DLA SMD-5962-87752 REV C-2006 MICROCIRCUIT DIGITAL ECL PHASE FREQUENCY DETECTOR MONOLITHIC SILICON《硅单片发光相频探测器数字微电路》.pdf

《DLA SMD-5962-87752 REV C-2006 MICROCIRCUIT DIGITAL ECL PHASE FREQUENCY DETECTOR MONOLITHIC SILICON《硅单片发光相频探测器数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87752 REV C-2006 MICROCIRCUIT DIGITAL ECL PHASE FREQUENCY DETECTOR MONOLITHIC SILICON《硅单片发光相频探测器数字微电路》.pdf（15页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R071-92. tvn 91-12-23 Monica L. Poelking B Update to reflect latest changes in format and requirements. Editorial changes throughout. les 05-06-27 Raymond Monnin C Correct errors in table I. gap 06-01-05 Raymon

2、d Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Christopher A. Rauch DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Raymond

3、Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY D. A. DiCenzo MICROCIRCUIT, DIGITAL, ECL, PHASE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-07-25 FREQUENCY DETECTOR, MONOLITHIC SILICON AMSC N/A REVISION L

4、EVEL C SIZE A CAGE CODE 67268 5962-87752 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E495-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87752 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISIO

5、N LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following exam

6、ple: 5962-87752 01 C X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 12540 Phase frequency detector 1.2.2 Case outlines. The case outline

7、s are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 dual-in-line 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings.

8、 Supply voltage range -8.0 V dc to 0.0 V dc Input voltage range 0.0 V dc to -5.2 V dc Storage temperature range. -65C to +175C Maximum power dissipation (PD) 660 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +

9、165C 1.4 Recommended operating conditions. Supply voltage range (VEE) -5.46 V dc minimum to -4.94 V dc maximum Minimum high level input voltage (VIH): TA= +25C -0.780 V dc TA= +125C -0.630 V dc TA= -55C . -0.880 V dc Maximum low level input voltage (VIL): TA= +25C -1.850 V dc TA= +125C -1.820 V dc T

10、A= -55C . -1.920 V dc Ambient temperature range (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87752 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSC

11、C FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solici

12、tation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF

13、 DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins

14、 Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

15、specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Li

16、sting (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML f

17、low as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with M

18、IL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance wit

19、h 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test

20、 circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical

21、test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59

22、62-87752 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be mark

23、ed. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance t

24、o MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order

25、to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements here

26、in. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawi

27、ng. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspecti

28、on. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply:

29、 a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs,

30、 biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optio

31、nal at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87752 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I

32、. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max Cases C and 2 Quiescent tests 1/ 2/ VIHVILHigh level output voltage VOHOutputs -0.780 -1.850 1 All -0.930 -0.780 V terminated -0.630 -1.820 2 -0.

33、825 -0.630 through -0.880 -1.920 3 -1.080 -0.880 Low level output voltage VOL 100 to -2 V, -0.780 -1.850 1 All -1.850 -1.620 V EE= -5.2 V, -0.630 -1.820 2 -1.820 -1.545 CC= 0.0 V -0.880 -1.920 3 -1.920 -1.655 High level threshold output VOHA 3/ -1.105 -1.475 1 All -0.950 -0.780 V voltage -1.000 -1.4

34、00 2 -0.845 -0.630 -1.255 -1.510 3 -1.100 -0.880 Low level threshold output VOLA-1.105 -1.475 1 All -1.850 -1.600 V voltage -1.000 -1.400 2 -1.820 -1.525 -1.255 -1.510 3 -1.920 -1.635 Power supply drain current IEE VIH= -0.780 V at +25C 1 All -120 -60 mA -0.630 V at +125C -0.880 V at -55C EE= -5.2 V

35、, VCC= 0.0 V 1 All 350 A High level input current IIH See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87752 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEV

36、EL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max Cases C and 2 Quiescent tests 1/ 2/ VIHVILHigh level output voltage VOHOutputs +4.220 +3.210 1 All +4.0

37、70 +4.220 V terminated +4.370 +3.240 2 +4.175 +4.370 through +4.120 +3.140 3 +3.920 +4.120 Low level output voltage VOL 100 to -2 V, +4.220 +3.210 1 All +3.210 +3.440 V EE= 0.0 V, +4.370 +3.240 2 +3.240 +3.515 CC= 5.0 V +4.120 +3.140 3 +3.140 +3.405 High level threshold output VOHA 3/ +3.895 +3.525

38、1 All +4.050 +4.220 V voltage +4.000 +3.600 2 +4.155 +4.370 +3.745 +3.490 3 +3.900 +4.120 Low level threshold output VOLA+3.895 +3.525 1 All +3.210 +3.460 V voltage +4.000 +3.600 2 +3.240 +3.535 +3.745 +3.490 3 +3.140 +3.425 Power supply drain current IEE VIH= -4.220 V at +25C 1 All -115 -60 mA -4.3

39、70 V at +125C -4.120 V at -55C EE= 0.0 V, VCC= 5.0 V 1 All 350 A High level input current IIH See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87752 DEFENSE SUPPLY CENTER COLUMBU

40、S COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min MaxCases C and 2 AC tests VEE= -3.0 V, 9, 11 All 3.4 ns

41、 Transition time tTLH, tTHLVCC= +2.0 V, 10 3.8 Propagation delay time, tPHH1CL 5 pF, 9, 11 All 4.6 ns R to U RL= 100, 10 5.0 Propagation delay time, Load all outputs through 100 9, 11 All 4.5 ns R to U tPHL1to ground, 10 4.9 Propagation delay time, tPHL2See figure 4 9, 11 All 6.4 ns R to D 10 7.0 Pr

42、opagation delay time, tPHH29, 11 All 6.0 ns R to D 10 6.6 Propagation delay time, tPHH39, 11 All 4.6 ns V to D 10 5.0 Propagation delay time, tPHL39, 11 All 4.5 ns V to D 10 4.9 Propagation delay time, tPHL49, 11 All 6.4 ns V to U 10 7.0 Propagation delay time, tPHH49, 11 All 6.0 ns V to U 10 6.6 1/

43、 The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes befor

44、e the reading is taken. This method was used for theoretical limit establishment only. 2/ The T test method creates the limits and test conditions to be used after an increased ambient temperature has been stabilized by external thermal sources. This adjusted temperature simulates the quiescent meth

45、od by increasing the specified case temperature (+25C, +125C, -55C) with a T. The T is theoretically determined based on the power dissipation and thermal characteristics of the device and package used. 3/ The high and low level output current varies with temperature, and can be calculated using the

46、 following formula: IOH= ( -2V - VOH)/100, IOL= ( -2V - VOL)/100. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87752 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC F

47、ORM 2234 APR 97 Device types 01 01 Case outlines C 2 Terminal number Terminal symbols Terminal symbols 1 VCC1NC 2 NC VCC13 U NC 4 U U 5 NC NC 6 R U 7 VEE NC 8 NC NC 9 V R 10 NC VEE11 D NC 12 D NC 13 NC V 14 VCC2NC 15 - - - NC 16 - - - D 17 - - - NC 18 - - - D 19 - - - NC 20 - - - VCC2NC = No connect

48、ion FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87752 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 Inputs Outputs R V U D U D L L X X X X L H X X X X H H X X X X L H X X X X H H H L L H L H H L L H H H H L L H H L H L L H H H L L H H H L L L H H H H L H H L H L L H H L H H L H H L L H L H H L