ASTM D3380-1990(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《塑料片基微波电路基片的相对透电率(介电常.pdf
《ASTM D3380-1990(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《塑料片基微波电路基片的相对透电率(介电常.pdf》由会员分享,可在线阅读,更多相关《ASTM D3380-1990(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《塑料片基微波电路基片的相对透电率(介电常.pdf(12页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: D 3380 90 (Reapproved 2003)An American National StandardStandard Test Method forRelative Permittivity (Dielectric Constant) and DissipationFactor of Polymer-Based Microwave Circuit Substrates1This standard is issued under the fixed designation D 3380; the number immediately following th
2、e designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method permit
3、s the rapid measurement ofapparent relative permittivity and loss tangent (dissipationfactor) of metal-clad polymer-based circuit substrates in theX-band (8 to 12.4 GHz).1.2 This test method is suitable for testing PTFE (polytet-rafluorethylene) impregnated glass cloth or random-orientedfiber mats,
4、glass fiber-reinforced polystyrene, polyphenyle-neoxide, irradiated polyethylene, and similar materials havinga nominal specimen thickness of 1.6 mm. The materials areapplicable to service at nominal frequency of 9.6 GHz.NOTE 1See Appendix X1 for additional information about range ofpermittivity, th
5、ickness other than 1.6 mm, and tests at frequencies otherthan 9.6 GHz.1.3 The values stated in inch-pound units are to be regardedas the standard.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this stan
6、dard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:D 150 Test Methods for AC Loss Characteristics and Per-mittivity (Dielectric Constant) of Solid Electrical Insula-tion2D 618 Pr
7、actice for Conditioning Plastics for Testing3D 1711 Terminology Relating to Electrical Insulation2D 2520 Test Methods for Complex Permittivity (DielectricConstant) of Solid Electrical Insulating Materials at Mi-crowave Frequencies and Temperatures to 1650C42.2 IPC Standards:5IPC-TM-650 Test Methods
8、Manual Method 2.5.5.5.IPC-CF-150E Copper Foil for Printed Wiring Applications.2.3 IEEE Standards:6Standard No. 488.1 Standard Digital Interface for Program-mable Instrumentation.Standard No. 488.2 Standards, Codes, Formats, Protocolsand Common Commands for use with ANSI and IEEEStandard 488.1.3. Ter
9、minology3.1 DefinitionsSee Terminology D 1711 for the defini-tions of terms used in this test method. See also Test MethodsD 2520, D 150, and IPC TM-650 for additional informationregarding the terminology.3.2 Definitions of Terms Specific to This Standard:3.2.1 Da symbol used in this test method for
10、 the dissipa-tion factor.3.2.2 DLa correction factor associated with length whichcorrects for the fringing capacitance at the ends of the resonatorelement.3.2.3 k8symbol used in this test method to denote relativepermittivity.NOTE 2The preferred symbol for permittivity is Greek kappa primebut some p
11、ersons use other symbols to denote this property such as DK,SIC,ore8R.3.2.4 microstrip linea microwave transmission line em-ploying a flat strip conductor bonded to one surface of adielectric board or sheet, the other surface of which is cladwith, or bonded to, a continuous conductive foil or plate
12、whichis substantially wider than the strip. Microstrip provides easieraccessibility than stripline for attaching components and de-vices to the strip circuitry.3.2.5 microwave substratea board or sheet of low-lossdielectric material which may be clad with metal foil on one, orboth, surfaces. In this
13、 test method all metal is removed byetching prior to testing.3.2.6 striplinemicrowave transmission line using a flatstrip conductor clamped, or bonded, between two substantiallywider dielectric boards. The outer surfaces of both boards are1This test method is under the jurisdiction of ASTM Committee
14、 D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.12 on Electrical Tests.Current edition approved March 10, 2003. Published May 2003. Originallyapproved in 1975. Last previous edition approved in 1995 as D 3380 90 (1995)e1.2Annual Book of ASTM
15、Standards, Vol 10.01.3Annual Book of ASTM Standards, Vols 08.01 and 10.01.4Annual Book of ASTM Standards, Vol 10.02.5Available from IPC, 2215 Sanders Rd., Northbrook, IL 60062.6Available from Institute of Electrical and Electronics Engineers, Inc. (IEEE),445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 0
16、8854-13311Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.bonded to, or in intimate contact with, conducting foils orplates (ground planes). Stripline may be conceived as aflattened version of cylindrical coaxial cable.3.2.7 stripline
17、 resonatora disconnected section of strip-line loosely coupled at each end by capacitative gaps to feed orprobe lines. The strip becomes resonant at those frequencies atwhich the strip length, increased by an increment due to thefringing fields at the ends, is equal to an integral multiple ofhalf-wa
18、velengths in the dielectric. As frequency varies gradu-ally, the power transmitted from the input to the output feedlines becomes maximum at resonance, and falls off sharply toessentially zero at frequencies which are a few parts perthousand above and below resonance.4. Summary of Test Method4.1 Sub
19、strate specimens, with metal cladding removed,become the supporting dielectric spacers of a microwavestripline resonator when properly positioned and clamped inthe test fixture. The measured values of resonant frequency ofthe stripline resonator and the half-power frequencies are usedto compute the
20、relative permittivity (dielectric constant or k8)and the dissipation factor (D) of the test specimen. The testspecimen consists of one or more pairs of test cards.5. Significance and Use5.1 Permittivity and dissipation factor are fundamental de-sign parameters for design of microwave circuitry. Perm
21、ittivityplays a principal role in determining the wavelength and theimpedance of transmission lines. Dissipation factor (along withcopper losses) influence attenuation and power losses.5.2 This test method is suitable for polymeric materialshaving permittivity in the order of two to eleven. Suchmate
22、rials are popular in applications of stripline and microstripconfigurations used in the 1 to 18 GHz range.5.3 This test method is suitable for design, development,acceptance specifications, and manufacturing quality control.NOTE 3See Appendix X1 for additional information regarding sig-nificance of
23、this test method and the application of the results.6. Apparatus6.1 The preferred assembly fixture shown in Fig. 1, Fig. 2,and Fig. 3 is hereby designated Fixture A. This design of testspecimen fixture provides advantages over the design ofFixture B shown in Fig. 4, Fig. 5, Fig. 6, and Fig. 7.6.1.1
24、The Fixture B design has been included since thisfixture has been, and still is, in service in numerous laborato-ries.6.1.2 The Fixture B design relies upon close control of theroom temperature in the laboratory for control of the testspecimen temperature.6.1.3 Changing of test pattern cards in the
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