ASTM E1324-2000(2005) Standard Guide for Measuring Some Electronic Characteristics of Ultrasonic Examination Instruments《超声检验装置的某些电子特性测定的标准指南》.pdf
《ASTM E1324-2000(2005) Standard Guide for Measuring Some Electronic Characteristics of Ultrasonic Examination Instruments《超声检验装置的某些电子特性测定的标准指南》.pdf》由会员分享,可在线阅读,更多相关《ASTM E1324-2000(2005) Standard Guide for Measuring Some Electronic Characteristics of Ultrasonic Examination Instruments《超声检验装置的某些电子特性测定的标准指南》.pdf(10页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: E 1324 00 (Reapproved 2005)Standard Guide forMeasuring Some Electronic Characteristics of UltrasonicExamination Instruments1This standard is issued under the fixed designation E 1324; the number immediately following the designation indicates the year oforiginal adoption or, in the case
2、 of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This guide describes procedures for electronically mea-suring the following performance-rel
3、ated characteristics ofsome sections of ultrasonic instruments:1.1.1 Power Supply Section:line regulation,battery discharge time, andbattery charge time.1.1.2 Pulser Section:pulse shape,pulse amplitude,pulse rise time, pulse length, andpulse frequency spectrum.1.1.3 Receiver Section:vertical lineari
4、ty,frequency response,noise and sensitivity, anddB controls.1.1.4 Time Base Section:horizontal linearity, andclock (pulse repetition rate).1.1.5 Gate/Alarm Section:delay and width,resolution,alarm level,gain uniformity,analog output, andback echo gate.1.2 This guide complements Practice E 317, and i
5、s notintended for evaluating the performance characteristics ofultrasonic examination instruments on the inspection/production line.NOTE 1No access to internal circuity is required.2. Referenced Documents2.1 ASTM Standards:E 317 Practice for Evaluating Performance Characteristicsof Ultrasonic Pulse-
6、Echo Testing Systems Without the Useof Electronic Measurement Instruments2E 1316 Terminology for Nondestructive Examinations22.2 Military Standard:MIL-STD-45662A Calibration System Requirements32.3 Other Standard:IEEE Std. 100, IEEE Standard Dictionary of Electrical andElectronic Terms43. Summary of
7、 Guide3.1 The electronic performance of each section is measuredby identifying that portion of the electrical circuit of theinstrument which comprises the section, applying the recom-mended stimulus or load, or both, and performing the requiredmeasurements using commercially available electronic tes
8、tequipment. These data are then summarized in tabular orgraphical form as performance-related values which can becompared with corresponding values of other ultrasonic exami-nation instruments or of values for the same instrumentobtained earlier (see Section 12 for a suggested reportingformat).3.2 T
9、he following describes the sections of the ultrasonicinstrument and their interrelations during measurement:3.2.1 Power Supply SectionThe power supply section isthat portion of the total instrument circuitry which supplies theregulated DC voltages required to power all other sections ofthe ultrasoni
10、c instrument, including the high voltage (that is,pulser and CRT voltage) circuitry.3.2.2 Pulser SectionThe pulser section is that portion ofthe total instrument circuitry which generates the electrical1This guide is under the jurisdiction of ASTM Committee E07 on Nondestruc-tive Testing and is the
11、direct responsibility of Subcommittee E07.06 on UltrasonicMethod.Current edition approved January 1, 2005. Published January 2005. Originallyapproved in 1990. Last previous edition approved in 2000 as E 1324 - 00.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Cu
12、stomer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Available from Standardization Documents Order Desk, Bldg. 4 Section D, 700Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS.4Available from I
13、nstitute of Electrical and Electronics Engineers, Inc. (IEEE),445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 08854-13311Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.pulse used to energize the ultrasonic search unit. The pulsersection
14、may also include the pulse-shape modification controlssuch as pulse length, damping, or tuning controls.3.2.3 Receiver SectionThe receiver section is that portionof the total instrument circuitry which amplifies, or modifies, orboth, the radio frequency (RF) pulses received from theultrasonic search
15、 unit. This includes the RF amplifiers, detec-tors, video amplifiers, suppression and filtering, and the CRTvertical deflection circuits. Some instruments may not containall of these circuits.3.2.3.1 Time Variable Gain (TVG), (alternatively referred toas Distance Amplitude Correction (DAC), Time Con
16、trolledGain (TCG), etc.) and reject or threshold, while part of thereceiver section, should be turned off while making measure-ments unless otherwise specified by the user.3.2.4 Gate/Alarm SectionThis section monitors the sig-nals in the receiver section to detect the presence or absence ofsignifica
17、nt indications. The gate may include attenuation orgain controls. This section is considered separate from thereceiver section for the purposes of this guide. The alarm signalmay be audible, a voltage proportional to the indicationamplitude, or a mark on voltage or current sensitive paper orsome com
18、bination of these.3.2.5 Time Base SectionThe time base section providesthe linear horizontal sweep, or baseline. It includes the hori-zontal deflection circuits and the clock and delay circuits thatcontrol repetition rate and positioning of signals on thebaseline.4. Significance and Use4.1 The recom
19、mended measurement procedures describedin this guide are intended to provide performance-relatedmeasurements that can be reproduced under the specified testconditions using commercially available test instrumentation.These measurements indicate capabilities of sections of theultrasonic examination i
20、nstrument independent of specifictransducers or examination conditions. Measurements aremade from normally available connectors or test points so thatno access to internal circuitry is required. Further, this guide isnot intended for service, calibration, or maintenance of cir-cuitry for which the m
21、anufacturers instructions are available.It is intended primarily for pulse echo flaw detection instru-ments operating in the nominal frequency range of 100 kHz to25 MHz, but the procedures are applicable to measurements oninstruments utilizing significantly higher frequency compo-nents.4.2 These pro
22、cedures can be applied to the evaluation of anypulse-echo ultrasonic examination instrument which can bedescribed as a combination of the electronic sections discussedin this guide.NOTE 2These procedures are not intended to preclude the use orapplication of equipment for which some or all of the mea
23、surementtechniques of this document are not applicable.4.3 An ultrasonic examination instrument that cannot becompletely described as a combination of the electronicsections discussed in this practice can be partially evaluated.Each portion of the ultrasonic examination instrument that isevaluated m
24、ust fit the description for the corresponding sec-tion.4.4 This guide is meant to be used by electronic personnel toevaluate the electronic system components and not the ultra-sonic system characteristics.5. Apparatus5.1 Ultrasonic InstrumentAny electronic instrument com-prised of a power supply, pu
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