DLA SMD-5962-77009 REV E-2005 MICROCIRCUIT DIGITAL BIPOLAR LOW-POWER SCHOTTKY TTL DECADE COUNTER MONOLITHIC SILICON《硅单片十进制计数器肖脱基小功率TTL双极数字微型电路》.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED C Delete vendors, CAGE 07263, CAGE 27014, and CAGE 18324. Add logic diagram. Tale I, IIL2, Add CLOCK to “LOADENABLE T.” FMAX(CL= 50 pF, 10 and 11) change from 20 ns to 15 ns. Editorial changes throughout. Revise to military format. 87-11-09 R. P. E

2、vans D Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 04-04-07 Raymond Monnin E Update to reflect latest changes in format and requirements. Correct paragraph in 3.5. Editorial changes throughout. les 05-08-18 Raymond Monnin THE ORIGINAL FIRST PAGE OF

3、 THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHET REV SHET REV STATUS REV E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Monica L. Grosel DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 htt

4、p:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Robert P. Evans MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, DECADE COUNTER, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 77-04-26 MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CA

5、GE CODE 14933 77009 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E456-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FOR

6、M 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 77009 01 E X Drawing

7、number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 54LS160 Synchronous, 4-bit decade counter 1.2.2 Case outlines. The case outlines are as designated

8、in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . -0.5

9、 V dc to +7.0 V dc Input voltage range : . -1.5 V dc at -18 mA to +5.5 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD) 1/ 176 mW Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC): Cases E and F . See MIL-STD-1835 Junction temperatu

10、re (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) . 2.0 V dc Maximum low level input voltage (VIL) 0.7 V dc Case operating temperature range (TC) -55C to +125C _ 1/ Maximum power dissipation is

11、 defined as VCCx ICC, and must withstand the added PDdue to short-circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LE

12、VEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those ci

13、ted in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlin

14、es. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order

15、Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regu

16、lations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualifie

17、d Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-

18、38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in

19、accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be

20、in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characte

21、ristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The elec

22、trical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or netw

23、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices buil

24、t in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manuf

25、acturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the

26、requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that a

27、ffects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for R

28、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC

29、 +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V, IOH= -0.4 mA VIL= 0.7 V, VIH= 2.0 V 1, 2, 3 All 2.5 V Low level output voltage VOLVCC= 4.5 V, IOL= 4 mA VIL= 0.7 V, VIH= 2.0 V 1, 2, 3 All 0.4 V Input clamp voltage VICVCC= 4.5

30、 V, IIN= -18 mA, TC= +25C 1, 2, 3 All -1.5 V High level input current IIH1VCC= 5.5 V, VIH= 2.7 V Data, clear, Enable P 1, 2, 3 All 20 A IIH2Load, clear, Enable T 1, 2, 3 All 40 A IIH3VCC= 5.5 V, VIH= 5.5 V Data, clear, Enable P 1, 2, 3 All 100 A IH4Load, clear, Enable T 1, 2, 3 All 200 A Low level i

31、nput current IIL1VCC= 5.5 V, VIN= 0.4 V Data, clear, Enable P 1, 2, 3 All -400 A IIL2Load, clear, Enable T 1, 2, 3 All -800 A Short circuit output current 1/ IOSVCC= 5.5 V, 1/ VOUT= 0.0 V 1, 2, 3 All -6 -130 mA High level supply current ICCHVCC= 5.5 V 1, 2, 3 All 31 mA Low level supply current ICCL1

32、, 2, 3 All 32 mA Functional tests See 4.3.1c 7 All Maximum clock frequency fMAXVCC= 5.0 V, RL= 2 K 5% CL= 15 pF 10% 9 All 25 MHz 2/ CL= 50 pF 10% 10, 11 All 15 MHz 9 All 38 ns Propagation delay time, Clear to Q tPHL1VCC= 5.0 V, RL= 2 K 5% CL= 15 pF 10% 10, 11 All 53 ns 9 All 43 ns 2/ CL= 50 pF 10% 1

33、0, 11 All 60 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I.

34、 Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min MaxPropagation delay time, tPLH2VCC= 5.0 V, 9 All 35 ns clock to carry RL= 2 K 5% CL= 15 pF 10% 10, 11 All 49 ns 2/ 9 All 40 CL= 50 pF 10% 10, 11 All

35、56 ns tPHL29 All 35 ns CL= 15 pF 10% 10, 11 All 49 ns 9 All 40 CL= 50 pF 10% 10, 11 All 56 ns Propagation delay time, tPLH39 All 24 ns clock (load input CL= 15 pF 10% 10, 11 All 34 ns high ) to Q 9 All 29 ns CL= 50 pF 10% 10, 11 All 41 ns tPHL39 All 27 ns CL= 15 pF 10% 10, 11 All 38 ns 9 All 32 CL=

36、50 pF 10% 10, 11 All 45 ns Propagation delay time, tPLH49 All 25 ns clock (load input CL= 15 pF 10% 10, 11 All 35 ns low) to Q 9 All 30 ns CL= 50 pF 10% 10, 11 All 42 ns tPHL49 All 29 ns CL= 15 pF 10% 10, 11 All 41 ns 9 All 34 CL= 50 pF 10% 10, 11 All 48 ns Propagation delay time, tPLH59 All 23 ns E

37、nable T to carry CL= 15 pF 10% 10, 11 All 32 ns 9 All 28 ns CL= 50 pF 10% 10, 11 All 39 ns tPHL59 All 23 ns CL= 15 pF 10% 10, 11 All 32 ns 9 All 28 CL= 50 pF 10% 10, 11 All 39 ns 1/ Not more than one output should be shorted at a time and the duration of the short circuit condition should not exceed

38、 one second. 2/ Propagation delay time testing and maximum clock frequency testing may be performed using either CL= 15 pF or CL= 50 pF. However, the manufacturer must certify and guarantee that the microcircuits meet the switching test limits specified for a 50 pF load. Provided by IHSNot for Resal

39、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 Device types 01 Case outlines E, F Terminal number Terminal symbols 1 CLR 2 CLK 3 D

40、ATA A 4 DATA B 5 DATA C 6 DATA D 7 ENP 8 GND 9 LOAD 10 ENT11 QD(output) 12 QC(output) 13 QB(output) 14 QA(output) 15 RCO 16 VCC FIGURE 1. Terminal connections. LOAD ENT ENP Action on the rising clock edge ( ) X X X Clear (reset) L X X Load (Datan- Qn) H H H Count (Increment) H L X No change (hold) H

41、 X L No change (hold) H = High voltage level L = Low voltage level X = Dont care FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-399

42、0 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 Device type 01 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77009 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE

43、L E SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to qua

44、lity conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or ac

45、quiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in tab

46、le II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 50

47、04) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 9, 10*, 11* Group C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the speci

48、fied limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 7 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproducti