ASTM E2208-2002 Standard Guide for Evaluating Non-Contacting Optical Strain Measurement Systems《评价非接触式光学应变测量系统的标准指南》.pdf
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1、Designation: E 2208 02Standard Guide forEvaluating Non-Contacting Optical Strain MeasurementSystems1This standard is issued under the fixed designation E 2208; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revisi
2、on. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 The purpose of this document is to assist potential usersin understanding the issues related to the accuracy of non-contacting s
3、train measurement systems and to provide acommon framework for quantitative comparison of opticalsystems. The output from a non-contacting optical strain anddeformation measurement system is generally divided intooptical data and image analysis data. Optical data containsinformation related to speci
4、men strains and the image analysisprocess converts the encoded optical information into straindata. The enclosed document describes potential sources oferror in the strain data and describes general methods forquantifying the error and estimating the accuracy of themeasurements when applying non-con
5、tacting methods to thestudy of events for which the optical integration time is muchsmaller than the inverse of the maximum temporal frequency inthe encoded data (that is, events that can be regarded as staticduring the integration time). A brief application of the ap-proach, along with specific exa
6、mples defining the variousterms, is given in the Appendix.2. Referenced Documents2.1 ASTM Standards:E 8 Test Methods for Tension Testing of Metallic Materials2E 83 Practice for Verification and Classification of Exten-someters2E 251 Test Methods for Performance Characteristic ofBonded Resistance Str
7、ain Gages2E 399 Test Method for Plane Strain Fracture Toughness ofMetals2E 1823 Terminology Relating to Fatigue and Fracture Test-ing23. Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 accuracyquantitative relationship of the measure-ments to the value obtained by standard measur
8、ement tech-niques3.1.2 basic datadata obtained directly by the measure-ment system. For optical, non-contacting methods, a two-dimensional array of image intensity data is generally the basicdata.3.1.3 coherent illuminationlight source where the differ-ence in phase is solely a function of optical p
9、ath differences;interference is a direct consequence.3.1.4 decoded datameasurement information related tothe displacement or displacement gradient field.3.1.5 decoded data bandwidthspatial frequency range ofthe information after decoding of the optical data.3.1.6 derived datadata obtained through pr
10、ocessing of thebasic data. Typically, this is displacement field data.3.1.7 dynamic rangethe range of physical parameter val-ues for which measurements can be acquired with the mea-surement system.3.1.8 illumination wavelengthwavelength of illumination,z.3.1.9 incoherent illuminationlight source wit
11、h randomvariations in optical path differences; constructive or destruc-tive interference of waves is not possible.3.1.10 maximum temporal frequency of encoded datareciprocal of the shortest event time contained in the encodeddata (for example, time variations in displacement field).3.1.11 measureme
12、nt noisevariations in the measurementsthat are not related to actual changes in the physical propertybeing measured. May be quantified by statistical propertiessuch as standard deviation.3.1.12 measurement resolutionsmallest change in thephysical property that can be reliably measured.3.1.13 numeric
13、al aperture, (N.A.)non-dimensional mea-sure of diffraction-limitation for imaging system; N.A. = D/ffor a simple lens system, where D is lens diameter and f is lensfocal length.3.1.14 optical datarecorded images of specimen, contain-ing encoded information related to the displacement or dis-placemen
14、t gradient field, or both.1This guide is under the jurisdiction of ASTM Committee E08 on Fatigue andFracture and is the direct responsibility of Subcommittee E08.03 on AdvanceApparatus and Techniques.Current edition approved May 10, 2002. Published August 2002.2Annual Book of ASTM Standards, Vol 03.
15、01.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.3.1.15 optical data bandwidthspatial frequency range ofthe optical pattern (for example, fringes, speckle pattern, etc.)that can be recorded in the images without aliasing or loss of
16、information.3.1.16 optical integration timetime over which digitalimage data is averaged to obtain a discretely sampled repre-sentation of the object.3.1.17 optical resolution, (OR)distance, d = z / (2 N.A.),between a pair of lines that can be quantatively determined.3.1.18 quantization levelnumber
17、of bits used in the digitalrecording of optical data by each sensor for image analysis.The quantization level is one of the parameters determining thefidelity of the recorded optical images. It is determined by thecamera selected for imaging and typically is 8 bits for mostcameras.3.1.19 recording r
18、esolution (pixels/length), knumber ofoptical sensor elements (pixels) used to record an image of aregion of length L on object.3.1.20 spatial resolution for encoded dataone-half of theperiod of the highest frequency component contained in thefrequency band of the encoded data.3.1.21 spatial resoluti
19、on for optical dataone-half of theperiod of the highest frequency component contained in thefrequency band of the optical data. Note that decoded data mayhave a lower spatial resolution due to the decoding process.3.1.22 systematic errorsbiased variations in the measure-ments due to the effects of t
20、est environment, hardware and/orsoftware. Test environment effects include changes in tempera-ture, humidity, lighting, out-of-plane displacements (for 2-Dsystems) etc. Hardware effects include lens aberrations, ther-mal drift in recording media, variations in sensing elements,interlacing of lines,
21、phase lag due to refresh rates, depth of fieldfor recording system, etc. Software effects include interpola-tion errors, search algorithm processes, image boundary ef-fects, etc.4. Description of General Optical Non-Contacting StrainMeasurement Systems4.1 Figs. 1 and 2 show schematics of typical moi
22、r anddigital image correlation setups used to make displacementfield measurements. In its most basic form, an optical non-contacting strain measurement system such as shown in Figs. 1and 2, consists of five components. The five components are(a) an illumination source, (b) a test specimen, (c) a met
23、hod toapply forces to the specimen, (d) a recording media to obtainimages of the object at each load level of interest and (e)animage analysis procedure to convert the encoded deformationinformation into strain data. Since the encoded information inthe optical images may be related either to displac
24、ement fieldcomponents or to the displacement gradient field components,image analysis procedures will be somewhat different for eachcase. However, regardless of which form is encoded in theimages, the images are the Basic Data and the displacementfields and the strain fields will be part of the Deri
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