ASTM D2442-1975(2016) Standard Specification for Alumina Ceramics for Electrical and Electronic Applications《电工和电子用氧化铝陶瓷的标准规格》.pdf
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1、Designation: D2442 75 (Reapproved 2016)Standard Specification forAlumina Ceramics for Electrical and ElectronicApplications1This standard is issued under the fixed designation D2442; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision,
2、the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This specification covers the requirements for fabricatedalumina parts suitable for electronic and electri
3、cal applicationsand ceramic-to-metal seals as used in electron devices. Thisstandard specifies limits and methods of test for electrical,mechanical, thermal, and general properties of the bodies usedfor these fabricated parts, regardless of part geometry.1.2 The values stated in SI units are to be r
4、egarded as thestandard. The values given in parentheses are for informationonly.2. Referenced Documents2.1 ASTM Standards:2C20 Test Methods for Apparent Porosity, Water Absorption,Apparent Specific Gravity, and Bulk Density of BurnedRefractory Brick and Shapes by Boiling WaterC108 Symbols for Heat T
5、ransmissionC242 Terminology of Ceramic Whitewares and RelatedProductsC408 Test Method for Thermal Conductivity of WhitewareCeramicsC573 Methods for Chemical Analysis of Fireclay and High-Alumina Refractories (Withdrawn 1995)3C623 Test Method for Youngs Modulus, Shear Modulus,and Poissons Ratio for G
6、lass and Glass-Ceramics byResonanceD116 Test Methods for Vitrified Ceramic Materials forElectrical ApplicationsD149 Test Method for Dielectric Breakdown Voltage andDielectric Strength of Solid Electrical Insulating Materialsat Commercial Power FrequenciesD150 Test Methods for AC Loss Characteristics
7、 and Permit-tivity (Dielectric Constant) of Solid Electrical InsulationD257 Test Methods for DC Resistance or Conductance ofInsulating MaterialsD618 Practice for Conditioning Plastics for TestingD1711 Terminology Relating to Electrical InsulationD1829 Test Method for Electrical Resistance of Ceramic
8、Materials at Elevated Temperatures (Withdrawn 2001)3D2149 Test Method for Permittivity (Dielectric Constant)And Dissipation Factor Of Solid Dielectrics At Frequen-cies To 10 MHz And Temperatures To 500CD2520 Test Methods for Complex Permittivity (DielectricConstant) of Solid Electrical Insulating Ma
9、terials at Mi-crowave Frequencies and Temperatures to 1650CE6 Terminology Relating to Methods of Mechanical TestingE12 Terminology Relating to Density and Specific Gravityof Solids, Liquids, and Gases (Withdrawn 1996)3E122 Practice for Calculating Sample Size to Estimate, WithSpecified Precision, th
10、e Average for a Characteristic of aLot or ProcessE165 Practice for Liquid Penetrant Examination for GeneralIndustryE228 Test Method for Linear Thermal Expansion of SolidMaterials With a Push-Rod DilatometerF19 Test Method for Tension and Vacuum Testing Metal-lized Ceramic SealsF77 Test Method for Ap
11、parent Density of Ceramics forElectron Device and Semiconductor Application (With-drawn 2001)3F109 Terminology Relating to Surface Imperfections onCeramicsF134 Test Methods for Determining Hermeticity of ElectronDevices with a Helium Mass Spectrometer Leak Detector(Withdrawn 1996)3F417 Test Method f
12、or Flexural Strength (Modulus of Rup-ture) of Electronic-Grade Ceramics (Withdrawn 2001)32.2 Other Standards:MIL-STD-105 Sampling Procedures and Tables for Inspec-tion by Attributes41This specification is under the jurisdiction of Committee C21 on Electrical andElectronic Insulating Materials.Curren
13、t edition approved Nov. 1, 2016. Published November 2016. Originallyapproved in 1965. Last previous edition approved in 2012 as D2442 75 (2012).DOI: 10.1520/D2442-75R16.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annua
14、l Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3The last approved version of this historical standard is referenced onwww.astm.org.4Available from the Superintendent of Documents, Government Printing Office,Washington, D.C. 20402.Copyright
15、 ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States1MIL-STD-883 Test Methods and Procedures for Microelec-tronics5ANSI B46.1 Surface Texture63. Terminology3.1 Definitions:3.1.1 The applicable definitions of terms in the followingdocuments shall ap
16、ply to this specification: Symbols C108, andDefinitions C242, D1711, E6, E12, and F109.4. Classification4.1 Ceramics covered by this specification shall be classi-fied by alumina content as follows:TypeAlumina ContentWeight percent, minI82II 93III 97IV 995. Basis of Purchase5.1 Purchase orders for c
17、eramic parts furnished to thisspecification shall include the following information:5.1.1 Type designation (see 3.1),5.1.2 Surface finish and allowable defect limits (if required)(Definitions F109, ANSI B46.1, and Appendix X1),5.1.3 Part drawing with dimensional tolerances (AppendixX1),5.1.4 Specifi
18、c tests (if required),5.1.5 Certification (if required), and5.1.6 Packing and marking.6. Requirements6.1 This material shall conform to the electrical,mechanical, thermal, and general property requirements speci-fied in Table 1, Table 2, Table 3, and Table 4.6.2 Dimensional and surface finish requir
19、ements of the partsshall be as agreed between the supplier and the purchaser;however, guidance for establishing such an agreement isprovided in Appendix X1.6.3 Visual Requirements:6.3.1 Parts shall be uniform in color and texture. Cracks,blisters, holes, porous areas, inclusions, and adherent foreig
20、nparticles shall not be permitted. The limits of surface imper-fections such as pits, pocks, chips (open or closed), surfacemarks, fins, ridges, and flow lines shall be set by mutualagreement between the supplier and the purchaser. Limitingdimensions for these defects, when required for clarificatio
21、n,will be listed in the parts drawing or purchase description. Fordefinitions of the surface imperfections enumerated above, seeDefinitions F109.6.3.2 For hermetic seal applications at least34 of the widthof the seal surface shall remain intact at the location of anydefect.6.3.3 On other surfaces th
22、e limits for defects are such thatthe dimensional tolerances of the part are not affected at thelocation of the defect.7. Test Specimens7.1 The preferred specimens for test are, where possible, theactual part. When necessary, however, specific test specimensshall be prepared from the same batch of m
23、aterial and by thesame processes as those employed in fabricating the ceramicpart insofar as possible.8. Specimen Preparation8.1 The specimens for tests described in 9.1 9.3 shall bepreconditioned in accordance with Procedure A of Test Meth-ods D618.9. Test Methods9.1 Dielectric Constant and Dissipa
24、tion FactorDeterminein accordance with Test Methods D150. Determine values athigher frequencies in accordance with Test Methods D2520.7Determine values at higher temperatures in accordance withTest Method D2149.9.2 Volume ResistivityDetermine in accordance with TestMethods D257. For elevated tempera
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