I 1, 2, 3 I 4.4 I I IV I 1 i 2.0

26、V or I I I 1 I 1101 = 20 NA I 1, 2, 3 I Low level output voltage I VCc = 4.5 v, VOL i ! 2.0 V or I I III High level input voltage I VIH 1 vcc = 4.5 v 2/ I 1, 2, 3 I 2.0 I I 1 I I III I VIL quiescent current 1 Icc I I IOUT = OoO A l I II I I vcc = 4.5 v y 1 III III I II I I 0.8 I 1 2s I Low level inp

27、ut voltage I I I I I 4 1 110 IpF I 1, 2, 3 I I 160 I DA I See 4*3*1c Input capacitance I CIN I Vcc = 5.5 Y, VIN = Vcc or GND Additional quiescent i delta i Any 1 input: supply current -/ 1 ICC 1 VIN = 2.4 V I I Other inputs: i i, 2, 3 i i 3.0 i m I II I III I I II I I III I I ill I I See footnotes a

28、t end of table. - SIZE A 5962-90574 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 6 * U. 8. GOVERNMENT WNTINQ OFFICE 1888-S9-w ESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-

29、,-,- TABLE 1. Electrical performance characteristics - Continued. 1 I I I I -55C TC (.+125OC i/ Isubgroupsl Min I Max i I 1 1 unless therwise specified I II I I I I I Test I Symbol I Conditions IGroup A 1 Limits 1 Unit Propagation delay ItpLH1, I VCC = 4.5 v I 9 I I601ns time, CP to TI: 3/ ItpHL1 I

30、CL = 50 pF - (asynchronous preset) I I See figure 5 I 10, 11 I I 90 I I 1- SIZE A STANDARDIZED Propagation delay ItPLH2, 1 time, CP to TC 3/ Itpz I (synchronous preset) I I I 5962-90574 Propagation del ay ltPLH3, I time, TE to TC 31 ItpHL3 I I 9 I I631 I 10 11 I I 95 I I 9 I I501 - I 10, 11 I I 75 I

31、 1- 1- I 9 I I681 I 10, 11 I I 102 I I 1- I 9 I I551 - I I I 10, 11 I I 83 I 1- Output transition time ItTLH, I I 9 I I151 I I 10, 11 I I 22 I Propagation del ay ItPLH4, I time, FI to TC I tPHL4 I I Propagation delay ltPLH5, I time, Id to TC 3/ ItpHLs I 4/ THL I - - i/ - 2/ - 31 - 4/ For a power sup

32、ply of 5 V *1%, the worst case output voltages (Vw and VOL) occur for HCT dt 4.5 V. V H and VI occur at Vcc = 5.5 V and 4.5 V respectively. Tie VIH anb VI tests are nat required, and shall be applied as forcing functions for the Transition time (tTLH, tTHL), if not tested, shall be guaranteed to the

33、 specified limits. Thus, the 4.5 V values should be used when designing with this supply, Worst cases or VOL tecks. is parameter is guaranteed, if not tested, to the specified limits in table I. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be

34、in accordance with 4.2 Screenin . Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). conducted _4 on al devices prior to quality conformance inspection. The following additional cri teri a s

35、hall apply: a. Burti-in test, method 1015 of MIL-STD-8EP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE II. Electrical test requirements. SIZE A STANDARDIZED I Subgroups r f MIL-STD-883 test requirements I (per method I I I 5005, table I) I

36、 I I I I 5962-90574 i I Interim electrical parameters I - I (method 5004) l I I I MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENlER DAYTON, OHIO 45444 Final electrical test parameters i 1*, 2, 3, 7, 8, I (method 5004) 19 I I I REVISION LEVEi SHEET 13 i Group A test requi rements i 1, 2, 3, 4, 7, i

37、I (method 50051 I 8, 9, 10, 11 I I Groups C and D end-point I I I electrical parameters I 1, 2, 3 I I (method 50051 i I * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with methoc15005 of bUL-STD-883 including groups A, By Cy and

38、 D inspections. cri teri a chal 1 apply. The following additional 4.3.1 a. b. C. d. 4.3.2 a. b. Group A inspection. Tests shall be as specified in table II herein. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. Subgroup 4 (GIN measurement) shall be measured only for the i

39、nitial test and after process or design changes which may affect capacitance. Capacitance shall be measured between the designated teminal ana GND at a frequency of 1 MHz. pins on five devices with zero failures. Subgroups 7 and 8 tests shall verify the truth table as specified on figure 2. Groups C

40、 and D inspections. End-point electrical parameters shall be as specified in table II herein, Steady-state 1 ife test conditions, method 1005 of MIL-STD-883. (1) Test condition A, By Cy or D using the circuit submitted with the certificate of compliance (see 3.6 herein). (21 TA = +125C, minimum. (3)

41、 Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Test all applicable 5. PACKAGING 5.1 Packaginy requiremiits. The requirements for packaging shall be in accordance with MIL-M-38510. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr

42、om IHS-,-,-SMD-57b2-70574 57 777797b O000770 5 STANDARDIZED MILITARY DRAWING DEFENCE BECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 b, NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will

43、 perform the required function are not available for OEM applicdtion. covered by this drawing has been qualified for listing an QPL-38510, the device specified herein will be inactivated and will not be used for new design. preferred item for all applications. covered by a contractor-prepared specif

44、ication or drawing. with the usrs of record for the individual documents. This coordination will be accomplished in accordance with MIL-STR-481 using DD Form 1693, Engineering Change Proposal (Short Fotm), Center When a system application requires configuration control and the applicable SMD. DESC w

45、ill maintain a record of users and this list will be used for coordination and distribution of changes to tlie drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DESC-ECS, telephone (513) 296-6022. When a military specification exists and the product The QPL-3851

46、0 product shall be the 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device 6.3 Configuration control of SMs. All proposed changes to existing SMDs will be coordinated 6.4 Recoru of users. Military and industrial users shall inform Defense Electronics Supply

47、 SIZE A 5962-90574 REVIMN LEVEL SHEET 14 6.5 Comments. Comments on this drawing shoulu be directed to DESC-ECS, Dayton, Ohio 45444, or 6.6 Approved source of supply. An approved source of supply is listed in MIL-BUL-103. The approved source of supply listed below is for telepho- 296-5375. Additional

48、 sources will be added to MIL-BUL-i03 as they become available. The vendor listed in NIL-BUL-IO3 has agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DES-ECS. information purposes only and is current only to the date of the last action of

49、this document. 1 I I r I I Vendor I Vendor I I Military drawing I CAGE I similar part I 1 part number I number I number i/ I 1 I I -1 I I I I I 1/ Caution. Do not use this number far item I 5962-9057401EX 1 34371 I CD54HCT40102F/3AI -r_ acquisition. may not satisfy the performance requirements of this drawing. Items acquired to this number Ven