DLA DSCC-VID-V62 04671 REV A-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3-V ABT QUADRUPLE BUS BUFFER WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf
《DLA DSCC-VID-V62 04671 REV A-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3-V ABT QUADRUPLE BUS BUFFER WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf》由会员分享,可在线阅读,更多相关《DLA DSCC-VID-V62 04671 REV A-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3-V ABT QUADRUPLE BUS BUFFER WITH 3-STATE OUTPUTS MONOLITHIC SILICON.pdf(10页珍藏版)》请在麦多课文档分享上搜索。
1、 REVISIONSLTR DESCRIPTION DATE APPROVEDA Update boilerplate paragraphs to current requirements. - PHN 10-05-25 Thomas M. Hess Prepared in accordance with ASME Y14.24 Vendor item drawing REV PAGE REV PAGE REV STATUS OF PAGES REV PAGE 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Charles F. Saffle DEFENSE
2、 SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.milOriginal date of drawing CHECKED BY Charles F. Saffle TITLE MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT QUADRUPLE BUS BUFFER WITH 3-STATE OUTPUTS, MONOLITHIC SILICON YY-MM-DD 04-03-11 APPROVED BY Thomas M. Hess SIZE
3、A CODE IDENT. NO. 16236 DWG NO. V62/04671 REV PAGE 1 OF 10 AMSC N/A 5962-V054-10 .Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/04671 REV A PAGE 2 1. SCOPE 1.1 S
4、cope. This drawing documents the general requirements of a high performance 3.3-V ABT quadruple bus buffer with 3-state outputs microcircuit, with an operating temperature range of -40C to +85C. 1.2 Vendor Item Drawing Administrative Control Number. The manufacturers PIN is the item of identificatio
5、n. The vendor item drawing establishes an administrative control number for identifying the item on the engineering documentation: V62/04671 - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1) (See 1.2.2) (See 1.2.3) 1.2.1 Device type(s). Device type Generic Circuit function 01
6、SN74LVTH125-EP 3.3-V ABT quadruple bus buffer with 3-state outputs 1.2.2 Case outline. The case outline are as specified herein. Outline letter Number of pins JEDEC PUB 95 Package style X 14 MO-153 Plastic small-outline1.2.3 Lead finishes. The lead finishes are as specified below or other lead finis
7、hes as provided by the device manufacturer: Finish designator Material A Hot solder dip B Tin-lead plateC Gold plateD PalladiumE Gold flash palladium Z Other Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OH
8、IO SIZE A CODE IDENT NO. 16236 DWG NO. V62/04671 REV A PAGE 3 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . -0.5 V to 4.6 V Input voltage range (VI) . -0.5 V to 7 V 2/ Voltage range applied to any output in the high-impedance or power-off state (VO) . -0.5 V to 7 V 2/ Voltage range a
9、pplied to any output in the high state (VO) . -0.5 V to VCC+ 0.5 V 2/ Current into any output in the low state (IO) . 128 mA Current into any output in the high state (IO) . 64 mA 3/ Input clamp current (IIK) (VI 0) -50 mA Output clamp current (IOK) (VO 0) . -50 mA Package thermal impedance (JA) . 1
10、13C/W 4/ Storage temperature range (TSTG) . -65C to 150C 1.4 Recommended operating conditions. 5/ 6/ Supply voltage range (VCC) . 2.7 V to 3.6 V Minimum high level input voltage (VIH) 2.0 V Maximum low level input voltage (VIL) . 0.8 V Maximum input voltage (VI) . 5.5 V Maximum high level output cur
11、rent (IOH) . -32 mA Maximum low level output current (IOL) . 64 mA Maximum input transition rise or fall rate (t/v) (Outputs enabled) 10 ns/V Minimum power-up ramp rate (t/VCC) 200 s/V Operating free-air temperature range (TA) -40C to +85C 1/ Stresses beyond those listed under “absolute maximum rati
12、ngs” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may
13、 affect device reliability. 2/ The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed. 3/ This current flows only when the output is in the high state and VO VCC. 4/ The package thermal impedance is calculated in accordance with JESD
14、51-7. 5/ Use of this product beyond the manufacturers design rules or stated parameters is done at the users risk. The manufacturer and/or distributor maintain no responsibility or liability for product used beyond the stated limits 6/ All unused control inputs of the device must be held at VCCor GN
15、D to ensure proper device operation. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/04671 REV A PAGE 4 2. APPLICABLE DOCUMENTS JEDEC PUB 95 - Registered and Stand
16、ard Outlines for Semiconductor Devices JEDEC STD 51-7 - High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages (Applications for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834 or online at http:/www.jedec.or
17、g) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and legibly marked with the manufacturers part number as shown in 6.3 herein and as follows: A. Manufacturers name, CAGE code, or logo B. Pin 1 identifier C. ESDS identification (optional) 3.2 Unit container. The unit container shall be mark
18、ed with the manufacturers part number and with items A and C (if applicable) above. 3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are as specified in 1.3, 1.4, and table I herein. 3.4 Design, construction, and physical dim
19、ension. The design, construction, and physical dimensions are as specified herein. 3.5 Diagrams. 3.5.1 Case outline. The case outline shall be as shown in 1.2.2 and figure 1. 3.5.2 Truth table. The truth table shall be as shown in figure 2. 3.5.3 Logic diagram. The logic diagram shall be as shown in
20、 figure 3. 3.5.4 Terminal connections. The terminal connections shall be as shown in figure 4. 3.5.5 Test circuit and timing waveforms. The test circuit and timing waveforms shall be as shown in figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
21、-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/04671 REV A PAGE 5 TABLE I. Electrical performance characteristics. 1/ Test Symbol Conditions VCCTemperature TALimits Unit Min Max Input clamp voltage VIKII= -18 mA 2.7 V 25C, -40C to 85C -1.2 V High level outp
- 1.请仔细阅读文档,确保文档完整性,对于不预览、不比对内容而直接下载带来的问题本站不予受理。
- 2.下载的文档,不会出现我们的网址水印。
- 3、该文档所得收入(下载+内容+预览)归上传者、原创作者;如果您是本文档原作者,请点此认领!既往收益都归您。
下载文档到电脑,查找使用更方便
10000 积分 0人已下载
下载 | 加入VIP,交流精品资源 |
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- DLADSCCVIDV6204671REVA2010MICROCIRCUITDIGITALADVANCEDBIPOLARCMOS33VABTQUADRUPLEBUSBUFFERWITH3STATEOUTPUTSMONOLITHICSILICONPDF

链接地址:http://www.mydoc123.com/p-689145.html