DLA SMD-5962-77031 REV A-1979 MICROCIRCUITS DIGITAL CMOS 14-STAGE RIPPLE- CARRY BINARY COUNTER DIVIDER AND OSCILLATOR《14阶行波进位计数器 驱动器及振动器 氧化物半导体数字微型电路》.pdf

《DLA SMD-5962-77031 REV A-1979 MICROCIRCUITS DIGITAL CMOS 14-STAGE RIPPLE- CARRY BINARY COUNTER DIVIDER AND OSCILLATOR《14阶行波进位计数器 驱动器及振动器 氧化物半导体数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-77031 REV A-1979 MICROCIRCUITS DIGITAL CMOS 14-STAGE RIPPLE- CARRY BINARY COUNTER DIVIDER AND OSCILLATOR《14阶行波进位计数器 驱动器及振动器 氧化物半导体数字微型电路》.pdf（10页珍藏版）》请在麦多课文档分享上搜索。

1、- n- -.-. 9999996 0334840 T95 T45-/ i I REVISION 9 LT R A - DESCRIPTION Page 5: Changed prop. delay test cond. + max. limits. 7 : Added cond A to Burn-in .) separated Cin test in 4.4.1 8: Corrected Table II. 9: Expanded generic data to include Ci test. DATE I 1243.8 1 APPROVED, G Prepared in accorda

2、nce with MIL-STO-100 Sel ec ted i tem drawi ng Original Date of Draw in g 19 September 1977 OECEWSE ELECTROWICS SUPPLY CENTER BAYTOW, 8110 . . 111 .Ltq TITLE Microcircuits, Digital, CMOS, 14-Stage Ripple-Carry Binary Counter/Divider AHd Oscillator Em 77 77031 OW0 NO* I SEE 1 CPOBJDENI* NO- ima REV A

3、 PAOE 1 OF 10 I DESC FORM 144 5962-El85 MAR 76 PROLICEM HAKD COPY Licensed by Information Handling Services._ DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO - . SIZE CODE IDENT. NO. DW NO. A 14933 77031 REV PAGE 2 1. SCOPE 1.1 Scope. microcircuits. assurance for procurement of microcircuits in accor

4、dance with MIL-M-38510. This drawing describes the requirements for monolithic silicon, CMOS, 14-Stage This drawing provides for. a level of microcircuit quality and reliability 1.2 Part number. The complete part number shall be as shown in the fol 1 owing exampl e: T- i I - Case outline (1.2.2) 5iG

5、 Vin = O 1,2,3 VDD = 10 Vdc , Low-level output voltage VDD = 5 Vdc; Vin = 5 Vdc 1,2,3 VDD = 10 Vdc; Vin = 10 Vdc VDD = 5 Vdc; VDD = 10 Vdc; Vo = 1 Vdc Vo = 0.8 Vdc I vNL I Noise immunity inputs low 1,2,3 VDu = 5 Vdc; Vo = 0.5 Vdc VDD = 10 Vdc; Vo = 0.5 Vdc I ION I 1,2,3 VDD = 5 Vdc; Vo = 4.5 Vdc VDD

6、 = 10 Vdc; Vo = 9.5 Vdc I IDP I 1,2,3 VDD = 5.0 Vdc VDD = 10 Vdc VDD = 5.0 Vdc VDD = 10 Vdc CL= 15pF 110% RL = 200 kn TA = 25OC TA = -55C +125OC DEfEWSE ELECIROWICS SUPPLY CENIER OAYTOW, OHIO SIZE CODE IDENT. NO. DWG NO. A 14933 77031 REV A PAGE 4 - Units Limits Max Ililin Volts Volts Volts VDU = 5

7、Vdc; vu = 4.2 v 1,2.3 VDo = 10 Vdc; Vo = 9 Vdc Noiso liiiiriuniI.y, input high 1.4 2.9 - 125 250 Volts VA Output drive current N-channel Output drive current P-channel VA VA Qui escent current VD, = 5 Vdc VDD = 10 Vdc 7.5 PF Input capacitance Vin = o; TA = 25OC 2 2 2 2 - Propagation del ay time, 01

8、to Q4 Out 1/ t t 9 1800 900 2520 1260 ns ns ns ns 10,ll 2 2 1805 905 ns ns 10,ll t VDD = 10 Vdc VDD = 5.0 Vdc VDD = 10 Vdc CL= 50pF t10% 2 2 - ns ns - 2530 1270 TA = -55OC +125OC RL = 200 kn I DESC FORM 144A MhR lb t Licensed by Information Handling Services-1 I t T = -55OC A t125OC TA = 25C TA = -5

9、5OC t125OC VD, = 5.0 Vdc Vu, = 10 Vdc VDD = 5.0 Vdc VDD = 10 Vdc CL= 15pF 110% R, = 200 Kn TA = 25OC TA = -55OC , +125OC VDD = 5.0 Vdc VDD = 10 Vdc VDu = 5.0 Vdc VDo = 10 Vdc C = 50pF 110% R. = 200 Kfi L SIZE CODE IDENT. NO. OEFEWSE ELECTROWICS SUPPLY CENTER A 14933 DWQ NO. 77031 _- i TABLE I. El KQ

10、-lcal characteri stics - Continued. I Test iu groups - nits Conditions ymbol IO0 50 Propagation delay time, On to On +1 i/ S VDD = 10 Vdc VDD = 5.0 Vdc VDD = 10 Vdc CL= 15pF 110$ RL = 200 kfi ! 60 i30 VDD = 5.0 Vdc VDu = 10 Vdc VDD = 5.0 Vdc VDD = 10 Vdc CL= 50pF 11091 RL = 200 kfi 305 155 270 640 -

11、 t t 300 150 420 210 - Trans tion tiinc! i/ 305 155 430 220 TA = 25C TA = -55OC t125OC I L Propagation delay time testing may be performed using either C = 15 pF or CL = 50 pF. However, the maniifnctiircr must certify and guarantee that the microcircuits meet the switching L test limits specified fo

12、r a 50 pF load. . . -. . . . . . . . . . Licensed by Information Handling Servicesr 9999996 OLL4845 577 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO - . - - - . .- - - . . . . . . . . . . . . . . . - - . . . . . -_ . . . . . . . _ . - r SIZE CODE IDENT. NO. DWG NO. A 14933 77031 REV PAGE 6 Device

13、type O1 “DD QI0 a8 Q9 R 0I 30 00 QI2 QI3 QI4 Q6 Q!5 Q7 Q4 vSS FIGURE 1. Terminal connections (top view). I Licensed by Information Handling ServicesDEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE CODE IDENT. NO. DWG NO. A 14933 77031 REV A PAE 7 Licensed by Information Handling ServicesInterim e

14、lectrical parameters Final electrical test parameters (pre burn-in) (method 5004, 3.1.8) (method 5004. 3.1.141 4.4.2 Group B inspection. In group B inspection, each inspection lot shall be subjected to the 4.4.3 Group C and qroup D inspection. Group C and group D inspections shall be as specified in

15、 test subgroups and LTPD values shown in table IIb of method 5005 of MIL-STD-883, class B. method 5005 of MIL-STD-883, class B. dance with MIL-M-38510. and group D inspection. a. End point electrical parameters shall be as specified in table II. b. The frequency of testing and the sample size shall

16、be in accor- Generic test data (6.5) may be used to satisfy the requirements for group C Operating life test (method 1005 of MIL-STD-883) conditions: (i) (2) TA = 125“C, minimum. (3) Test duration: 1,000 hours. Subgroups 3 and 4 shall be added to the group C inspection requirements and shall consist

17、 of the tests, conditions, and limits specified for subgroups 10 and 11 of group A. Test condition D or E, each circuit must be driven with an appropriate signal to simul ate ci rcui t appl ications and each ci rcui t shall have maximum 1 oad appl i ed. c. 4.5 Inspection of preparation for delivery.

18、 Inspection of preparation for delivery shall be in TABLE II. Electrical test requirements. accordance with MIL-M-38510, except that the rough handling test shall not apply. - 1*, 2, 3, 9 I I i Groups C and D end point 1, 2, 3 electrical parameters (method 5005) r I MIL-STD-883 test requirements I S

19、ubgroups I/ I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE CODE IDENT. NO. DWQ NO. A 14933 77031 REV A PAE 8 I Group A test requirements 1, 2, 3, 4 I (meth0.d 5005) Additional electrical sub- groups for group C periodic inspections 10, 11 * PDA applies to subgroup 1 (see 4.3). - l/ Subgroups

20、per method 5005, Table I. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-389 O. 6. NOTES- 6.1 =. Only 6.4 of the notes specified in MIL-M-38510 shall apply to this drawing. DESC FORM 144A MAR 76 t Licensed by Information Handling Services6.2

21、 ntndelue. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM application. eration of unnecessary duplicate specifications, drawings and stock catalog

22、 listings. military specification exists and the prodiict covered by this drawing has been qualified for listing on (IPL-38510, this drawing becomes obsolete and will not he used for new design. product shall be the preferred item for all applications. This drawing is intended exclusively to prevent

23、 the prolif- When a The QPL-38510 6.3 Ordering data. The contract or order should specify the following: a. Complete part number (see 1.2). b. Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by

24、the device manufacturer, if applicable. Requirement for certificate of compliance, if applicable. Requirements for notification of change of product or process to procuring activity, if applicable. Requirements for packaging and packing . Requirements for carrier, special lead lengths or lead formin

25、g, if applicable. requirements shall not affect the part number. requirements will not apply to direct shipment to the Government. c. d. e. f. These Un1 ess otherwi se specified , these 6.4 Repla-ccabil-ity. Replaceability is determined as follows: Microcircuits covered by this drawing will replace

26、the same generic device covered by contractor prepared specification or drawing. 6.5 Generic test bata. Generic test data may be used to satisfy the requirements of 4.4.1 Generic test data is defined as test data from devices manufactured during the same and 4.4.3. time period, by means of the same

27、production technique, materials, controls and design, and in the same microcircuit group (see 3.1.3(h) of MIL-M-38510) as the deliverable devices. period shall be interpreted as covering a maximum span of 180 days between the generic test sample fabrication and the fabrication of deliverable devices

28、. data for a period of not less than 36 months from the date of shipnent. The same time The vendor is required to retain generic DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE CODE IDENT. NO. OW NO. A 14933 77031 REV A PAGE 9 4- Licensed by Information Handling Services- 6.6 Suggested source.Ls

29、_) of supplv_. 21 DESC DRAWING PART NUMIiER .7703101EX 7703101FX 1/ 2/ VE NOOR SIMILAR 1/ NUMBER F SCM VENDOR TYPE 18714 CD4060AD/3 18714 CD4060AK/3 DEFENSE ELECTROWICS SUPPLY CENTER DAYTON, OHIO VENDOR FSCM NUMBER SIZE CODE IDENT. NO. OW0 NO. A 14933 7 IO31 REV PAGE 10 18714 VENDOR NAME AND ADDRESS

30、 RCA Corporation Sol id State Divi cion Route 202 Somerville, NJ 08876 CAUTION. VENDOR TYPE ONLY MAY NOT SATISFY THE PERFORMANCE REQUIREMENTS OF THIS DRAWING. For additional suggested sources of supply or assistance in the use of this drawing contact DESC-EC, 1507 Wilmington Pike, Dayton, Ohio 45444 or telephone 513-296-5375. DO NOT USE THIS NUMBER FOR ITEM PROCUREMENT AND MARKING. THE SIMILAR Licensed by Information Handling Services