DLA DSCC-DWG-04053 REV D-2010 CAPACITOR FIXED FUSED TANTALUM CHIP NON-WEIBULL GRADED AND WEIBULL GRADED.pdf
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1、REVISIONS LT DESCRIPTION DATE APPROVED A Added Approved Source of Supply. Added Test Tab and Note 6 to Fig. 1. Corrected Table 1. 2 October 2006 Michael A. Radecki B Add Vishay Israel capacitors 17 March 2009 Michael A. Radecki C Add Weibull as an option 2 Dec 2009 Michael A. Radecki D Update part n
2、umber and processing requirements 14 Sep 2010 Michael A. Radecki CURRENT DESIGN ACTIVITY CAGE CODE 037Z3 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 Prepared in accordance with ASME Y14.100 Source control drawing REV STATUS OF PAGES REV D D D D DD DD D PAGES 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED B
3、Y Michael A. Radecki DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OH Original date of drawing CHECKED BY Patrick G. Kyne TITLE CAPACITOR, FIXED, FUSED TANTALUM CHIP NON-WEIBULL GRADED AND WEIBULL GRADED 24 January 2006 APPROVED BY Michael A. Radecki SIZE A CODE IDENT. NO. 037Z3 DWG NO. 04053 REV D PAGE
4、 1 OF 9 AMSC N/A 5910-E464 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 04053 REV D PAGE 2 1. SCOPE 1.1 Scope. This drawing describes the complete requirements for
5、fused tantalum chip capacitors. 1.2 Part or Identifying Number (PIN). The complete PIN shall be as follows: 04053- 001 B Drawing Dash number Reliability Grade Number (see Table I) (see 1.2.1) 1.2.1 Reliability Grade. The reliability grade is identified by a single letter as shown: Symbol Reliability
6、 Grade (% per 1000 Hrs) B 0.1 C 0.01 D 0.001 Z Non-Weibull Graded 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended fo
7、r additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government docume
8、nts. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SP
9、ECIFICATIONS MIL-PRF-55365 - Capacitor, Fixed, Electrolytic (Tantalum), Chip, Established Reliability and Nonestablished Reliability, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Methods for Electronic and Electrical Component Parts. MIL-STD-1285 - Marking of Electri
10、cal and Electronic Parts. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of
11、 this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual requirements shall be in acco
12、rdance with MIL-PRF-55365, and as specified herein. 3.2 Interface and physical dimensions. The interface and physical dimensions shall be as specified herein (see figure 1). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUM
13、BUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 04053 REV D PAGE 3 3.2.1 Terminations. Chip capacitors shall have 100 micro-inch minimum solder plated terminations (see figure 1). The solder plated terminations shall be solderable when tested in accordance with MIL-STD-202, method 208. Tin pl
14、ating is prohibited as a final finish or as an undercoat. Tin-lead (Sn-Pb) finishes are acceptable provided that the minimum lead content is three percent. 3.2.2 Operating temperature range. The capacitors are rated for their given voltages from -55C to +85C. They are de-rated to 0.67 of their given
15、 voltages at +125C. See table III. 3.3 Electrical characteristics. 3.3.1 Capacitance. See table III. Measured in accordance with method 305 of MIL-STD-202. Maximum dc bias shall be 2.2 volts for all ac measurements. The frequency of the ac voltage shall be 120 5 Hz and the magnitude shall be limited
16、 to 1.0 volt rms. 3.3.2 Capacitance tolerance. 20 percent. 3.3.3 Rated voltage. The rated voltage shall be in accordance with table III. Above +85C, voltage de-rating for temperature is required. De-rate linearly from rated voltage at +85C to 0.67 x rated voltage at +125C. 3.4 Surge current. Surge c
17、urrent testing shall be performed on a 100 percent basis after the voltage aging or Weibull grading as shown in Table I or Table II. Capacitors shall be subjected to four consecutive cycles under the following conditions: a. Temperature: +25C 5C b. Applied voltage: Minimum of Rated dc voltage 2 perc
18、ent from a power source having an energy storage bank of 10,000 F (minimum) across the output of the terminals. c. Charge cycle: 4 seconds maximum. d. Discharge cycle: 4 seconds maximum to a voltage below 1 percent of rated voltage. e. The total dc resistance (excluding the capacitor) including the
19、wiring, fixturing, and output impedance of the regulated power supply to each test position during the charging cycle shall be in accordance with MIL-PRF-55365. f. On completion of the test, the capacitors shall meet the following requirements: DCL: See table III. Cap.: Shall meet the capacitance to
20、lerance as specified in 3.3.2. DF: See table III. 3.5 Voltage Aging. Capacitors shall be subjected for a minimum of 10 hours at 85C and 1.32 times rated voltage. 3.6 Exponential gradedFor reliability grade Z (see 1.2) perform testing as shown in Table I. TABLE I. INSPECTION MIL-PRF-55365 Reference D
21、SCC 04053 Reference Sampling Procedure Reflow conditioning Subgroup 1 Thermal shock (unmounted) Voltage Aging Surge current 3.13, 4.7.10 3.14, 4.7.11 3.5 3.4 100% inspection Visual Examination Subgroup 3 Materials Marking Workmanship 3.4, 4.7.4 3.26 3.30 13 samples 0 failures Provided by IHSNot for
22、ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 04053 REV D PAGE 4 3.7 Weibull graded For reliability grades B, C and D (see 1.2) perform testing as shown in Table II. TABLE II. INSPECTION M
23、IL-PRF-55365 Reference DSCC 04053 Reference Sampling Procedure Reflow conditioning Subgroup 1 Thermal shock (unmounted) Weibull FRL grading Surge current 3.13, 4.7.10 3.14, 4.7.11 3.23, 4.7.20 3.4 100% inspection Visual Examination Subgroup 3 Materials Marking Workmanship 3.4, 4.7.4 3.26 3.30 13 sam
24、ples 0 failures FIGURE 1. Dimensions and configuration. Case size L W H K 0.2 F 0.1 S 0.3 B (Ref) 0.15 X (Ref) 0.10 P (Ref) R (Ref) T (Ref) A (Min) G (Ref) E (Ref) B 3.5 0.2 2.8 0.2 1.9 0.2 1.1 2.2 0.8 0.4 0.10 0.5 1.0 0.13 2.1 1.8 2.2 C 6.0 0.3 3.2 0.3 2.5 0.3 1.4 2.2 1.3 0.5 0.10 0.9 1.0 0.13 3.1
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