ASTM D3756-1997(2010) Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields《使用分散电场法对固体介电材料抗树枝状电击.pdf
《ASTM D3756-1997(2010) Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields《使用分散电场法对固体介电材料抗树枝状电击.pdf》由会员分享,可在线阅读,更多相关《ASTM D3756-1997(2010) Standard Test Method for Evaluation of Resistance to Electrical Breakdown by Treeing in Solid Dielectric Materials Using Diverging Fields《使用分散电场法对固体介电材料抗树枝状电击.pdf(6页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: D3756 97 (Reapproved 2010)An American National StandardStandard Test Method forEvaluation of Resistance to Electrical Breakdown by Treeingin Solid Dielectric Materials Using Diverging Fields1This standard is issued under the fixed designation D3756; the number immediately following the
2、designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.INTRODUCTIONWhen failure occurs in sol
3、id organic dielectrics that are subjected to very high, continuous, andnonuniform electrical gradients, it generally occurs by a mechanism called treeing. Materials ofdifferent molecular structures have different degrees of resistance to failure by treeing, and thisresistance can sometimes be increa
4、sed by the addition of other materials in low concentration.2Trees that grow by a molecular degradation mechanism resulting from partial discharge (corona) arecalled electrical trees to distinguish them from water and electrochemical trees which are quitedifferent.This test method makes use of two o
5、pposing thin cylindrical electrodes, one sharpened to a point,the other with a hemispherical end. They are molded or inserted into blocks of the material to betested. Because of the shape of the electrodes this is often called a needle test. This test provides astatistical estimate of electrical tre
6、eing initiation and propagation of solid dielectric materials in high,diverging electrical fields.1. Scope1.1 This test method covers the evaluation and comparisonof the resistance of solid organic dielectric materials to theinitiation or growth, or both, of tubular tree-like channelsresulting from
7、partial discharge (corona) and molecular decom-position that occur in the region of very high, diverging electricfields.3,41.2 This test method is primarily for use at a powerfrequency of 50 or 60 Hz.1.3 The test may be carried out at room temperature ortemperatures above or below room temperature.
8、The tempera-ture should not exceed the softening or melting point of thesample material.1.4 This test method can be used for any solid material intowhich needles can be cast, molded, or inserted with heat aftermolding. The resistance to tree initiation is measured by thedouble-needle characteristic
9、voltage, which is only applicableto non-opaque materials so that tree can be observed optically.The resistance to tree initiation and growth is reported by thedouble-needle voltage life, which is applicable to both opaqueand non-opaque materials.1.5 The values stated in SI units are to be regarded a
10、s thestandard.1.6 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2
11、. Referenced Documents2.1 ASTM Standards:5D149 Test Method for Dielectric Breakdown Voltage andDielectric Strength of Solid Electrical Insulating Materialsat Commercial Power FrequenciesD1711 Terminology Relating to Electrical Insulation1This test method is under the jurisdiction of ASTM Committee D
12、09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.12 on Electrical Tests.Current edition approved Oct. 1, 2010. Published October 2010. Originallyapproved in 1990. Last previous edition approved in 2004 as D3756 97(2004).DOI: 10.1520/D3756-97R10.
13、2Symposium on Engineering Dielectrics, ASTM STP 783 , ASTM, 1982, andSymposium on Engineering Dielectrics, ASTM STP 926, ASTM, 1986.3W. D. Wilkens, Chapter 7, “Statistical Methods for the Evaluation of ElectricalInsulating Systems,” Engineering Dielectrics, Vol IIB, Electrical Properties of SolidIns
14、ulating Materials, Measurement Techniques, R. Bartnikas, Editor, ASTM STP926 , ASTM, Philadelphia, 1987.4R. M. Eichorn, Chapter 4, “Treeing in Solid Organic Dielectric Materials,”Engineering Dielectrics, Vol IIA, Electrical Properties of Solid Insulating Materi-als: Molecular Structure and Electrica
15、l Behavior, R. Bartnikas and R. M. Eichorn,Editors, ASTM STP 783, ASTM Philadelphia, 1983.5For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Sum
16、mary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.D1928 Practice for Preparation of Compression-MoldedPolyethylene Test Sheets and Test Specimens6D2275 Test Method for Voltage Endurance of Solid Elec-trical
17、 Insulating Materials Subjected to Partial Discharges(Corona) on the Surface2.2 Other Document:ANSI/IEEE 930-1987 IEEE Guide for the StatisticalAnalysis of Electrical Insulation Voltage Endurance Data73. Terminology3.1 Definitions:3.1.1 partial discharge, nrefer to D1711.3.2 Definition of Terms Spec
18、ific to This Standard:3.2.1 characteristic voltage or DNCV (double-needle char-acteristic voltage), nthat voltage which, when applied for 1h between the ends of two thin cylindrical electrodes (onesharpened to a point, the other with a hemispherical end) in agroup of replicate specimens, produces ob
19、servable dielectricdamage at the point of the sharp electrode in half of thespecimens.3.2.2 median voltage life (t50), nthe time, determinedfrom a Weibull plot, when 50 % failure occurs from a group of10 identical specimens subjected to the same voltage stress.4. Summary of Method4.1 In this test me
20、thod, specimens are prepared and needlesinserted to serve as electrodes. Voltage is applied to the needlesand continued for1hinthedouble-needle characteristicvoltage test or until electrical breakdown occurs in the double-needle voltage life test. Results are expressed as the voltage atwhich half of
21、 the specimens show dielectric damage in 1 h, orthe median time to failure of a group of specimens subjected toa given continuous voltage, at a selected or predeterminedtemperature.5. Significance and Use5.1 This is a laboratory test designed to simulate the effectsof (1) the presence of rough inter
22、faces between conductor orsemiconductive screen and primary insulation in an insulationsystem, (2) the presence of foreign particles (contaminants) inan insulation system, and (3) the presence of small voids orcavities within the insulation.5.2 This test method provides comparative data. The degreeo
23、f correlation with actual performance in service has not beenestablished.6. Apparatus6.1 Power SupplyA high voltage supply having a sinusoi-dal voltage output at a power frequency equipped with con-tinuous voltage control and an adjustable protective automaticcircuit-breaking device that operates at
24、 a controllable currentlevel. See Test Method D149.6.2 CurrentSensitive Individual Specimen DisconnectWhen ten specimens are tested to failure for the voltage lifetest, use a disconnect circuit for each.6.3 ElectrodesThe critical electrode is a round steel rod, 1mm in diameter, sharpened at one end
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