ASTM E2450-2011 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments《中子光子混合环境中CaF(锰)热发光剂量计应用的标准操作规程》.pdf
《ASTM E2450-2011 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments《中子光子混合环境中CaF(锰)热发光剂量计应用的标准操作规程》.pdf》由会员分享,可在线阅读,更多相关《ASTM E2450-2011 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments《中子光子混合环境中CaF(锰)热发光剂量计应用的标准操作规程》.pdf(6页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: E2450 11Standard Practice forApplication of CaF2(Mn) Thermoluminescence Dosimeters inMixed Neutron-Photon Environments1This standard is issued under the fixed designation E2450; the number immediately following the designation indicates the year oforiginal adoption or, in the case of re
2、vision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice describes a procedure for correcting aCaF2(Mn) thermoluminescence dosimeter (TLD) re
3、ading forits response to neutrons during the irradiation. The neutronresponse may be subtracted from the total TLD response togive the gamma-ray response. In fields with a large neutroncontribution to the total response, this procedure may result inlarge uncertainties.1.2 More precise experimental t
4、echniques may be applied ifthe uncertainty derived from this practice is larger than thelevel that the user can accept. These more precise techniquesare not discussed here. The references in Section 8 describesome of these techniques.1.3 This practice does not discuss effects on the TLDreading from
5、neutron interactions with the material surround-ing the TLD and used to ensure a charged particle equilibrium.These effects will depend on the isotopic composition of thesurrounding material and its thickness, and on the incidentneutron spectrum (1).21.4 The values stated in SI units are to be regar
6、ded asstandard.2. Referenced Documents2.1 ASTM Standards:3E170 Terminology Relating to Radiation Measurements andDosimetryE666 Practice for CalculatingAbsorbed Dose From Gammaor X RadiationE668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for DeterminingAbsorbed Dosein Radi
7、ation-Hardness Testing of Electronic DevicesE720 Guide for Selection and Use of Neutron Sensors forDetermining Neutron Spectra Employed in Radiation-Hardness Testing of ElectronicsE721 Guide for Determining Neutron Energy Spectra fromNeutron Sensors for Radiation-Hardness Testing of Elec-tronicsE722
8、 Practice for Characterizing Neutron Fluence Spectrain Terms of an Equivalent Monoenergetic Neutron Fluencefor Radiation-Hardness Testing of ElectronicsE1854 Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic PartsF1190 Guide for Neutron Irradiation of Unbias
9、ed ElectronicComponents3. Terminology3.1 Definitions:3.1.1 absorbed dosesee Terminology E170.3.1.2 exposuresee Terminology E170.3.1.3 kermasee Terminology E170.3.1.4 linear energy transfer (LET)the energy loss per unitdistance as a charged particle passes through a material.Electrons resulting from
10、gamma-ray interactions in a materialgenerally have a low LET. Heavy charged particles resultingfrom neutron interactions with a material generally have a highLET.3.1.5 neutron sensitivity m(E)the ratio of the detectorreading, that is, the effective neutron dose, to the neutronfluence. Thus,mE! 5ME!F
11、E!(1)where:F(E) = the neutron fluence, andM(E) = the apparent dose (light output) in the TLD causedby neutrons of energy E.4. Significance and Use4.1 Electronic devices are typically tested for survivabilityto gamma radiation in pure gamma-ray fields. Testing elec-tronic device response against neut
12、rons is more complex sincethere is invariably a gamma-ray component in addition to theneutron field. The gamma-ray response of the electronic deviceis typically subtracted from the overall response to find the1This practice is under the jurisdiction of ASTM Committee E10 on NuclearTechnology and App
13、lications and is the direct responsibility of SubcommitteeE10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices.Current edition approved Nov. 1, 2011. Published November 2011. Originallyapproved in 2005. Last previous edition approved in 2006 as E2450-06. DOI:10.1520/E2450-11.
14、2The boldface numbers in parentheses refer to the list of references at the end ofthis standard.3For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Docume
15、nt Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.device response to neutrons. This approach to the testingrequires a determination of the gamma-ray exposure in themixed field. To enhance the neutron
16、effects, the radiation fieldis sometimes selected to have as large a neutron component aspossible.4.2 CaF2(Mn) TLDs are often used to monitor the gamma-ray dose in mixed neutron/gamma radiation fields. Since thedosimeters are exposed along with the device under test to themixed field, their response
17、 must be corrected for neutrons. In afield rich in neutrons, the uncertainty in the interpretation of theTLD response grows. In fields with relatively few neutrons, thetotal TLD response may be used to make a correction forgamma response of the device under test. Under this condition,the relative un
18、certainty in the TLD neutron response is notlikely to drive the overall uncertainty in the correction to theelectronic device response.4.3 This practice gives a means of estimating the responseof CaF2(Mn) TLDs to neutrons. This neutron response is thensubtracted from the measured response to determi
19、ne the TLDresponse due to gamma rays. The procedure has relatively highuncertainty because the neutron response of CaF2(Mn) TLDsmay vary depending on the source of the material, and thisprocedure is a generic calculation applicable to CaF2(Mn)TLDs independent of their manufacturer/source. The neutro
20、nresponse given in this practice is a summary of CaF2(Mn) TLDresponses reported in the literature. The associated uncertaintyenvelops the range of results reported, and includes the varietyof CaF2(Mn) TLDs used as well as the uncertainties in thedetermination of the neutron response as reported by v
21、ariousauthors.4.4 Should the user find the resulting uncertainties too largefor his purposes, the neutron response of the particularCaF2(Mn) TLDs in use must be determined. This practice doesnot supply guidance on how to determine the neutron responseof a specific batch of TLDs.4.5 Neutron effects o
22、n electronics under test are usuallyreported in terms of 1-MeV(Si) equivalent fluence (E722).Neutron effects of TLDs, as discussed here, are reported inunits of absorbed dose, since they are corrections to thegamma-ray dose.5. Exposure Procedure5.1 Determine the neutron and gamma-ray environments.Ca
23、lculate the relative neutron response of the TLDs. If thisresponse is negligible, document this maximum bound of theTLD response to the neutron environment. No further mea-surements are required for the purpose of documenting theneutron sensitivity of the TLDs.5.2 Expose the TLD along with the devic
24、e under test (seePractice E1854 and Guide F1190). If there is a non-negligiblefast-neutron or thermal-neutron response, a fast-neutron moni-tor (for example, nickel) or thermal-neutron monitor (forexample, gold) must also be exposed with the device undertest.5.3 The neutron spectrum must be known (s
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