ASTM E2382-2004(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy《扫描隧道显微镜学和原子力显微镜学中扫描器和与触点相关物品的标准指南》.pdf
《ASTM E2382-2004(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy《扫描隧道显微镜学和原子力显微镜学中扫描器和与触点相关物品的标准指南》.pdf》由会员分享,可在线阅读,更多相关《ASTM E2382-2004(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy《扫描隧道显微镜学和原子力显微镜学中扫描器和与触点相关物品的标准指南》.pdf(18页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: E2382 04 (Reapproved 2012)Standard Guide toScanner and Tip Related Artifacts in Scanning TunnelingMicroscopy and Atomic Force Microscopy1This standard is issued under the fixed designation E2382; the number immediately following the designation indicates the year oforiginal adoption or,
2、 in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 All microscopes are subject to artifacts. The purpose ofthis document is to prov
3、ide a description of commonlyobserved artifacts in scanning tunneling microscopy (STM)and atomic force microscopy (AFM) relating to probe motionand geometric considerations of the tip and surface interaction,provide literature references of examples and, where possible,to offer an interpretation as
4、to the source of the artifact.Because the scanned probe microscopy field is a burgeoningone, this document is not meant to be comprehensive but ratherto serve as a guide to practicing microscopists as to possiblepitfalls one may expect. The ability to recognize artifactsshould assist in reliable eva
5、luation of instrument operation andin reporting of data.1.2 A limited set of terms will be defined here. A fulldescription of terminology relating to the description,operation, and calibration of STM and AFM instruments isbeyond the scope of this document.1.3 The values stated in SI units are to be
6、regarded asstandard. No other units of measurement are included in thisstandard.2. Referenced Documents2.1 ASTM Standards:2E1813 Practice for Measuring and Reporting Probe TipShape in Scanning Probe Microscopy3. Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 artifactany feature
7、of an image generated by anAFM or STM that deviates from the true surface. Artifacts canhave origins in sample preparation, instrument hardware/software, operation, post processing of data, etc.3.1.2 imagesurface topography represented by plottingthe z value for feature height as a function of x and
8、 y position.Typically the z height value is derived from the necessary zvoltage applied to the scanner to allow the feedback value toremain constant during the generation of the image. The“image” is therefore a contour plot of a constant value of thesurface property under study (for example, tunneli
9、ng current inSTM or lever deflection in AFM).3.1.3 tipthe physical probe used in either STM or AFM.For STM the tip is made from a conductive metal wire (forexample, tungsten or Pt/Ir) while for AFM the tip can beconductive (for example, doped silicon) or non-conductive (forexample, silicon nitride).
10、 The important performance param-eters for tips are the aspect ratio, the radius of curvature, theopening angle, the overall geometrical shape, and the materialof which they are made.3.1.4 cantilever or leverthe flexible beam onto which theAFM tip is placed at one end with the other end anchoredrigi
11、dly to the microscope. The important performance param-eters for cantilevers are the force constant (expressed in N/m)and resonance frequency (expressed in kHz typically). Thesevalues will depend on the geometry and material properties ofthe lever.3.1.5 scannerthe device used to position the sample
12、andtip relative to one another. Generally either the tip or sample isscanned in either STM or AFM. The scanners are typicallymade from piezoelectric ceramics. Tripod scanners use threeindependent piezo elements to provide motion in x, y, and z.Tube scanners are single element piezo materials that pr
13、ovidecoupled x,y,z motion. The important performance parametersfor scanners are the distance of movement per applied volt(expressed as nm/V) and the lateral and vertical scan ranges(expressed in microns).3.1.6 scan anglethe angle of rotation of the x scan axisrelative to the x-axis of the sample3.1.
14、7 tip characterizera special sample used to determinethe geometry of the tip. The tip in question is used to image thecharacterizer.The image then becomes an input to an algorithmfor determining the tip geometry.1This guide is under the jurisdiction of ASTM Committee E42 on SurfaceAnalysis and is th
15、e direct responsibility of Subcommittee E42.14 on STM/AFM.Current edition approved Nov. 1, 2012. Published December 2012. Originallyapproved in 2004. Last previous edition approved in 2004 as E2382 04. DOI:10.1520/E2382-04R12.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orco
16、ntact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States13.2 Abbreviations:3.2
17、.1 AFMatomic force microscopy (microscope). Werefer here to contact mode AFM as opposed to non-contacttechniques.3.2.2 STMscanning tunneling microscopy (microscope).4. Significance and Use4.1 This compilation is limited to artifacts observed inscanning tunneling microscopes and contact-mode atomicfo
18、rce microscopes. In particular, this document focuses onartifacts related to probe motion and geometrical consider-ations of the tip and surface interaction. Many of the artifactsdescribed here extend to other scanned probe microscopieswhere piezoscanners are used as positioning elements or wheretip
19、s of similar geometries are used. These are not the onlyartifacts associated with measurements obtained by STM orAFM. Artifacts can also arise from the following: controlelectronics (for example, improper feedback gains); noise(mechanical, acoustic, or electronic); drift (thermal or me-chanical); pr
20、oblems unique to signal detection methods (forexample, laser spillover in optical lever schemes); improperuse of image processing (real time or post processed); samplepreparation, environment (for example, humidity) and tip-surface interaction (for example, excessive electrostatic,adhesive, shear, a
21、nd compressive forces). It is suggested thatthese other types of artifacts form the basis of future ASTMguides.5. Artifacts in STM and AFM5.1 Artifacts arising from Scanner MotionScanners aremade from piezoelectric ceramic materials used to accuratelyposition the tip relative to the surface on the n
22、anometer scale.They exhibit an inverse piezoelectric effect where the materialwill undergo dimensional change in an applied electric field.Ideal behavior is often assumed when using these devices inSTM or AFM microscopes. Ideal behavior implies: (1) linearresponse in dimensional change per applied v
23、olt; (2)nodependence of the dimensional response on the direction of thevoltage change, the magnitude of the voltage change, or therate of the voltage change (Fig. 1). The motions of thesedevices are subject to deviations that include non-linearity,hysteresis, and creep (1-5).3In addition to these n
24、on-idealmotions which are characteristic of independent scanner axes,artifacts may arise as a consequence of coupling between theaxes.5.1.1 Non-LinearityNon-linearity means that the responseof the scanner in nm/V changes as a function of appliedvoltage. Typically the response deviates more at larger
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