AIR FORCE MIL-A-83783-1972 ADAPTER TEST MX-9042 G《MX-9042 G测试适配器》.pdf

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1、I MIL-A-83783 11 = 9999906 0363090 5 . - - - . - _I- . q-ujw-i - I l I MILIT RY SPECIFICATION ADAPTER, TEST, MX-9042/G 1. SCOPE . 13 March 1972 1.1 of test adapter for use with the AN/GW4-4 analyzer. This specification covers the design and test requirements for one type 2. APPLICABLE DOCUHENTS 2.1

2、for bids or request for proposal form a part of the specification to the extent specified herein The following documents of the issue in effect on the date of invitation SPECIFICATIONS Military MIL-E-4158 t.IIbD-1000 MIL-E-17555 MIL-C-25200 STANDARDS Military MILSTD- MIL-STD-O MIL-STD-130 HIL-STD-83

3、1 2 MIL-STD-1472 DRAWINGS Air Force 7036933-10 Electronic Equipment, Ground; General Requirements For Drawings, Engineering, And Associated Lists Electronic And Electrical Equipment And Associated Repair Parts, Preparation For Delivery Of Cable Assemblies, Special Weapons, Electrical. General Specif

4、ication For Marking For Shipment And Storage Identification Karking Of US IUlitary Property Environmental Test !iethods Test Reports, Preparation Of Human Engineering Design Criteria For Military Systems, Equipment And . Facilities Test Adapter , I.rX-9042/G (Copies of specifications, standards, dra

5、wings, and publications required by suppliers in connection with specific procurement functions should be obtained from the procuring activity or as directed by the contracting officer.) 1 THIS DOCUMENT CONTAINS 1L.l PAGES. FSC 1190 Provided by IHSNot for ResaleNo reproduction or networking permitte

6、d without license from IHS-,-,- - c -_I MIL-A-83783 33 W 7779906 0363093 7 = ! 4 MIL-A-83783 (USh) ._ - 3. REQUIREMENTS 3.1 Freproduction_tecr,lec shall consist of models representative of the production itens. at a laboratory designated by the procuring activity, or, when so stated in the contract,

7、 at the contractors plant under supervision of the procuring activity. They shall be tested 4.3.2 Preproduction test reEos-. contractors plant, the contractor shall, after completion of the preproduction tests, prepare a preproduction test report in accordance with !.?IL-STD-831 and Furnish complete

8、 copies of the report to the procuring activity. When preproduction testing is performed at the 3 i e Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I 4 - _ UIL-A-8373 LL M 7797706 0363073 O t .- . - MIL-A-83783(USAF) 4.4 Acceptance t 4.4.1 Individu

9、al tests. tests as described under 4.6 of this specification. Ac-ceptance tests shall consist of the individual tests. Each adapter shall be subjected to the following a. -nation of product i b. Conformance to drawings c. Functional tests 4.4.2 could indicate that defects may exist in items already

10、accepted, contractor shall fully advisethe procuring activity of all defects likely to be found and methods of correcting them. . Defects in items already accepted. “he investigation of a test failure If so, the 4.5 Test conditions. specification shall be conducted at an atmospheric pressure of 28 t

11、o 32 inches of mercury and at a temperature of 25OC (77OF) +l0C (1F). shall be 80 percent or less. 4.5.1 Test power. power applied shall be 28 volts fl volt direct current (DC). 4.6 =methods. 4.6.1 _Exanination of product. compliance with the requirements of this specification , including materials,

12、 wqrkmmship, and ease of operation of controls. 4.6.2 Functional tests. test in accordance with the procedures of 4.6.2.3. 4.6.2.1 Rejection and retest. appropriate indication requirement of any step of the test, the adapter shall be rejected, and after correction of cause of failure, shall be resub

13、mitted for conpiete functional testing. Unless otherwise specified, all tests prescribed by this Relative humidity Unless otherwise specified in specific tests, the testing Each adapter shall be exdned to determine Each adapter shall be subJected to the functional In the event an item fails to meet

14、the 4.6.2.2 Pre asion for functAoLaJ-Les%. Prior to conducting the functional tests of d3, the Government loaned AN/Gk-4 must be verified for proper functionlng in accordance with existing acceptance criteria. 4.6.2.3 Functional tt?entariPf apply a ground to each of the “test circuit“ pins listed in

15、 Ta3le II for steps 2 through 17. The AN/GWhi-4 FAULT light, 13, shall illuminate on each step. e. f. Auto-scan back to the “S“ position upon completion of step 17. Place the FUHCTIOii switch, S3, on AK/GWTv-b in the COItTIWUITY position and momentarily energize the CIRCUIT ADVAXE switch S3 on the t

16、est adanter until the number “1“ appears in the POSITIOii window. : g. pins. of a jumper. Connect a jumper as required by Table III to the listed “test circuit“ OVERRIDE to position 18, then AUTO-SCAX back to the “S“ position. On each step the Aii/Gd+ FAULT light should go out upon connection h. Mom

17、entarily energize the CIRCUIT ADVANCE switch, C3, on the test adapter until the number “2“ appears in the FOSITIOW window. Place the SIGNAL switch, S10, in the “on“ position. i. Check for the Place the presence of +28 volts DC to P4G and P4K and ground at pin P4L. SIGNAL switch to the “off“ position

18、. WARNING: Do not apply voltage to test circuit pins longer than one or two seconds. Disregard any arc observed when removing power load from test circuit pin. j. Apply 28 volts DC as required by Table IV to the listed test circuit pins. . At each step, the AN/Gifil-h FAULT light should go out upon

19、ap?lication of voltage except steps 15 and 16. remain “off after the voltage has been removed. At steps 15 and 16, the FAULT light will k. 1. Override back to the “S“ position. With a PSM-6 on the RX1 scale, check for 5.1 2.5 ohms between the following pins : (1) P8M and P8T (2) P8w and P8T 7 + . ,e

20、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE 1 - IR Test Circuito For Adapter Position 1 I TABLE II - IR Test Circuits For Adapter Position 2 TEST CIRCUIT PIN ALL PINS OF TABLE I P6n No lest F2D P2E P2F $10 TeLt P8 B,D,E,F, G ,I?, R ,T P2 K

21、 . -I- AN/WM-4 STEP 9 10 11 12 . 13 14 15 16 17 -_I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-A-3783 II M 379990b 0363098 T I! MIL-A-83783 (USAF) TABLE III - Continuity Test Pins For Adapter Position 1 1 10 u. 12 P4g to P4A P4C to P4f S4b t

22、o P4E . P4F to P4II P44 to P4P P44 to P4T P4g to P4W P4g to P4Y P4. tb P6D P4g to P4B Pbg to P4R P4H to P4g 13 i4 35 i6 17 18 13 20 21 22 23 c 9 *d. _- - - Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_ -1 MIL-A-83783 11 M 7797706 0363077 I M I I

23、i ML-A-83783(USAF) r m. 1 I indication. Momentarily place the RELEASE/SALVO switch in position “1.“ The Override to position 15 on the AN/Gh?-k. Disregard the FAULT light FAULT light should now be “off.“ n. Momentarily place the RELEASE/SALVO switch in position “2,“ The FAULT light should not illumi

24、nate. o, Override to position 16. “he FAULT light should be “off.“ Momentarily place the RELEASE/SALVO switch in position “1.“ illuminate. p. The FAULT light should now Again, place the RELEASE/SALVO switch in position “2.“ The FAULT light should be “off.“ Override back to the “S“ position. p. Check

25、 that the following pins are at ground potential:. P8B, D, E, F, G, N, R, T; P2K, and P213. r. ing pins shall be at ground potential: switch. With the AlIJ/GW4-4 RELAY switch, Sg, in the “on“ position, the follow- P8A, C, i, and P. Release the Ki RELAY s. Momentarily energize the CIRCUIT ADVANCE swi

26、tch, S3, on the test Place the adapter until the nurriber “3“ appears in the POSITION window. FUiJCTION switch, 53, on the AEI/G!Gi-4 in the INSULATIOB RESISTANCE position. t. Rotate the SELECT switch, S5, on test adapter through positions 1 through 11 measuring continuity between the positive (red)

27、 meter binding post and the test circuit pins indicated in Table V. u. Measure the resistance across the red and black binding posts while holding the test adapter LOAD switch, 56, in the “on“ position. resistance should be 50 210 ohms. Turn off all power and remove all ground connections. The v. Di

28、sconnect cable assemblies 7036793-10 and 7036793-30 from the test adapter and reconnect them in accordance with Figure 3. w. Connect jumpers between the following pins: P3S, O, U, and P1B. Turn on the power switch of the AN/GWh-4 and test adapter. appears in the test adapter position window. switch,

29、 S3, in the COXINUITY position and the SIGNAL switch, S10, in the “on“ position. Check that number “3“ Place the AN/GGIM-4 FWNCTIOE x. Application of a ground to each of the test circuit pins shown in Table VI shall cause the AX/GW4-4 FAULT light to extinguish. SIGIJAL switch at step 18 and then ove

30、rride back to the “S“ position. the AN/GMvI-4 will trip if signal switch is “on“ when step 22 is reached.) Turn “off“ the (CB2 on y. Momentarily hold the RELEASE/SALVO switch, S4, on test adapter in the number 1 position. P7N. Check for the presence of +28 volts DC at pins P1J and P7W. Geck for the

31、presence of +28 volts DC at pins P1A and Momentarily hold the RELEASE/SALVO switch in the number 2 position. z. While holding the Kl RELAY switch in the “on“ position, check for the While holding Kl RELAY presence of +28 volts DC at pins H, K, L, and M of P5. switch “on“ and placing the REWE/SALVO s

32、witch in number 2 position, check for +28 volts DC at pins PLI, PlJ, P71.1, and P7W. except step 14 which requires energizing the M RELAY switch, Sg. 4.6.3 Environmental tes&. 4.6.3.1 HiRh temperature. test described in method 501, procedure 1 of I!ILSTD-810, except that the test adapter shall be st

33、abilized at ambient temperature prior to operation. 4.6.3.2 Low teEperature. The test adapter shall satisfy the high temperature test described in method 5-2 of LSTD-O. 4.6.3.3 Humioity test. described in method 507, procedure 1 of .IL-TD-o. 4.6.3.4 Vibration t test described in method 514, procedur

34、e Xi of !iIL-STD-810, exceot that the lower frequency shall be 5 Iiz. 4.6.3.5 Shock test. describeti in method 516 , procedure II of HIL-STD-810. 4.6.4 Rejection. *Failure of the test sm.ple to satisfy the functional tests during or after environmental test as required in the specific enviroznental

35、test, shall be considered as failure to saticcf the environmental test and cause for rejection. 5. PREPARATION FOR DELIVERY 5.1 Preservation, xckaging, an6 ackagin:. ?reservation , pocking, mad packaging for shipment shall be in accordance with FIL-15-17555. 5.2 MarkinE for shipment and storap2 Inte

36、rior and exterior shi?ping containers shall be marked in accordance with !il-STD-129. This completes all tests. The test adapter shall satisfy the high temperature The test adapater shall satisfy the hmAGity test The test adapter shall be subjected to the vibration The test adapter shall be subjecte

37、d to the shock test This does not apply to the rain or fungus tests. 6. NWES 6.1 Intended use. conjunction with the AX/Gi*X-4 analyzer to check B-52 aircraft weanono monitor- ing and release system wiring. test on the M-l4/C, -2O/C, -23/C, and -29/C clip-ins. 6.2 Orderine: data. Procurement document

38、s should specie the folloinlr,: The test ad-ter, X-g042/C, is intendee to be used in The test adapter also performs continuity a. b. Title, number, and date of this specification. Selection of applicable levels of preservation, packing, and mckapinc (see Section 5). Custodian: Air Force - 79 Air For

39、ce - 15 _ Review Activity : - - I 13 % beparing Activity: Air ?orce - 73 Iroject :io. 119O-FOO8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-._ . MIL-A-83783 33 W 777770b 0363303 T W -i .-I -_- t .? *I MIL-A-83783(USAF) i i I TABU VI - ClipIn Test

40、 Pins, Adapter Position 3 MALYZER rnlrnd-4 STEP 4 _I_ TEST CIRCUIT AriALYzER CIRCUIT *-i PIN AN/GW-4 STEP 1 PIN ANALYZER AN/W-4 SrEP 1 2 3 4 5 6 7 TEST CIRCUIT PIPS CONIIZCT JWPEH 11_1_.- P32 to P3_c P3C to P3B P3g to P3T P3H to P3F P3A to P3P P3R to PW P3Y to P3W P7N, P1C P7F, PU P7B, P1L 10 11- 12

41、 P7H P7A P7C P7K P7L P3L P3K P3G I i P7P i I t 9 - Place SIGNAL switch in “off1 position. TABLE VI1 - Clip-In Test Pins, Adapter Position 1 Energize Ki RELAY Switch (Alt/G12.1-4) -_ 8 9 10 11 R - - .-_. . .- -I_ TEST CIRCUIT.PINS CONNECT JWIPER .- P3C to P3W P3Z to P3X P3E to P3D P5C to P3& P5D to P3a_ Ho Test P3Y to P3D Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-