DLA SMD-5962-89981 REV F-2007 MICROCIRCUIT LINEAR POSITIVE REGULATOR ADJUSTABLE MONOLITHIC SILICON《硅单片 可调节正稳压器 线性微型电路》.pdf
《DLA SMD-5962-89981 REV F-2007 MICROCIRCUIT LINEAR POSITIVE REGULATOR ADJUSTABLE MONOLITHIC SILICON《硅单片 可调节正稳压器 线性微型电路》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-89981 REV F-2007 MICROCIRCUIT LINEAR POSITIVE REGULATOR ADJUSTABLE MONOLITHIC SILICON《硅单片 可调节正稳压器 线性微型电路》.pdf(16页珍藏版)》请在麦多课文档分享上搜索。
1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change input to output voltage differential in 1.3, 1.4, VREF, VRLINE, IADJ, and IADJconditions. Change ILIMtest limits for conditions (VIN VOUT) = 2.5 V from 0.05 A to 0.075 A. Add case outline Y (TO-39). 92-08-19 M. A. FRYE B Changes in accorda
2、nce with NOR 5962-R034-94. 92-12-23 M. A. FRYE C Add case outline Z. Technical and editorial changes throughout. 94-08-09 M. A. FRYE D Changes in accordance with NOR 5962-R044-99. 99-03-24 R. MONNIN E Add case outlines M and T. - ro 02-02-21 R. MONNIN F Remove max limits for the current limit test,
3、ILIM, in table I. -rrp 07-07-23 ROBERT M. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV F F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY JOSEPH A. KERBY DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICRO
4、CIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, POSITIVE REGULATOR, ADJUSTABLE, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING AP
5、PROVAL DATE 90-07-24 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-89981 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E512-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89981 DEFENSE SUPPLY CENTER CO
6、LUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The comple
7、te PIN is as shown in the following example: 5962-89981 01 U X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LT1086 / OM1860 Positi
8、ve regulator, adjustable 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style M See figure 1 3 Flange mount, glass sealed with gull wing leads T CBCC1-N3 3 Bottom terminal chip carrier U See figure
9、1 3 TO-257 Single row flange mount with isolated tab and glass sealed X See figure 1 2 TO-3 Flange mount Y See figure 1 3 TO-39 Can Z See figure 1 3 Z-tab 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Input to output voltage differenti
10、al . 25 V dc Output current (IMAX): Cases M, T, X, U, and Z . 1.0 A Case Y 0.5 A Power dissipation (PD) . Internally limited Junction temperature (TJ) +150C Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC): Case M 7.1C/
11、W Case T . 4.1C/W Case X . 3.0C/W Cases U and Z . 4.2C/W Case Y . 40C/W Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89981 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3
12、DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings Continued. Thermal resistance, junction-to-ambient (JA): Case M 60C/W Case T . 80C/W Case X . 35C/W Cases U and Z . 42C/W Case Y . 140C/W 1.4 Recommended operating conditions. Input to output voltage differential . 15 V dc Ambient operating temperat
13、ure range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in
14、the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEP
15、ARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 7
16、00 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations
17、 unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manuf
18、acturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535.
19、This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accorda
20、nce with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accord
21、ance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89981 DEFENSE SUPPLY CENTER COLUMBU
22、S COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Reference voltage VREFIOUT= 10 mA, (VIN VOUT) = 3.0 V 1 01
23、1.238 1.262 V 1.5 V (VIN VOUT) 15 V, 2/ 1,2,3 1.225 1.270 10 mA IOUT IMAX1.5 V (VIN VOUT) 15 V, 3/ 1.220 1.270 10 mA IOUT IMAXLine regulation 4/ VRLINE1.5 V (VIN VOUT) 15 V, 1,2,3 01 0.2 % IOUT= 10 mA Load regulation 4/ VRLOAD(VIN VOUT) = 3.0 V, 2/ 1 01 0.3 % 10 mA IOUT IMAX2,3 0.4 (VIN VOUT) = 3.0
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