ASTM E2371-2004 Standard Test Method for Analysis of Titanium and Titanium Alloys by Atomic Emission Plasma Spectrometry 《用原子辐射等离子体光谱测定法分析钛和钛合金的标准试验方法》.pdf
《ASTM E2371-2004 Standard Test Method for Analysis of Titanium and Titanium Alloys by Atomic Emission Plasma Spectrometry 《用原子辐射等离子体光谱测定法分析钛和钛合金的标准试验方法》.pdf》由会员分享,可在线阅读,更多相关《ASTM E2371-2004 Standard Test Method for Analysis of Titanium and Titanium Alloys by Atomic Emission Plasma Spectrometry 《用原子辐射等离子体光谱测定法分析钛和钛合金的标准试验方法》.pdf(10页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: E 2371 04Standard Test Method forAnalysis of Titanium and Titanium Alloys by AtomicEmission Plasma Spectrometry1This standard is issued under the fixed designation E 2371; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision
2、, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This method describes the analysis of titanium andtitanium alloys by ICP-AES (Inductively Coupled Plasm
3、a) andDCP-AES (Direct Current Plasma) for the following elements:ElementApplicationRange (wt.%)QuantitativeRange (wt.%)Aluminum 08 0.001 to 8.0Boron 00.04 0.0008 to 0.01Chromium 05 0.005 to 4.0Copper 00.6 0.002 to 0.5Iron 03 0.004 to 3.0Manganese 00.04 0.001 to 0.01Molybdenum 08 0.004 to 6.0Nickel 0
4、1 0.001 to 1.0Silicon 00.5 0.02 to 0.4Tin 04 0.02 to 3.0Vanadium 015 0.01 to 15.0Yttrium 00.04 0.001 to 0.004Zirconium 05 0.003 to 4.01.2 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to esta
5、blish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use. Specific safetyhazards statements are given in Section 9.2. Referenced Documents2.1 ASTM Standards:2D 1193 Specification for Reagent WaterE50 Practices for Apparatus, Reagents, and
6、 Safety Precau-tions for Chemical Analysis of MetalsE 135 Terminology Relating to Emission SpectroscopyE 882 Guide for Accountability and Quality Control in theChemical Analysis LaboratoryE 1479 Practice for Describing and Specifying Inductively-Coupled Plasma Atomic Emission SpectrometersE 1601 Pra
7、ctice for Conducting an Interlaboratory Study toEvaluate the Performance of an Analytical MethodE 1763 Guide for Interpretation and Use of Results fromInterlaboratory Testing of Chemical Analysis MethodsE 1832 Practice for Describing and Specifying a Direct-Current-Plasma Atomic Emission Spectromete
8、rE 1914 Practice for the Use of Terms Relating to theDevelopment and Evaluation of Methods for ChemicalAnalysis3. Terminology3.1 For definitions of terms used in this method, refer toTerminology E 135 and Terminology section in E 1914.4. Summary of Test Method4.1 Amineral acid solution of the sample
9、 is aspirated into aninductively coupled plasma or a direct current plasma spec-trometer. The intensities of emission lines from the spectra ofthe analytes are measured and compared with calibrationcurves obtained from solutions containing known amounts ofpure elements.5. Significance and Use5.1 Thi
10、s method for the chemical analysis of titanium andtitanium alloys is primarily intended to test material forcompliance with specifications of chemical composition.5.2 It is assumed that all who use this method will be trainedanalysts capable of performing common laboratory proceduresskillfully and s
11、afely, and that the work will be performed in aproperly equipped laboratory.5.3 The method is designed to give the maximum flexibilityanalyzing elements in the titanium matrix. Thus options aregiven in calibration and analysis to accommodate the variety ofICP and DCP spectrometers and their auxiliar
12、y systems.6. Interferences6.1 Potential interferences for analytes (see 1.2) are listed inTable 1 for this methods analytical wavelengths. The analyti-cal wavelengths of Table 1 were selected for their freedomfrom interference by the elements included in this method andthe titanium base (see Note 1)
13、.1This test method is under the jurisdiction of ASTM Committee E01 onAnalytical Chemistry for Metals, Ores and Related Materials and is the directresponsibility of Subcommittee E01.06 on Ti, Zr, W, Mo, Ta, Nb, Hf.Current edition approved June 1, 2004. Published June 2004.2For referenced ASTM standar
14、ds, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA
15、19428-2959, United States.NOTE 1Elements outside the scope of this method may be present inproduction materials or experimental titanium alloys. These potentialinterferences must be tested for their effect as an interference on analytewavelengths and corrections made as necessary as a part of method
16、development according to manufacturers instructions.7. Apparatus7.1 Direct Current Plasma Atomic Emission Spectrometersused in this method may conform to the specifications given inPractice E 1832. A differently designed instrument may pro-vide equivalent measurements. Suitability for use is deter-m
17、ined by comparing the results obtained with the precision andbias statements contained in this method.7.2 Inductively Coupled Plasma Atomic Emission Spec-trometers used in this method may conform to the specifica-tions given in Practice E 1479. A differently designed instru-ment may provide equivale
18、nt measurements. Suitability for useis determined by comparing the results obtained with theprecision and bias statements contained in this method.7.3 The sample introduction system shall be constructed ofmaterials resistant to all mineral acids including HF.7.4 Each instrument shall be set up accor
19、ding to the manu-facturers instructions.8. Reagents and Materials8.1 Purity of reagents utilized in this procedure shall con-form to the requirements prescribed in Practice E50.8.2 The purity of water used shall conform to the require-ments in Specification D 1193 for reagent water, Type II.8.3 The
20、argon supply for the ICP or DCP plasma shall be of99.998 % minimum purity; for purging the ICP Optical path,99.999 % minimum purity.8.4 The nitrogen supply for purging the ICP Optical pathshall be 99.995 % minimum purity.8.5 Reference solutions are available for purchase as analternative to the prep
21、aration of solutions from pure metals orcompounds.8.5.1 Single element reference solutions in the form ofCertified Reference Materials are available from the NationalInstitute of Standards and Technology (NIST) and a number ofcommercial suppliers. The NIST Standard Reference Materials(SRM) 31003seri
22、es are available as 10 mg/g (5 mg/g for someelements) solutions. See Notes 2 and 3.8.5.2 Reference solutions from other sources may be used ifthey have a documented link of traceability to primary refer-ence materials or CRMs from a national metrology instituteand the concentrations of impurities ar
23、e known or determined(see Note 4).NOTE 2To use solution standards of concentration less than theoriginal concentration, prepare the solution by dilution of the concentratedreference solution. Maintain the acid concentration as recommended in theNIST or other certificate. NIST certificates provide in
24、structions fordilution by mass or by volume. Dilution by mass may be preferable topipetting, especially for solutions containing HF.NOTE 3The user should establish internal laboratory procedures thatspecify a maximum shelf life for a working standard solution. It has beenobserved that polytetrafluor
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