ANSI INCITS322-2008 Information Technology - Card Durability Test Methods《信息技术.识别卡耐久性试验方法》.pdf

《ANSI INCITS322-2008 Information Technology - Card Durability Test Methods《信息技术.识别卡耐久性试验方法》.pdf》由会员分享，可在线阅读，更多相关《ANSI INCITS322-2008 Information Technology - Card Durability Test Methods《信息技术.识别卡耐久性试验方法》.pdf（77页珍藏版）》请在麦多课文档分享上搜索。

1、American National StandardDeveloped byfor Information Technology Card Durability Test MethodsANSI INCITS 322-2008ANSIINCITS322-2008Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-

2、,-Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-ANSIINCITS 322-2008Revision ofANSI INCITS 322-2002American National Standardfor Information Technology Card Durability Test Met

3、hodsSecretariatInformation Technology Industry CouncilApproved July 30, 2008 American National Standards Institute, Inc.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-Approval

4、of an American National Standard requires review by ANSI that therequirements for due process, consensus, and other criteria for approval havebeen met by the standards developer.Consensus is established when, in the judgement of the ANSI Board ofStandards Review, substantial agreement has been reach

5、ed by directly andmaterially affected interests. Substantial agreement means much more thana simple majority, but not necessarily unanimity. Consensus requires that allviews and objections be considered, and that a concerted effort be madetowards their resolution.The use of American National Standar

6、ds is completely voluntary; theirexistence does not in any respect preclude anyone, whether he has approvedthe standards or not, from manufacturing, marketing, purchasing, or usingproducts, processes, or procedures not conforming to the standards.The American National Standards Institute does not de

7、velop standards andwill in no circumstances give an interpretation of any American NationalStandard. Moreover, no person shall have the right or authority to issue aninterpretation of an American National Standard in the name of the AmericanNational Standards Institute. Requests for interpretations

8、should beaddressed to the secretariat or sponsor whose name appears on the titlepage of this standard.CAUTION NOTICE: This American National Standard may be revised orwithdrawn at any time. The procedures of the American National StandardsInstitute require that action be taken periodically to reaffi

9、rm, revise, orwithdraw this standard. Purchasers of American National Standards mayreceive current information on all standards by calling or writing the AmericanNational Standards Institute.American National StandardPublished byAmerican National Standards Institute, Inc.25 West 43rd Street, New Yor

10、k, NY 10036Copyright 2008 by Information Technology Industry Council (ITI)All rights reserved.No part of this publication may be reproduced in anyform, in an electronic retrieval system or otherwise,without prior written permission of ITI, 1250 Eye Street NW, Washington, DC 20005. Printed in the Uni

11、ted States of AmericaCAUTION: The developers of this standard have requested that holders of patents that may berequired for the implementation of the standard disclose such patents to the publisher. However,neither the developers nor the publisher have undertaken a patent search in order to identif

12、ywhich, if any, patents may apply to this standard. As of the date of publication of this standardand following calls for the identification of patents that may be required for the implementation ofthe standard, no such claims have been made. No further patent search is conducted by the de-veloper o

13、r publisher in respect to any standard it processes. No representation is made or impliedthat licenses are not required to avoid infringement in the use of this standard.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networkin

14、g permitted without license from IHS-,-,-iContentsPageForeword .iv1 Scope . 12 Normative References 13 Default Test Environment and Conditioning . 24 Definitions. 35 Test Methods 45.1 Peel Strength - 180 peel angle 45.2 Peel Strength - 90 peel angle 75.3 Adhesion Crosshatch Tape Test 105.4 ID-1 Card

15、 Flexure . 135.5 ID-1 Card Static Stress. 165.6 ID-1 Card Stress and Plasticizer Exposure 195.7 Impact Resistance 215.8 Elevated Temperature and Humidity Exposure . 245.9 Surface Abrasion . 255.10 Bar Code Abrasion (1D) . 275.11 Magnetic Stripe Abrasion . 295.12 Image Abrasion . 315.13 Temperature-

16、and Humidity-Induced Dye Migration. 335.14 Plasticizer Induced Dye Migration 365.15 Ultraviolet (UV) Light Exposure 385.16 Daylight Exposure Image Stability - Xenon Arc 395.17 Laundry Test. 415.18 Embossed Character Retention - Pressure 425.19 Embossed Character Retention - Heat. 455.20 Corner Impac

17、t Test. 475.21 Wet Abrasion Test 495.22 IC Card with Contacts Micromodule Adhesion . 505.23 Water Soak Test. 525.24 Linear Dimensional Change at Elevated Temperature. 535.25 Three Roller IC Card Test 555.26 Hole Tear Test 57Copyright American National Standards Institute Provided by IHS under licens

18、e with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-iiPage6 Test Sequences . 596.1 Card Structure Integrity Test Sequence . 596.2 Card Flexure and Peel Strength Sequence 606.3 Elevated Temperature/Humidity and Peel Strength Sequence 616.4 Wet Abrasion and P

19、eel Strength Sequence. 626.5 Card Flexure, Wet Abrasion and Peel Strength Sequence 636.6 Ultraviolet Light Exposure and Corner Impact Sequence. 64AnnexA Bibliography 65Tables1 Rating Diagrams. 122 Full flex dimensions 13Figures1 Card preparation . 52 Card preparation (Alternative) 53 Card preparatio

20、n for peel test. 64 Card mounted in tensile tester . 65 Examples of peel strength chart recordings . 66 Card mounted in tensile tester . 97 Tape peel angle 108 Full flex condition 139 Cross section - calibration plate . 1310 Jaw details . 1311 Calibration plate inside jaws. 1312 Card orientation 141

21、3 Stress fixture - Axis A . 1614 Stress fixture - Axis B . 1615 Card impact fixture . 1816 Impact Test Data Point example 2217 Impact apparatus 2318 Test card notch location . 2619 1D Bar code test location (abrasion) 2820 Mag stripe read area and hole location 3021 Image test location . 3222 Temp/h

22、umidity dye migration test pattern 34Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-iiiPage23 Bar code print location 3724 Guage collar . 4225 Embossed character height guage .

23、 4326 Embossed character test locations. 4327 Card corner impact fixture 4828 Paint shaker 4929 Micromodule adhesion fixture. 5130 Three roller arrangement 5531 Hook diagram . 5732 Card mounted for hole tear. 58Copyright American National Standards Institute Provided by IHS under license with ANSI N

24、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ivForeword (This foreword is not part of American National Standard ANSI INCITS 322-2008.)This standard provides an agreed upon set of test methods that contain specific pro-cedures to be followed. The acceptance or re

25、jection criteria of identification cards,based on test results from these durability test methods, are not within the scope ofwork of this standard.The precision and bias of test results obtained from a given test method are influ-enced by a host of variables. The major sources of this variation are

26、 contributed bytest method, test design, operator, measurement technique, equipment, calibration,environment and materials variation. Round robin test results from many of the testmethods are available upon request.The test method development has attempted to minimize the variation that the testmeth

27、ods might contribute. The test design should consider randomization of test ma-terials, replication and the skillful grouping of test materials. Each operator must bediligent in the use of good testing practices in order to minimize the operators contri-butions to the test variability.Durability acc

28、eptance criteria as stated in ISO/IEC 7810 3rd edition -2003 Physical characteristics - subclause 8.7: “Durability of the cardis not established in this International Standard. It is based on a mu-tual agreement between the card issuer and the supplier.“ Accord-ingly, the card issuer and supplier ne

29、ed to agree to which durabilitytest method, contained herein, is relevant for the given card applica-tion.INCITS B10.3 Task Force on Card Durability Test Methods has established the fol-lowing process steps for generating this standard:Step 1: Identify existing ID card durability problems experience

30、d in field perfor-mance.Step 2: Identify potential test methods that relate to the durability concern.Step 3: Select a team leader, with other experts, to coordinate proposed testmethods in given categories (i.e. abrasion resistance, Peel Strength, and ad-hesion).Step 4: Present new Test Method for

31、consideration. (A simple read-through ofthe test method proposal in ISO 10373 format.)Step 5: Task Force discussion of the proposal. Determination of whether it fitswithin the Scope of Work.Step 6: Proposal is given Pending Status for determination at the next meeting.At the next meeting the proposa

32、l is either Accepted in Principal or rejected. Ifaccepted, the proposal is incorporated into the working paper for further dis-cussion and possible modification at succeeding meetings.Step 7: Testing is conducted and results reported to validate the test techniqueand/or to resolve technical issues.S

33、tep 8: The Test Method status becomes Accepted for Publication after all is-sues have been resolved.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-vThese test methods may sugge

34、st use of materials or test equipment,which are trade-names of a product supplied by a specific manufac-turer. This information is given for the convenience of users of thisANSI standard and does not constitute an endorsement by ANSI orINCITS of the product named. Equivalent products may be used ift

35、hey can be shown to lead to the same result This standard was developed by Technical Committee B10 of Accredited Stan-dards Committee INCITS during 2002 - 2006. The standards approval processstarted in 2006. This document includes annexes that are informative and arenot considered part of the standa

36、rd.Requests for interpretation, suggestions for improvements or addenda, or defect re-ports are welcome. They should be sent to the INCITS Secretariat, InformationTechnology Industry Council, 1250 Eye Street, NW, Suite 200, Washington, DC20005-3922.The standards was processed and approved for submit

37、tal to ANSI by the Internation-al Committee for Information Technology Standards (INCITS). Committee approvalof the standard does not necessarily imply that all committee members voted for itsapproval. At the time it approved this standard, INCITS had the following members:Karen Higginbottom, ChairJ

38、ennifer Garner, SecretaryOrganization Represented Name of RepresentativeAdobe Systems, Inc. .Steve ZillesScott Foshee (Alt.)AIM Global Dan MullenCharles Biss (Alt.)Apple Computer, Inc. David MichaelDistributed Managment Task ForceTony DiCenzoElectronic Industries Alliance Edward Mikoski, Jr.EMC Corp

39、oration Gary RobinsonFarance, Inc. .Frank FaranceTimothy Schoechle (Alt.)Google Zaheda BhoratGS1 US.Ray DelnickiFrank Sharkey (Alt.)James Chronowski (Alt.)Mary Wilson (Alt.)Hewlett-Packard Company .Karen HigginbottomSteve Mills (Alt.)Scott Jameson (Alt.)IBM CorporationRonald F. SillettiRobert Weir (

40、Alt.)Sandy Block (Alt.)Richard Schwerdtfeger (Alt.)IEEEJudith GormanTerry DeCourcelle (Alt.)Bill Ash (Alt.)Jodi Haasz (Alt.)Bob Labelle (Alt.)Susan Tatiner (Alt.)Intel .Philip WennblomDave Thewlis (Alt.)Grace Wei (Alt.)Lexmark International .Don WrightDwight Lewis (Alt.)Paul Menard (Alt.)Copyright A

41、merican National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-viOrganization Represented Name of RepresentativeMicrosoft Corporation . Jim HughesDave Welsh (Alt.)Isabelle Valet-Harper (Alt.)National Ins

42、titute of Standards - Length and axis of fracture; - Description of which card side the fracture occurred; - Full description of card design features (printing, IC, photo, mag stripe, embossing, etc.). 5.4.5 Precision and Bias 5.4.5.1 Interlaboratory Test Program An interlaboratory study of ID-1 Car

43、d Flexure was run in 1998. Sixteen sets of samples were run by four different laboratories. 5.4.5.2 Test Results The precision information given below in the units of measurement (flex cycles until failure) is for the comparison of twelve test results for each laboratory, each of which is the averag

44、e of six test determinations. 5.4.5.3 Precision 95% confidence interval (cycles) 99% confidence interval (cycles)Repeatability limit (within laboratory) 5300 7000 Reproducibility limit (among laboratories) 6800 9000 Test measurement tolerance (overall) 8700 11000 The above terms (repeatability limit

45、 and reproducibility limit) are used as specified in ASTM Practice E177-04e1. The respective standard deviations among test results may be obtained by dividing the values in the 95% confidence interval column by 1.96 or by dividing the values in the 99% confidence interval column by 2.57. 5.4.5.4 Bi

46、as No statement of bias can be made for this test method because there is no accepted reference material or absolute test method for use as a comparison basis. 15Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permit

47、ted without license from IHS-,-,-ANSI INCITS 322-2008 5.5 ID-1 Card Static Stress The purpose of this test is to determine the structural integrity of the card after static stress. 5.5.1 Significance and Use This test method shall be used for in-process card fabrication evaluations, material selecti

48、ons and when a card type is suspected of being “brittle“ or have experienced early field fractures. Card fractures after a stress period is a function of the fabrication process conditions, the card materials and their orientation, card thickness, presence or absence of embossed characters and presence or absence of surface applied decorations. 5.5.2 Apparatus Card Impact fixture as shown in Figure 15. Stress fixture constructed such to cause the card to be stressed in the following way: 78,7 0,79 mm (3.1 0.03 in)50,8 0.51 mm (2.0 0.02 in)Figure 13 Stress fixture Axis