ASTM C1344-1997(2013) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Single-Standard Gas Source Mass Spectrometer Method《使用普通气源质谱仪对六氟化铀进行同位素分析的标准试验方法》.pdf

《ASTM C1344-1997(2013) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Single-Standard Gas Source Mass Spectrometer Method《使用普通气源质谱仪对六氟化铀进行同位素分析的标准试验方法》.pdf》由会员分享，可在线阅读，更多相关《ASTM C1344-1997(2013) Standard Test Method for Isotopic Analysis of Uranium Hexafluoride by Single-Standard Gas Source Mass Spectrometer Method《使用普通气源质谱仪对六氟化铀进行同位素分析的标准试验方法》.pdf（5页珍藏版）》请在麦多课文档分享上搜索。

1、Designation: C1344 97 (Reapproved 2013)Standard Test Method forIsotopic Analysis of Uranium Hexafluoride by Single-Standard Gas Source Mass Spectrometer Method1This standard is issued under the fixed designation C1344; the number immediately following the designation indicates the year oforiginal ad

2、option or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers the isotopic analysis of uraniumhexafluoride (

3、UF6) and may be used for the entire range of235U isotopic compositions for which standards are available.1.2 This test method is applicable to the determination ofthe isotopic relationship between two UF6samples. If theabundance of a specific isotope of one sample (the standard) isknown, its abundan

4、ce in the other can be determined. This testmethod is flexible in that the number of times a given materialis admitted to the ion source may be adjusted to the minimumrequired for a specified precision level.1.3 The sensitivity with which differences between twomaterials can be detected depends on t

5、he measuring systemused, but ratio-measuring devices can generally read ratio-of-mol ratio differences as small as 0.0001.1.4 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.5 This standard does not purport to address all of t

6、hesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use. Specific hazardsstatements are given in Section 7.2. Referenced Docu

7、ments2.1 ASTM Standards:2C787 Specification for Uranium Hexafluoride for Enrich-mentC996 Specification for Uranium Hexafluoride Enriched toLess Than 5 %235U2.2 Other Document:USEC-651, Uranium Hexafluoride: A Manual of GoodHandling Practices33. Terminology3.1 Definitions of Terms Specific to This St

8、andard:3.1.1 drop through, na measurement of the amount of the238UF5+ion beam that can be passed through the235UF5+collector slit and measured on the235UF5+collector, stated asa percentage of the total238UF5+signal.3.1.2 memory corrections, ncorrections applied to thesample analysis results for memo

9、ry effects.3.1.3 memory effect, nthe inability of the mass spectrom-eter to omit completely the isotopic composition of the sampleanalyzed previously from attributing to the results of furthersamples analyzed.3.1.4 normal isotopic abundance material, nUF6having avalue of 0.711 weight percent (wt %)2

10、35U.3.1.5 ratio-of-mol-ratios, nthe mol ratio (235U/238U) ofthe sample divided by the mol ratio of the standard, or theinverse condition of the mol ratio of the standard divided by themol ratio of the sample.4. Summary of Test Method4.1 Test MethodThe unknown sample and a standard withan isotopic co

11、mposition close to that of the sample areintroduced in sequence into the Neir mass spectrometer. UF5+ions of the isotopes are focused through a mass-resolvingcollector slit and onto a faraday cup collector. Measurementsare made of235UF5+to the total of the other UF5+isotopes.With the known compositi

12、on of the standard, calculation of the235U composition of the sample can be determined.5. Significance and Use5.1 Uranium hexafluoride is a basic material used to preparenuclear reactor fuel. To be suitable for this purpose, thematerial must meet the criteria for isotopic composition. This1This test

13、 method is under the jurisdiction ofASTM Committee C26 on NuclearFuel Cycle and is the direct responsibility of Subcommittee C26.05 on Methods ofTest.Current edition approved July 1, 2013. Published July 2013. Originally approvedin 1997. Last previous edition approved in 2008 as C1344 97 (2008)1.DOI

14、:10.1520/C1344-97R13.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Available from U.S. Enrichment Corporat

15、ion, 6903 Rockledge Dr., Bethesda,MD 20817, http:/.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States1test method is designed to determine whether the materialmeets the requirements described in Specifications C787 andC996.5.2 ASTM Commi

16、ttee C-26 Safeguards Statement:5.2.1 The material (uranium hexafluoride) to which this testmethod applies is subject to the nuclear safeguards regulationsgoverning its possession and use. The analytical procedure inthis test method has been designated as technically acceptablefor generating safeguar

17、ds accountability data.5.2.2 When used in conjunction with appropriate certifiedreference materials (CRMs), this procedure can demonstratetraceability to the national measurement base. However, adher-ence to this procedure does not automatically guarantee regu-latory acceptance of the regulatory saf

18、eguards measurements.It remains the sole responsibility of the user of this test methodto ensure that its application to safeguards has the approval ofthe proper regulatory authorities.6. Apparatus6.1 Neir Mass Spectrometer, with the following features andcapabilities:6.1.1 A single-focusing spectro

19、meter, with a 127-mm mini-mum deflection radius, is satisfactory when equipped andfocused as follows:6.1.1.1 The sample inlet system must have two sampleholders, to which UF6containers can be attached, and thenecessary valves to evacuate the sample lines through whichthe sample and standard are intr

20、oduced. The sample inletsystem should be nickel or Monel for use with corrosive gases,and should have minimum volume.6.1.1.2 A single adjustable leak, operated by an automaticleak control mechanism for admitting the sample into thespectrometer ion source, is preferred.6.1.1.3 The pumping system of t

21、he spectrometer analyzertube must maintain a pressure below 5 108torr with sampleflowing into the ion source.6.1.1.4 Focus the instrument for resolution consistent withprecision requirements. A high-current ion beam of 5 1010to 1109amps is necessary, with a signal-to-noise ratiogreater than 3000 in

22、the low-current amplifier system.6.1.1.5 A dual collector must be used, so that ions from oneisotope are passed through a resolving slit and focused on alow-current collector, and ions from all other isotopes arefocused on a high-current collector. The preferred method ofmaintaining the low-current

23、ion beam within the collector slitis by an automatic beam positioner circuit.Aresolving slit withadjustable width features enhances the measurement of allisotopes but is not mandatory for isotopic measurements.6.1.1.6 The amplified high- and low-current signals are fedinto a multimeter or other devi

24、ce capable of ratioing high- andlow-current signals. If a multimeter is used, the multimetermust have a minimum of 5.5 digits of resolution, a means ofratioing the high- and low-current signals, and interactivecommunication capability with the controller.6.1.1.7 The memory effect of the spectrometer

25、 must beconsistent with the precision required since a high memorylevel is usually more variable than a low one. Memory valuesof 2 to 3 % are typical, but up to 10 % memory can betolerated. The memory characteristics of a spectrometer mustbe established from periodic measurement of the effect. Cur-r

26、ent memory values usually will apply until the ion source isreplaced, repairs are made on the sample inlet system, or theinstrument is refocused so the flow rate of UF6is alteredsignificantly.6.1.1.8 The computer control of the mass spectrometer mustallow the operator to monitor parameters of the sp

27、ectrometerand check other operating conditions. The development of aninteractive program allows input of sample information, per-forms necessary calculations, makes memory corrections, andrecords data. Flexibility of the interactive program allowspausing of the instrument for adjustment or restart c

28、apability,or both. Suggested methods of analysis checks include thestandard deviation (SD) on individual data points, linearity ofthe data set, and a check of source pressure differences betweenthe standard and sample that can be monitored by the computerprogram. Manifold valve actuation, conditioni

29、ng time, andpump-out time are features of the computer control program.7. Hazards7.1 Since UF6is radioactive, toxic, and highly reactive,especially with reducing substances and moisture (see USEC-651), appropriate facilities and practices for analysis must beprovided.8. Procedure8.1 Calibration of I

30、sotopic Standards:8.1.1 One working standard is required for the analysis of asample at any specific concentration of any isotope. Twoworking standards are required to determine memory correc-tions. Memory can be measured more precisely with a largedifference between two working standards, but the a

31、dverseeffect of introducing wide concentration ranges into the massspectrometer must be considered. Ideally, the values obtainedfrom the high- and low-memory standards should symmetri-cally bracket those of the sample to be corrected. Workingstandards approximately 5 % apart (having a ratio of ratio

32、s of1.05) are suitable for most applications.8.1.2 A reasonable limit for the relative e between theunknown sample and the working standard to which it iscompared is 2.5 %. A series of working standards prepared at5 % intervals and used for sample comparisons thus enablesthis 2.5 % limit.8.1.3 Prepa

33、re a working standard, and standardize againstan oxide blend of CRM standards that is within 0.02 % of thevalue of the working standard.8.2 Sample Preparation:8.2.1 Attach tubes containing the appropriate workingstandard, S, and the sample, X, to the spectrometer inlet system,and prepare the materia

34、ls for introduction into the ion source,as follows:8.2.1.1 If adequate sample and working standard areavailable, open all valves between the sample and workingstandard containers and the pumping system, except the valveson the sample and working standard containers. If the amountof sample or working

35、 standard is limited, proceed to 8.2.2.C1344 97 (2013)28.2.1.2 Open the valve on the sample container, and thenclose it quickly to vent gases to the pumping system.8.2.1.3 After the pumping system has evacuated the ventedgases, repeat the steps given in 8.2.1.2 a second time.8.2.1.4 Repeat the steps

36、 given in 8.2.1.2 and 8.2.1.3 for theworking standard.8.2.2 Use the following alternative method of sample puri-fication if the amount of the sample or working standard islimited:8.2.2.1 Operate the appropriate valves to remove air en-trapped in the connectors and to determine that there are noleaks

37、 into the inlet system.8.2.2.2 Freeze the UF6by immersing the container in amixture of water and ice.8.2.2.3 Open the valve on the container to permit theevacuation of volatile impurities from the container, and thenclose the container valve.8.2.2.4 Remove the coolant from around the container,allow

38、ing the UF6to return to room temperature.8.3 Instrument Preparation:8.3.1 Prepare the instrument for analysis as follows:8.3.1.1 Operate the appropriate valves to admit the workingstandard into the ion source.8.3.1.2 With the beam positioner in the manual mode, adjustthe mass spectrometer high-volta

39、ge or magnet current to focusthe235UF5+ion beam through the collector slit to the low-current collector, while the other UF5+ions are collected on thehigh-current collector. This peaking up is complete when thecurrent to the low-current collector is maximized. Place thebeam positioner in the automat

40、ic mode.8.3.1.3 Zero both amplifiers as frequently as needed. Somemust be zeroed daily; others may require zeroing only once perweek.8.3.1.4 Adjust the variable leak until the flow of UF6intothe ion source produces a current of approximately 109ampsto the high-current collector. Place the leak contr

41、ol in theautomatic position. If the analyzer pressure is not within2108torr of that observed when the working standard isadmitted as in 8.3.1.1, further purify the UF6having the higherpressure.8.3.1.5 Terminate the flow of the working standard, andevacuate the ion source.8.3.2 The shortest sequence

42、for the analytical determinationis X, S, X, where X and S represent introductions of the sampleand standard, respectively. Follow each introduction by evacu-ation of the ion source before the next introduction. The timingof the introductions and evacuations depends on the instru-ments being used but

43、 is typically approximately 2 min forsample introduction followed by a 30-s evacuation. Thenumber of introductions per analytical sequence depends onthe precision required. To minimize errors caused by drift inthe spectrometer, always begin and end the sequence with thesame material in the spectrome

44、ter source. A five-introductionsequence (X, S, X, S, X) is most commonly used. An extrapreliminary or equilibration introduction, during which no dataare recorded, precedes the determination to make the sample-standard interaction more uniform and to improve the validityof the memory correction. Dur

45、ing each introduction of UF6into the ion source, conduct the following functions eithermanually or automatically:8.3.2.1 Regulate the ion intensity to within 2 % of thedesired level by adjusting the variable leak. This regulationmay be conducted manually or by an automatic leak controlcircuit.8.3.2.

46、2 Adjust the magnet current or high voltage to obtaina maximum low-current collector signal, and maintain at thisvalue for the entire sample introduction period; or repeatedlysweep across this maximum to obtain a series of scans of thepeak maxima during the period.8.3.2.3 With the instrument peaked

47、up, obtain a readingwith the electrometers for the two collectors connected to amultimeter placed in the ratio circuit position. This reading isproportional to the ratio of the number of ions striking thelow-current collector over the number of ions striking thehigh-current collector.8.3.3 Average a

48、ll of the readings for the standard. Alsoaverage all of the readings for the sample. The two values, RXand RS, are calculated for each analytical sequence.8.3.4 Repeat the sequence, as needed, to obtain the desiredanalytical precision.8.3.5 To correct for memory effects, intersperse memorysequences

49、with sample sequences, using two memory stan-dards that bracket the samples isotopic composition and thatdiffer in isotopic composition by approximately 10 %. Desig-nate the results of RAand RBfor memory standards A and B,respectively. Usually, less than 5 % of the total number ofdeterminations needs and to be made on memory standards.Schedule memory measurements more frequently for maxi-mum precision and plot on a time scale. Interpolate thememory factor from this plot at the time a sample is analyzed.9. Calculation9.1 Percent Drop ThroughAconvenien