ASTM A343 A343M-2003 Standard Test Method for Alternating-Current Magnetic Properties of Materials at Power Frequencies Using Wattmeter-Ammeter-Voltmeter Method and 25-cm Epstein T.pdf
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1、Designation: A 343/A 343M 03Standard Test Method forAlternating-Current Magnetic Properties of Materials atPower Frequencies Using Wattmeter-Ammeter-VoltmeterMethod and 25-cm Epstein Test Frame1This standard is issued under the fixed designation A 343/A 343M; the number immediately following the des
2、ignation indicates the yearof original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval.A superscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers test
3、s for the magnetic propertiesof basic flat-rolled magnetic materials at power frequencies (25to 400 Hz) using a 25-cm Epstein test frame and the 25-cmdouble-lap-jointed core. It covers the determination of coreloss, rms exciting power, rms and peak exciting current, andseveral types of ac permeabili
4、ty and related properties offlat-rolled magnetic materials under ac magnetization.1.2 This test method shall be used in conjunction withPractice A 34/A 34M.1.3 This test method2provides a test for core loss andexciting current at moderate and high magnetic flux densitiesup to 15 kG 1.5 T on nonorien
5、ted electrical steels and up to18 kG 1.8 T on grain-oriented electrical steels.1.4 The frequency range of this test method is normally thatof the commercial power frequencies 50 to 60 Hz. With properinstrumentation, it is also acceptable for measurements at otherfrequencies from 25 to 400 Hz.1.5 Thi
6、s test method also provides procedures for calculat-ing ac impedance permeability from measured values of rmsexciting current and for ac peak permeability from measuredpeak values of total exciting currents at magnetic fieldstrengths up to about 150 Oe 12 000 A/m.1.6 Explanation of symbols and abbre
7、viated definitionsappear in the text of this test method. The official symbols anddefinitions are listed in Terminology A 340.1.7 The values and equations stated in either customary(cgs-emu and inch-pound) or SI units are to be regardedseparately as standard. Within this standard, SI units are shown
8、in brackets except in the sections concerning calculationswhere there are separate sections for the respective unitsystems. The values stated in each system may not be exactequivalents; therefore, each system shall be used independentlyof the other. Combining values from the two systems mayresult in
9、 nonconformance with this standard.1.8 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limit
10、ations prior to use.2. Referenced Documents2.1 ASTM Standards:A 34/A 34M Practice for Sampling and Procurement Test-ing of Magnetic Materials3A 340 Terminology of Symbols and Definitions Relating toMagnetic Testing3A 677/A 677M Specification for Nonoriented ElectricalSteel Fully Processed Types3A 68
11、3/A 683M Specification for Nonoriented ElectricalSteel, Semiprocessed Types3A 876/A 876M Specification for Flat-Rolled, Grain-Oriented, Silicon-Iron, Electrical Steel, Fully ProcessedTypes3A 889/A 889M Test Method for Alternating-Current Mag-netic Properties of Materials at Low Inductions Using theW
12、attmeter-Varmeter-Ammeter-Voltmeter Method and25-cm (250-mm) Epstein Frame3E 177 Practice for Use of the Terms Precision and Bias inASTM Test Methods4E 691 Practice for Conducting an Interlaboratory Study toDetermine the Precision of a Test Method4E 1338 Guide for the Identification of Metals and Al
13、loys InComputerized Material Property Databases53. Significance and Use3.1 This test method is a fundamental method for evaluatingthe magnetic performance of flat-rolled magnetic materials ineither as-sheared or stress-relief annealed condition.3.2 This test method is suitable for design, specificat
14、ionacceptance, service evaluation, and research and development.1This test method is under the jurisdiction of ASTM Committee A06 onMagnetic Properties and is the direct responsibility of Subcommittee A6.01 on TestMethods.Current edition approved June 10, 2003. Published July 2003. Originallyapprove
15、d in 1949. Last previous edition approved in 1997 as A 343 97.2See Burgwin, S. L., “Measurement of Core Loss and A-C Permeability with the25-cm Epstein Frame,” Proceedings, American Society for Testing and Materials,ASTEA Vol 41, 1941, p. 779.3Annual Book of ASTM Standards, Vol 03.04.4Annual Book of
16、 ASTM Standards, Vol 14.02.5Annual Book of ASTM Standards, Vol 02.051Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.4. Test Specimens4.1 The specimens for this test shall be selected andprepared for testing in accordance with provisi
17、ons of PracticeA 34/A 34M and as directed in Appendix of this test method.5. Basic Circuit5.1 Fig. 1 shows the essential apparatus and basic circuitconnections for this test method. Terminals 1 and 2 areconnected to a source of adjustable ac voltage of sinusoidalwaveform and sufficient power rating
18、to energize the primarycircuit without appreciable voltage drop in the source imped-ance. All primary circuit switches and all primary wiringshould be capable of carrying much higher currents than arenormally encountered to limit primary circuit resistance tovalues that will not cause appreciable di
19、stortion of the fluxwaveform in the specimen when relatively nonsinusoidalcurrents are drawn. The ac source may be an electronicamplifier which has a sine-wave oscillator connected to itsinput and may include the necessary circuitry to maintain asinusoidal flux waveform by using negative feedback of
20、 theinduced secondary voltage. In this case, higher primary resis-tance can be tolerated since this system will maintain sinusoi-dal flux at much higher primary resistance. Although thecurrent drain in the secondary is quite small, especially whenusing modern high-input impedance instrumentation, th
21、eswitches and wiring should be selected to minimize the leadresistance so that the voltage available at the terminals of theinstruments is imperceptibly lower than the voltage at thesecondary terminals of the Epstein test frame.6. Apparatus6.1 The apparatus shall consist of as many of the followingc
22、omponent parts as are required to perform the desiredmeasurement functions:6.2 Epstein Test Frame:6.2.1 The test frame shall consist of four solenoids (eachhaving two windings) surrounding the four sides of the squaremagnetic circuit, and a mutual inductor to compensate for airflux within the soleno
23、ids. The solenoids shall be wound onnonmagnetic, nonconducting forms of rectangular cross sec-tion appropriate to the specimen mass to be used. The solenoidsshall be mounted so as to be accurately in the same horizontalplane, and with the center line of solenoids on opposite sides ofthe square, 250
24、6 0.3 mm apart. The compensating mutualinductor may be located in the center of the space enclosed bythe four solenoids if the axis of the inductor is made to beperpendicular to the plane of the solenoid windings.6.2.2 The inner or potential winding on each solenoid shallconsist of one fourth of the
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