DLA SMD-5962-88553 REV H-2006 MICROCIRCUIT LINEAR POSITIVE 15 VOLT REGULATOR FIXED MONOLITHIC SILICON《硅单片固定阳性15伏调节器线性微电路》.pdf

《DLA SMD-5962-88553 REV H-2006 MICROCIRCUIT LINEAR POSITIVE 15 VOLT REGULATOR FIXED MONOLITHIC SILICON《硅单片固定阳性15伏调节器线性微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88553 REV H-2006 MICROCIRCUIT LINEAR POSITIVE 15 VOLT REGULATOR FIXED MONOLITHIC SILICON《硅单片固定阳性15伏调节器线性微电路》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outlines T and U. Add vendors CAGE 69210 and U4637. Change limits for line regulation, load regulation tests and standby current drain test at temperature. Add temperature testing limit for Ripple rejection test. 89-08-08 M. A. FRYE B Ad

2、d case outline 2. Editorial changes throughout. 92-03-30 M. A. FRYE C Add case outline N. Remove vendor CAGE 48726. Change vendor CAGE U4637 to U3158. Editorial changes throughout. 96-01-17 M. A. FRYE D Add CAGE 27851 and case outline M. Make changes to 1.2.2, 1.3, 1.4, table I, figure 1, and figure

3、 2. - ro 99-12-01 R. MONNIN E Add radiation hardness requirements. - ro 00-02-17 R. MONNIN F Make change to case outline N. Add case outlines 4 and 5. Make changes to 1.2.3, 1.3, figure 1, and figure 2. rrp 02-02-11 R. MONNIN G Add a footnote to the case outline U, TO-257 package as specified under

4、1.2.2 and figure 1. Make corrections to package style descriptions under 1.2.2. - ro 05-02-04 R. MONNIN H For case outline “T” only, add a footnote 1/ under 1.2.3 and make change to note 2 under figure 1. - ro 06-01-10 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET RE

5、V H H H SHEET 15 16 17 REV STATUS REV H H H H H H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY JOSEPH A. KERBY DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAW

6、ING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, POSITIVE 15 VOLT REGULATOR, FIXED, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-07-28 AMSC N/A REVISION LEVEL H SIZE A CAGE CODE 67268 5962-88553 SHEET 1 OF 17 DSCC

7、FORM 2233 APR 97 5962-E144-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88553 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope.

8、This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962 F 88553 01 X X Federal stock class designator RHA

9、designator (see 1.2.1) Device type (see 1.2.2)Case outline (see 1.2.3) Lead finish (see 1.2.4) / / Drawing number 1.2.1 RHA designator. RHA marked devices shall meet the MIL-PRF-38535 or MIL-PRF-38535, Appendix A specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-

10、) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 7815A Positive regulator, 15 volt fixed 1.2.3 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline

11、 letter Descriptive designator Terminals Package style M See figure 1 3 Power surface mount N CBCC2-N3 3 Bottom terminal chip carrier T 1/ See figure 1 3 TO-257 single row flange mount and glass sealed U 1/ See figure 1 3 TO-257 single row flange mount with isolated tab and glass sealed X See figure

12、 1 3 TO-39 can Y See figure 1 2 TO-3 flange mount Z MBFM4-P2 2 TO-66 flange mount 2 CQCC1-N20 20 Square leadless chip carrier 4 See figure 1 3 Flange mount, glass sealed, with gull wings 5 CBCC1-N3 3 Bottom terminal chip carrier 1.2.4 Lead finish. The lead finish is as specified in MIL-PRF-38535, ap

13、pendix A. _ 1/ For outline letters T and U, CAGE 34333 manufacturers the TO-257 package with ceramic seal. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88553 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4

14、3218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. Input voltage: Operating or output shorted to ground 35 V dc Transient . 50 V dc 2/ Power dissipation (PD): TC= +25C: Case M . 18 W Cases N, T, U, Z, 4, and 5 . 15 W Cases X and 2 . 2 W Case Y . 20 W TA= +25C: Cas

15、es M, T, U, and Z 3.0 W Case N 1040 mW Cases X and 2 . 1.0 W Case Y . 4.3 W Case 4 . 1.7 W Case 5 . 1.3 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +150C 3/ Thermal resistance, junction-to-case (JC): Case M. 6.7C/W Cases N and T

16、. 3.5C/W Case U . 4.2C/W Case X . 15C/W Case Y . 3C/W Case Z . 6C/W Case 2 See MIL-STD-1835 Case 4 . 5.1C/W Case 5 . 3.6C/W Thermal resistance, junction-to-ambient (JA): Cases M, T, U, and Z 42C/W Cases N, X and 2 120C/W Case Y . 29C/W Case 4 . 60C/W Case 5 . 80C/W 1.4 Recommended operating conditio

17、ns. Ambient operating temperature range (TA) -55C to +125C Input voltage range (VIN) . +17.5 V dc to +30 V dc 1.5 Radiation features: Maximum total dose available (dose rate = 50 300 rads (Si) / s) 300 Krads (Si) 4/ 2/ The 50 volt input rating refers to the ability of the regulator to withstand high

18、 line or transient conditions without damage. Since the regulators maximum current capability is reduced, the output may fall out of regulation at high input voltages under nominal loading. 3/ The device is protected by thermal shutdown circuit which is designed to turn off the output transistor whe

19、never the device junction temperature is in excess of +150C. 4/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, metho

20、d 1019, condition A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88553 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 G

21、overnment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIF

22、ICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standa

23、rd Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-509

24、4.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIRE

25、MENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer

26、 or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM)

27、 plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QM

28、L flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal conn

29、ections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as sp

30、ecified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo repr

31、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88553 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C

32、TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTTA= +25C 1 01 14.8 15.2 V M,D,P,L,R,F 1 14.8 15.2 VIN= 18.5 V to 30 V 4/ 1,2,3 14.6 15.4 M,D,P,L,R,F 1 14.6 15.4 Line regulation 5/ 6/ VRLINEVIN= 17.5 V to 30 V, 1 01 20 mV -55C TJ +125C 2,3 50 M

33、,D,P,L,R,F 1 20 VIN= 20 V to 26 V, 1 15 -55C TJ +125C 2,3 25 M,D,P,L,R,F 1 15 Load regulation 5/ VRLOADIO= 5.0 mA to 1.5 A, 7/ -55C TJ +125C 1 01 35 mV M,D,P,L,R,F 1 35 IO= 5.0 mA to 1.0 A, 7/ -55C TJ +125C 2,3 75 IO= 250 mA to 750 mA, 7/ 1 21 -55C TJ +125C 2,3 45 M,D,P,L,R,F 1 21 IO= 5.0 mA to 500

34、mA, 8/ 1 50 -55C TJ +125C 2,3 75 Standby current drain ISCD1 01 6.0 mA 2,3 6.5 M,D,P,L,R,F 1 6.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88553 DEFENSE SUPPLY CENTER COLU

35、MBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Standby current drain change with line

36、 ISCD(line) VIN= 18.5 V to 30 V 1,2,3 01 0.8 mA M,D,P,L,R,F 1 0.8 Standby current drain change with load ISCD(load) IO= 5.0 mA to 1000 mA 1,2,3 01 0.5 mA M,D,P,L,R,F 1 0.5 Dropout voltage VDOVOUT= 100 mV, 7/ IO= 1.0 A, TA= +25C 1 01 2.5 V M,D,P,L,R,F 1 2.5 VOUT= 100 mV, 8/ IO= 500 mA, TA= +25C 1 2.5

37、 Peak output current IO(PK)TA= +25C 7/ 1 01 1.5 3.3 A M,D,P,L,R,F 1 1.5 3.3 TA= +25C 8/ 1 0.5 1.7 Short circuit current 9/ IOSVIN= 35 V 5/ 1 01 1.2 A 2,3 2.8 M,D,P,L,R,F 1 1.2 VIN= 35 V 8/ 1 0.7 2,3 2.0 Ripple rejection VIN/ f = 120 Hz, VIN= 10 V 4 01 54 dB VOUT5,6 8/ 52 M,D,P,L,R,F 4 54 Output nois

38、e voltage 10/ NOf = 10 Hz to 100 kHz, TA= +25C 7 01 40 V / V rms Long term stability 10/ VOUT/ t TA= +25C, t = 1,000 hours 7 01 150 mV See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

39、 5962-88553 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. 1/ Devices supplied to this drawing have been characterized through all levels M, D, P, L, R, F of irradiation. However, th

40、is device is only tested at the “F” level. Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate e

41、nhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 3/ Unless otherwise specified, VIN= 23 V and IO= 500 mA for cases M, N, T, U, Y, Z, 4, and 5, VIN= 23 V and IO= 100 mA for cas

42、es X and 2. Maximum test current for cases X and 2 is 500 mA. 4/ For cases X and 2: IO= 5 mA to 500 mA, P 2 W. For case Y: IO= 5 mA to 1.0 A, P 20 W. For cases M, N, T, U, Z, 4, and 5: IO= 5 mA to 1.0 A, P 15 W. 5/ All measurements except output noise voltage and ripple rejection are made at constan

43、t junction temperature and with low duty cycle. 6/ Minimum load current for full line regulation is 5.0 mA. 7/ For cases M, N, T, U, Y, Z, 4, and 5 only. 8/ For cases X and 2 only. 9/ Short circuit protection is only assured up to VIN= 35 V. 10/ If not tested, shall be guaranteed to the limits speci

44、fied in table I herein. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space

45、limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or

46、 “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certif

47、icate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-3

48、8535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer.