ASTM E668-2010 3125 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Device.pdf
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1、Designation: E668 10Standard Practice forApplication of Thermoluminescence-Dosimetry (TLD)Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices1This standard is issued under the fixed designation E668; the number immediately following the designation indicates the
2、 year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the Depa
3、rtment of Defense.1. Scope1.1 This practice covers procedures for the use of thermolu-minescence dosimeters (TLDs) to determine the absorbed dosein a material irradiated by ionizing radiation. Although someelements of the procedures have broader application, thespecific area of concern is radiation-
4、hardness testing of elec-tronic devices. This practice is applicable to the measurementof absorbed dose in materials irradiated by gamma rays, Xrays, and electrons of energies from 12 to 60 MeV. Specificenergy limits are covered in appropriate sections describingspecific applications of the procedur
5、es. The range of absorbeddose covered is approximately from 102to 104Gy (1 to 106rad), and the range of absorbed dose rates is approximatelyfrom 102to 1010Gy/s (1 to 1012rad/s). Absorbed dose andabsorbed dose-rate measurements in materials subjected toneutron irradiation are not covered in this prac
6、tice. Further, theportion of these procedures that deal with electron irradiationare primarily intended for use in parts testing. Testing ofdevices as a part of more massive components such aselectronics boards or boxes may require techniques outside thescope of this practice.NOTE 1The purpose of th
7、e upper and lower limits on the energy forelectron irradiation is to approach a limiting case where dosimetry issimplified. Specifically, the dosimetry methodology specified requires thatthe following three limiting conditions be approached: (a) energy loss ofthe primary electrons is small, (b) seco
8、ndary electrons are largely stoppedwithin the dosimeter, and (c) bremsstrahlung radiation generated by theprimary electrons is largely lost.1.2 This standard dose not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard t
9、o establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E170 Terminology Relating to Radiation Measurements andDosimetryE380 Practice for Use of the International System of Units(SI) (the
10、Modernized Metric System)E666 Practice for CalculatingAbsorbed Dose From Gammaor X Radiation2.2 International Commission on Radiation Units andMeasurements (ICRU) Reports:3ICRU Report 14Radiation Dosimetry: X Rays andGamma Rays with Maximum Photon Energies Between0.6 and 50 MeVICRU Report 17Radiatio
11、n Dosimetry: X Rays Generatedat Potentials of 5 to 150 keVICRU Report 21Radiation Dosimetry: Electrons with Ini-tial Energies Between 1 and 50 MeVICRU Report 31Average Energy Required to Produce anIon PairICRU Report 33Radiation Quantities and UnitsICRU Report 34The Dosimetry of Pulsed RadiationICRU
12、 Report 37Stopping Powers for Electrons andPositrons3. Terminology3.1 Definitions:3.1.1 absorbed dose, Dthe quotient of dbydm, where dis the mean energy imparted by ionizing radiation to the matterin a volume element and dm is the mass of matter in thatvolume element.1This practice is under the juri
13、sdiction of ASTM Committee E10 on NuclearTechnology and Applications and is the direct responsibility of SubcommitteeE10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices onMaterials and Devices.Current edition approved June 1, 2010. Published August 2010. Originallyapproved i
14、n 1978. Last previous edition approved in 2005 as E668 05. DOI:10.1520/E0668-10.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page
15、onthe ASTM website.3Available from International Commission on Radiation Units and Measure-ments, 7910, Woodmont Ave., Suite 800, Bethesda, MD 20814.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.D 5ddm(1)Previously, the special uni
16、t of absorbed dose was the rad;however, the gray (Gy) has been adopted as the official SI unit(see Practice E380).1Gy5 1Jkg215 102rad (2)3.1.2 absorbed-dose ratethe absorbed dose per unit timeinterval.3.1.3 annealingthermal treatment of a TLD prior toirradiation or prior to readout.3.1.3.1 Discussio
17、nPre-irradiation annealing of TLDs isusually done to erase the effects of previous irradiation and toreadjust the sensitivity of the phosphor; pre-readout annealingusually is done to reduce low-temperature TLD response.3.1.4 calibration conditionsthe normal environmentalconditions prevailing during
18、routine calibration irradiationssuch as the ambient temperature, humidity, and lighting.3.1.5 equilibrium absorbed dosethe absorbed dose atsome incremental volume within the material which thecondition of electron equilibrium (as many electrons of a givenenergy enter as leave the volume) exists (1)4
19、(see AppendixX1).3.1.6 exposure, Xthe quotient of dQ by dm, where dQ isthe absolute value of the total charge of the ions of one signproduced in air when all the electrons (negatrons and positrons)liberated by photons in a volume element of air having massdm are completely stopped in air.X 5dQdm(3)U
20、nitCkg13.1.6.1 DiscussionFormerly the special unit of exposurewas the roentgen (R).1 R 5 2.58 3 1021C kg21exactly! (4)3.1.7 primary electronsfor the case of electron irradia-tion, the electrons introduced into the device under test by theirradiation source.3.1.8 secondary-electron equilibriumfor the
21、 case of elec-tron irradiation, the condition where as many secondaryelectrons of a given energy enter a given volume as leave it.3.1.9 secondary-electron equilibrium absorbed doseforthe case of electron irradiation, the absorbed dose at someincremental volume within the material in which the condit
22、ionof secondary-electron equilibrium exists.3.1.9.1 DiscussionAdditional definitions can be found inICRU Report 33.3.1.10 secondary electronsfor the case of electron irra-diation, electrons knocked out of the electron shells of thematerial being irradiated by the primary electron. For the caseof pho
23、ton irradiation, energetic electrons (photoelectrons,Auger electrons, and Compton electrons) produced within thematerial being irradiated by the action of the incident photons.3.1.10.1 DiscussionSecondary electrons are produced bythe interaction of the primary electrons with the atoms of thematerial
24、 being irradiated. This interaction is a principal meansof energy loss for the primary electrons. The kinetic energy ofa secondary electron is typically much lower than that of theprimary electron which creates it.3.1.11 test conditionsthe normal environmental condi-tions prevailing during routine h
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