DLA SMD-5962-87728 REV C-2009 MICROCIRCUIT DIGITAL ECL 4 WIDE 4-3-3-3 INPUT OR-AND GATE MONOLITHIC SILICON.pdf

《DLA SMD-5962-87728 REV C-2009 MICROCIRCUIT DIGITAL ECL 4 WIDE 4-3-3-3 INPUT OR-AND GATE MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87728 REV C-2009 MICROCIRCUIT DIGITAL ECL 4 WIDE 4-3-3-3 INPUT OR-AND GATE MONOLITHIC SILICON.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add figure 4. Technical changes to 1.3, 1.4, table I, and table II. Change terminal connections. Editorial changes throughout. 89-08-18 M. A. Frye B Changes in accordance with NOR 5962-R065-92. 91-12-09 Monica L. Poelking C Redrawn with changes.

2、Update drawing to current requirements. Editorial changes throughout. - gap 09-10-20 Charles F. Saffle The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L. G

3、rosel DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY Robert P. Evans MICROCIRCUIT, DIGITAL, ECL, 4 WIDE 4

4、-3-3-3 INPUT OR-AND GATE, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-11-17 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87728 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E313-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR

5、CUIT DRAWING SIZE A 5962-87728 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appen

6、dix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87728 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Ge

7、neric number Circuit function 01 10H519 4-wide 4-3-3-3 input OR-AND gate 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line package F GDFP2-F16 or CDFP3-F1

8、6 16 Flat pack package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VEE) -8.0 V dc to 0.0 V dc Input voltage range -5.2 V dc to 0.0 V dc Storage temperature range -65C

9、to +165C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) . 441 mW Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) -5.46 V dc to -4.94 V dc Supply voltage rang

10、e (VCC) -0.02 V dc to +0.02 V dc or +1.98 V dc to +2.02 V dc Ambient operating temperature range (TA) -55C to +125C Minimum high level input voltage (VIH): TA= +25C . -0.780 V TA= +125C . -0.650 V TA= -55C -0.840 V Maximum low level input voltage (VIL) -1.950 V Provided by IHSNot for ResaleNo reprod

11、uction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87728 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The foll

12、owing specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing,

13、 General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcirc

14、uit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing

15、 and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance wit

16、h MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may

17、be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not a

18、ffect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, co

19、nstruction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth tab

20、le shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specifi

21、ed herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup

22、 are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87728 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking sh

23、all be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of

24、 not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MI

25、L-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior

26、to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lo

27、t of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility an

28、d applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accor

29、dance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer

30、 under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +12

31、5C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

32、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87728 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limit

33、s Unit Min Max Cases E, F, and 2 Quiescent tests 1/ VIHVILHigh level output voltage VOHOutputs -0.780 -1.950 1 -1.010 -0.780 V terminated -0.650 -1.950 2 -0.860 -0.650 through -0.840 -1.950 3 -1.060 -0.840 Low level output voltage VOL100 to -2 V -0.780 -1.950 1 -1.950 -1.580 V CC= 0.0 V -0.650 -1.95

34、0 2 -1.950 -1.565 EE= -5.2 V -0.840 -1.950 3 -1.950 -1.610 High level threshold VOHA2/ -1.110 -1.480 1 -1.010 -0.780 V output voltage -0.960 -1.465 2 -0.860 -0.650 -1.160 -1.510 3 -1.060 -0.840 Low level threshold output VOLA-1.110 -1.480 1 -1.950 -1.580 V voltage -0.960 -1.465 2 -1.950 -1.565 -1.16

35、0 -1.510 3 -1.950 -1.610 Power supply drain current IEEVEE= -5.46 V 1 -26 mA 3/ VCC= 0.0 V 2, 3 -29 VIH= -0.780 V at +25C -0.650 V at +125C -0.840 V at -55C High level input current IIH1All inputs 1 295 A except A 2, 3 500 IIH2Input A 1 360 A 2,3 610 Low level input current IILVEE= -4.94 V, VCC= 0.0

36、 V 3/ 1, 3 0.5 A VIL= -1.950 V 2 0.3 Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87728 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3

37、990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E and F DC rapid tests 4/ VIHVILHigh level output voltage VOHOutputs -0.787 -1.9

38、50 1 -1.016 -0.787 V Terminated through -0.657 -1.950 2 -0.867 -0.657 100 to -2 V -0.847 -1.950 3 -1.067 -0.847 Low level output voltage VOLVCC= 0.0 V -0.787 -1.950 1 -1.950 -1.582 V EE= -5.2 V -0.657 -1.950 2 -1.950 -1.567 2/ -0.847 -1.950 3 -1.950 -1.612 High level threshold VOHA-1.116 -1.482 1 -1

39、.016 -0.787 V output voltage -0.967 -1.467 2 -0.867 -0.657 -1.167 -1.512 3 -1.067 -0.847 Low level threshold VOLA-1.116 -1.482 1 -1.950 -1.582 V output voltage -0.967 -1.467 2 -1.950 -1.567 -1.167 -1.512 3 -1.950 -1.612 Power supply drain current IEEVEE= -5.46 V 1 -25 mA 3/ VCC= 0.0 V 2, 3 -28 VIH=

40、-0.780 V at +25C -0.650 V at +125C -0.840 V at -55C High level input current IIH1All inputs 1 280 A except A 2, 3 485 IIH2Input A 1 345 A 2, 3 595 Low level input current IILVEE= -4.94 V, VCC= 0.0 V 3/ 1, 3 0.5 A VIL= -1.950 V 2 0.3 Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Pro

41、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87728 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Con

42、tinued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max Case 2 DC rapid tests 4/ VIHVILHigh level output voltage VOHOutputs -0.791 -1.950 1 -1.020 -0.791 V terminated through -0.662 -1.950 2 -0.871 -0.662 100 to -2 V -0.852 -1.950 3 -1.071 -0.852

43、 Low level output voltage VOLVCC= 0.0 V -0.791 -1.950 1 -1.950 -1.583 V EE= -5.2 V -0.662 -1.950 2 -1.950 -1.569 -0.852 -1.950 3 -1.950 -1.614 High level threshold VOHA2/ -1.120 -1.483 1 -1.020 -0.791 V output voltage -0.971 -1.469 2 -0.871 -0.662 -1.171 -1.514 3 -1.071 -0.852 Low level threshold VO

44、LA-1.120 -1.483 1 -1.950 -1.583 V output voltage -0.971 -1.469 2 -1.950 -1.569 -1.171 -1.514 3 -1.950 -1.614 Power supply drain current IEEVEE= -5.46 V 1 -25 mA 3/ VCC= 0.0 V 2, 3 -28 VIH= -0.780 V at +25C -0.650 V at +125C -0.840 V at -55C High level input current IIH1All inputs 1 280 A except A 2,

45、 3 485 IIH2Input A 1 345 A 2, 3 595 Low level input current IILVEE= -4.94 V, VCC= 0.0 V 3/ 1, 3 0.5 A VIL= -1.950 V 2 0.3 Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCI

46、RCUIT DRAWING SIZE A 5962-87728 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max C

47、ases E, F, and 2 AC tests Transition time tTLH, VEE= -2.94 V 9 0.60 2.00 ns tTHLVCC= 2.0 V 10 0.60 2.30 CL 5 pF 11 0.60 1.90 Propagation delay time, tPHH1, Load all outputs 100 to ground 9 0.75 2.25 ns A to Y tPLL1See figure 4 10 0.60 2.55 11 0.75 2.20 Propagation delay time, tPHH2, 9 0.60 2.50 ns d

48、ata inputs (excluding A to Y) tPLL210 0.60 2.80 11 0.60 2.40 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C, or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for