ASTM D3380-1990(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《塑料片基微波电路基片的相对透电率(介电常.pdf

《ASTM D3380-1990(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《塑料片基微波电路基片的相对透电率(介电常.pdf》由会员分享，可在线阅读，更多相关《ASTM D3380-1990(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《塑料片基微波电路基片的相对透电率(介电常.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、Designation: D 3380 90 (Reapproved 2003)An American National StandardStandard Test Method forRelative Permittivity (Dielectric Constant) and DissipationFactor of Polymer-Based Microwave Circuit Substrates1This standard is issued under the fixed designation D 3380; the number immediately following th

2、e designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method permit

3、s the rapid measurement ofapparent relative permittivity and loss tangent (dissipationfactor) of metal-clad polymer-based circuit substrates in theX-band (8 to 12.4 GHz).1.2 This test method is suitable for testing PTFE (polytet-rafluorethylene) impregnated glass cloth or random-orientedfiber mats,

4、glass fiber-reinforced polystyrene, polyphenyle-neoxide, irradiated polyethylene, and similar materials havinga nominal specimen thickness of 1.6 mm. The materials areapplicable to service at nominal frequency of 9.6 GHz.NOTE 1See Appendix X1 for additional information about range ofpermittivity, th

5、ickness other than 1.6 mm, and tests at frequencies otherthan 9.6 GHz.1.3 The values stated in inch-pound units are to be regardedas the standard.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this stan

6、dard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:D 150 Test Methods for AC Loss Characteristics and Per-mittivity (Dielectric Constant) of Solid Electrical Insula-tion2D 618 Pr

7、actice for Conditioning Plastics for Testing3D 1711 Terminology Relating to Electrical Insulation2D 2520 Test Methods for Complex Permittivity (DielectricConstant) of Solid Electrical Insulating Materials at Mi-crowave Frequencies and Temperatures to 1650C42.2 IPC Standards:5IPC-TM-650 Test Methods

8、Manual Method 2.5.5.5.IPC-CF-150E Copper Foil for Printed Wiring Applications.2.3 IEEE Standards:6Standard No. 488.1 Standard Digital Interface for Program-mable Instrumentation.Standard No. 488.2 Standards, Codes, Formats, Protocolsand Common Commands for use with ANSI and IEEEStandard 488.1.3. Ter

9、minology3.1 DefinitionsSee Terminology D 1711 for the defini-tions of terms used in this test method. See also Test MethodsD 2520, D 150, and IPC TM-650 for additional informationregarding the terminology.3.2 Definitions of Terms Specific to This Standard:3.2.1 Da symbol used in this test method for

10、 the dissipa-tion factor.3.2.2 DLa correction factor associated with length whichcorrects for the fringing capacitance at the ends of the resonatorelement.3.2.3 k8symbol used in this test method to denote relativepermittivity.NOTE 2The preferred symbol for permittivity is Greek kappa primebut some p

11、ersons use other symbols to denote this property such as DK,SIC,ore8R.3.2.4 microstrip linea microwave transmission line em-ploying a flat strip conductor bonded to one surface of adielectric board or sheet, the other surface of which is cladwith, or bonded to, a continuous conductive foil or plate

12、whichis substantially wider than the strip. Microstrip provides easieraccessibility than stripline for attaching components and de-vices to the strip circuitry.3.2.5 microwave substratea board or sheet of low-lossdielectric material which may be clad with metal foil on one, orboth, surfaces. In this

13、 test method all metal is removed byetching prior to testing.3.2.6 striplinemicrowave transmission line using a flatstrip conductor clamped, or bonded, between two substantiallywider dielectric boards. The outer surfaces of both boards are1This test method is under the jurisdiction of ASTM Committee

14、 D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.12 on Electrical Tests.Current edition approved March 10, 2003. Published May 2003. Originallyapproved in 1975. Last previous edition approved in 1995 as D 3380 90 (1995)e1.2Annual Book of ASTM

15、Standards, Vol 10.01.3Annual Book of ASTM Standards, Vols 08.01 and 10.01.4Annual Book of ASTM Standards, Vol 10.02.5Available from IPC, 2215 Sanders Rd., Northbrook, IL 60062.6Available from Institute of Electrical and Electronics Engineers, Inc. (IEEE),445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 0

16、8854-13311Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.bonded to, or in intimate contact with, conducting foils orplates (ground planes). Stripline may be conceived as aflattened version of cylindrical coaxial cable.3.2.7 stripline

17、 resonatora disconnected section of strip-line loosely coupled at each end by capacitative gaps to feed orprobe lines. The strip becomes resonant at those frequencies atwhich the strip length, increased by an increment due to thefringing fields at the ends, is equal to an integral multiple ofhalf-wa

18、velengths in the dielectric. As frequency varies gradu-ally, the power transmitted from the input to the output feedlines becomes maximum at resonance, and falls off sharply toessentially zero at frequencies which are a few parts perthousand above and below resonance.4. Summary of Test Method4.1 Sub

19、strate specimens, with metal cladding removed,become the supporting dielectric spacers of a microwavestripline resonator when properly positioned and clamped inthe test fixture. The measured values of resonant frequency ofthe stripline resonator and the half-power frequencies are usedto compute the

20、relative permittivity (dielectric constant or k8)and the dissipation factor (D) of the test specimen. The testspecimen consists of one or more pairs of test cards.5. Significance and Use5.1 Permittivity and dissipation factor are fundamental de-sign parameters for design of microwave circuitry. Perm

21、ittivityplays a principal role in determining the wavelength and theimpedance of transmission lines. Dissipation factor (along withcopper losses) influence attenuation and power losses.5.2 This test method is suitable for polymeric materialshaving permittivity in the order of two to eleven. Suchmate

22、rials are popular in applications of stripline and microstripconfigurations used in the 1 to 18 GHz range.5.3 This test method is suitable for design, development,acceptance specifications, and manufacturing quality control.NOTE 3See Appendix X1 for additional information regarding sig-nificance of

23、this test method and the application of the results.6. Apparatus6.1 The preferred assembly fixture shown in Fig. 1, Fig. 2,and Fig. 3 is hereby designated Fixture A. This design of testspecimen fixture provides advantages over the design ofFixture B shown in Fig. 4, Fig. 5, Fig. 6, and Fig. 7.6.1.1

24、The Fixture B design has been included since thisfixture has been, and still is, in service in numerous laborato-ries.6.1.2 The Fixture B design relies upon close control of theroom temperature in the laboratory for control of the testspecimen temperature.6.1.3 Changing of test pattern cards in the

25、Fixture B designis less convenient than with the Fixture A design.6.1.4 For Fixture A the preferred assembly for ResonatorCard and Specimen uses a Lap Conductor Joint. See Fig. 3 fordetails.6.2 Fixture AThe elements of the fixture include thefollowing:6.2.1 Resonator Pattern Card (see Fig. 8),6.2.2

26、Base Stripline Board (see Fig. 9),6.2.3 Base Cover Board (see Fig. 10),6.2.4 End-Launcher Bodies, adapted (see Fig. 11),6.2.5 Aluminum Base Plates (see Fig. 12),6.2.6 Aluminum Clamping Plates (see Fig. 13),6.2.7 Aluminum Blocks, for temperature control (see Fig.14).6.2.8 Sliders and Blocks (see Fig.

27、 15), and6.3 Microwave Signal Source, capable of providing anaccurate signal. An accurate signal provides a leveled powerFIG. 1 Face View of Fixture AssemblyFIG. 2 Exploded Side View of AssemblyFIG. 3 Enlarged Exploded Side View Sectioned Through a ProbeLine Showing a Lap Conductor Joint for Fixture

28、 AD 3380 90 (2003)2output that falls within a 0.1 dB range during the required timeperiod and over the range of frequency needed to make apermittivity and loss measurement, and maintains outputwithin 5 MHz of the set value for the time required to make ameasurement when the signal source is set for

29、a particularfrequency.6.4 Frequency Measuring Device, having a resolution 5MHz or less.6.5 Power Level Detecting Device, having a resolution of0.1 dB or less and capable of comparing power levels within a3-dB range with an accuracy of 0.1 dB.6.6 Compression Force Gage,7capable of measuring to5000 N

30、(1100 lb) with an accuracy of 61 % of full scale.6.7 Vise, or a press, for exerting a controlled force of 4448N (1000 lb) on the test fixture and having an opening of at least5 in. (130 mm) to accept the force gage and test fixture.6.8 Apparatus for Manual Test Setup:6.8.1 Sweep Frequency Generator.

31、7,86.8.2 X-Band Frequency Plug-In Unit.7,96.8.3 Frequency Meter.7,106.8.4 Crystal Detector,7,11two required.6.8.5 Matched Load Resistor,7,12for one of the crystaldetectors.6.8.6 Standing Wave Rectified (SWR) Meter,7,13two re-quired.6.8.7 Directional Coupler.7,146.8.8 Attenuator,7,15rated at 10 dB.6.

32、8.9 Semi-Rigid Coaxial Cable and Connectors.6.8.10 Adapter,7,16for waveguide to coaxial interconnec-tion.6.8.11 The assembly of this equipment is shown schemati-cally in Fig. 16.6.9 Apparatus for Computer Acquisition of DataThefollowing alternative equipment or its equivalent, when prop-erly interco

33、nnected, may be used effectively with a computer-control program for automated testing:7If you are aware of alternative suppliers, please provide this information toASTM International Headquarters. Your comments will receive careful consider-ation at a meeting of the responsible technical committee1

34、, which you may attend.8The sole source of supply of the Hewlett Packard (HP) 8350B or 8620Cgenerator known to the committee at this time is Hewlett Packard.9The sole source of supply of the Hewlett Packard (HP) 83545A or 86251Aplug-in unit known to the committee at this time is Hewlett Packard.10Th

35、e sole source of supply of the Hewlett Packard (HP) X532B meter knownto the committee at this time is Hewlett Packard.11The sole source of supply of the Hewlett Packard 423B Neg. detector knownto the committee at this time is Hewlett Packard.12The sole source of supply of the Hewlett Packard 11523A

36、option .001 resistorknown to the committee at this time is Hewlett Packard.13The sole source of supply of the Hewlett Packard 415E meter known to thecommittee at this time is Hewlett Packard.14The sole source of supply of the Hewlett Packard 779D coupler known to thecommittee at this time is Hewlett

37、 Packard.15The sole source of supply of the Hewlett Packard attenuator 8491B known tothe committee at this time is Hewlett Packard.16The sole source of supply of the Hewlett Packard adapter X281A known to thecommittee at this time is Hewlett Packard.In. mm0.001 0.030.002 0.050.086 2.180.100 2.540.14

38、3 3.630.200 5.080.214 5.440.250 6.350.500 12.701.000 25.401.500 38.102.000 50.802.700 68.58NOTE 1Dimensions are in inches.NOTE 2Metric equivalents are given for general information only.FIG. 4 Generalized Resonator Pattern Card for Fixture B ShowingDimensions of Table 1 and Made of Laminate Matching

39、 theNominal Permittivity of Material to be TestedFIG. 5 Test Fixture Construction, Older Design (Fixture B)D 3380 90 (2003)36.9.1 Sweep Frequency Generator,7,17see also 6.8.1.6.9.2 Radio Frequency (RF) Plug-In Unit,7,18having arange from 0.01 to 20 GHz.NOTE 4A plug-in of a narrower frequency range (

40、in the X-band from5.9 to 12.4 GHz) may be selected at significant cost savings.7,196.9.3 Power Splitter.7,206.9.4 Automatic Frequency Counter.7,216.9.5 Source Synchronizer.7,226.9.6 Attenuator,7,2310 dB, see also 6.8.8.6.9.7 Programmable Power Meter.7,246.9.8 Power Sensor,7,25having a range from 70

41、to +10dBm.6.9.9 Controlling Computer, with a General Purpose Inter-face Bus (GPIB) interface.6.9.10 IEEE 488 (GPIB) Cables, Adapters, and CoaxialCables, suitable for proper interconnecting of all of thecomponents as illustrated in Fig. 17 and described in 6.9.11.6.9.11 Interconnecting Instructions (

42、applicable to 6.9only):6.9.11.1 Connect the power splitter directly to the RFplug-in output. Connect one output of the splitter to the counterinput using an RF cable. With another RF cable, connect the17The sole source of supply of the Hewlett Packard generator 8350B known tothe committee at this ti

43、me is Hewlett Packard.18The sole source of supply of the Hewlett Packard plug-in #83592A known tothe committee at this time is Hewlett Packard.19The sole source of supply of the Hewlett Packard plug-in #83545A known tothe committee at this time is Hewlett Packard.20The sole source of supply of the H

44、ewlett Packard power splitter #11667Aknown to the committee at this time is Hewlett Packard.21The sole source of supply of the Hewlett Packard frequency counter #5343Aknown to the committee at this time is Hewlett Packard.22The sole source of supply of the Hewlett Packard synchronizer #5344A knownto

45、 the committee at this time is Hewlett Packard.23The sole source of supply of the Hewlett Packard attenuator #8491B known tothe committee at this time is Hewlett Packard.24The sole source of supply of the Hewlett Packard power meter #436A knownto the committee at this time is Hewlett Packard.25The s

46、ole source of supply of the Hewlett Packard power sensor #8484A knownto the committee at this time is Hewlett Packard.FIG. 6 Test Fixture Construction, Older Design (Fixture B)FIG. 7 Test Fixture Construction, Older Design (Fixture B)FIG. 8 Generalized Resonator Pattern Card for Fixture A ShowingDim

47、ensions of and Made of Laminate Matching the NominalPermittivity of Materials to be TestedD 3380 90 (2003)4other output to the attenuator. Connect the attenuator to one ofthe test fixture probe lines.6.9.11.2 Connect the counter and the synchronizer as speci-fied by the manufacturer of this equipmen

48、t. Connect the FMoutput from the synchronizer to the FM input on the sweepfrequency generator using a BNC connector.6.9.11.3 Use GPIB cables to parallel connect sweeper,synchronizer, power meter, and computer interface.6.9.11.4 Connect the power sensor to the other probe of thetest fixture and conne

49、ct its special cable to the power meter.6.9.11.5 A synthesized continuous wave (CW) generatormay be used to replace the sweeper, plug-in, power splitterconnector, and the source synchronizer to provide the simpli-fied automated set-up shown in Fig. 18.6.10 Signal SourceThe type of signal source used in amanual test setup will dictate the method by which thehalf-power points are determined. If the power input to the testfixture is maintained constant as the frequency is varied, thenan SWR meter may be used to determine the half-power pointsat the output of the tes