BS PD IEC TR 60068-3-12-2014 Environmental testing Supporting documentation and guidance Method to evaluate a possible lead-free solder reflow temperature profile《环境试验 支持文.pdf

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1、BSI Standards Publication Environmental testing Part 3-12: Supporting documentation and guidance Method to evaluate a possible lead-free solder reflow temperature profile PD IEC/TR 60068-3-12:2014National foreword This Published Document is the UK implementation of IEC/TR 60068-3-12:2014. It superse

2、des PD IEC/TR 60068-3-12:2007 which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee EPL/501, Electronic assembly technology any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental

3、 and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agre

4、ements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use

5、and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promot

6、e international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicat

7、ed in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) A

8、ll users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage

9、or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publica

10、tion. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such

11、 patent rights. The main task of IEC technical committees is to prepare International Standards. However, a technical committee may propose the publication of a technical report when it has collected data of a different kind from that which is normally published as an International Standard, for exa

12、mple “state of the art“. IEC TR 60068-3-12, which is a technical report, has been prepared by IEC technical committee 91: Electronics assembly technology. This second edition cancels and replaces the first edition published in 2007 and constitutes a technical revision. PD IEC/TR 60068-3-12:2014 4 IE

13、C TR 60068-3-12:2014 IEC 2014 This edition includes the following significant technical changes with respect to the previous edition: the content has been adapted to the state-of-the-art of reflow-oven technology and termination finishes; minor language adjustments were performed. The text of this t

14、echnical report is based on the following documents: Enquiry draft Report on voting 91/1158/DTR 91/1177/RVC Full information on the voting for the approval of this technical report can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with

15、 the ISO/IEC Directives, Part 2. A list of all the parts in the IEC 60068 series, under the general title Environmental testing, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC websit

16、e under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. PD IEC/TR 60068-3-12:2014IEC TR 60068-3-12:2014 IEC 2014 5 ENVIRONMENTAL TESTING Part 3-12: Supporting documentati

17、on and guidance Method to evaluate a possible lead-free solder reflow temperature profile 1 Scope This part of IEC 60068, which is a technical report, presents two approaches for establishing a possible temperature profile for a lead-free reflow soldering process using SnAgCu solder paste. This proc

18、ess covers a great variety of electronic products, including a large range of package sizes (e.g. molded active electronic components, passive components and electromechanical components). Study A addresses requirements needed in the production of high-reliability electronic control units (ECU), as

19、for example in automotive electronics. These requirements include measurement and production tolerances. Study B represents consumer electronics products and includes reflow oven capability, board design and package sizes. 2 Basics The process temperature for SnPb solder paste has a wide margin due

20、to the liquid temperature of the solder alloy. During reflow soldering, temperature differences between components exist but are not critical. The process temperature of SnAgCu solder paste is about 20 K to 30 K higher than SnPb solder paste. Furthermore, the temperature difference between component

21、s ( T) becomes wider and sometimes the heat resistance temperature of components can become critical. To avoid soldering failures which could be very harmful in safety-related applications and also generate higher failure costs, the capability of the soldering process is very important. A compromise

22、 between the temperature requirements of highly reliable solder joints and the limited solder-heat resistance of the electronic components has to be sought. In addition, the different aspects of mass production have to be considered. To achieve a reliable solder joint, the conventional reflow solder

23、ing process with eutectic SnPb solder paste is usually performed at a minimum peak temperature of about 203 C at the coldest solder joint (i.e. at least 20 K above the liquid temperature of SnPb T liquid= 183 C). The selected lead-free solder is SnAgCu with a melting point at around T liquid = 217 C

24、 1 1 . It is a generally preferred material for lead-free reflow and wave soldering in mass production 2. Using SnAgCu solder paste, it is not possible to solder the coldest solder joints at least 20 K above the liquid temperature (T liquid= 217 C), which would result in minimum temperatures of 237

25、C. When the coldest solder joint is 237 C, the temperature spread between small and large components, small semiconductor, and passive components, as well as the printed circuit board (PCB), will be too large for the components to survive the heat impact. Despite the aim to achieve a relatively low

26、temperature at the coldest solder joint, the reliability of the solder joint has to be assured. _ 1Numbers in square brackets refer to the Bibliography. PD IEC/TR 60068-3-12:2014 6 IEC TR 60068-3-12:2014 IEC 2014 To reach this target in Study A, the temperature at the coldest solder joint is taken t

27、o be T min= 230 C, for a minimum time of 20 s, which is just 13 K above the melting temperature. Considering the peak shape (see Figure 1) this condition corresponds to 1 s at 233 C. From a physical point of view, the risk of insufficient solder wetting during mass production is significantly higher

28、 if the solder joint temperature is lower than the above mentioned temperature of 230 C. In addition, lead-free termination finishes (like tin layers with a post- bake process or very thin NiPdAu finishes) are known to exhibit a poorer wetting behavior than conventional SnPb pin finishes. Figure 1 C

29、urve shape for a peak temperature of at least 20 s at 230 C and 1 s at 233 C The experiments had been performed under mass production conditions (850 mm/min) using state-of-the-art reflow equipment, i.e ovens featuring multiple heating zones, full convection and N 2atmosphere. 3 Boards under investi

30、gation 3.1 Test board approach For the experiment in Study A, a special test PCB was designed. Polyimide resin with a glass transition temperature of T g= 260 C was used as base material for the PCB. Such a test board can represent the entire automotive ECU spectrum. The largest temperature differen

31、ce ( T) between the coldest solder joint and the hottest point existing on this printed circuit assembly (PCA) spectrum is reflected on this test board ( T can be even larger for even more complex PCAs). The coldest solder joint was represented by a defined thermal mass, to represent large integrate

32、d circuits (ICs), coils or aluminium electrolytic capacitors. Its temperature behavior was correlated with the temperatures of the coldest solder joints on serial boards. 3.2 Production board approach For Study B, PCB and reflow oven were taken from actual series production. T, C t, s Coldest solder

33、 joint 20 s at 230 C IEC PD IEC/TR 60068-3-12:2014IEC TR 60068-3-12:2014 IEC 2014 7 4 Temperature tolerances 4.1 Temperature tolerances in Study A For tolerances during temperature profiling, different systematic failures shall be considered. First of all, there is an error associated with the tempe

34、rature measurement itself. The measurement was performed in the centre on top of the packages with a well defined and repeatable preparation technique. Nevertheless, the failure due to preparation had to be fixed within 1,0 K. In addition, the thermocouple (NiCrNi), together with the evaluation unit

35、 has an accuracy of 1,5 K for pre-selected thermocouples. According to IEC 60584-2 6 the NiCrNi thermocouples, class K, tolerance class 1 are specified with a tolerance of 1,5 K for just the thermocouple itself without the measurement unit. Based on suppliers indication and own measurements, the fur

36、nace tolerance based on furnace load is 0,5 K and the furnace tolerance for long term stability is 2,5 K. Thermocouple with measurement unit: 1,5 K Preparation of thermocouple: 1,0 K Furnace load variation: 0,5 K Long term stability of furnace: 2,5 K Because these variations are independent, the Gau

37、ssian error propagation can be applied, which results in a total tolerance of 3,0 K, due to measurement errors and variations in mass production. The tolerance of 3,0 K results in the requirement to profile the coldest solder joint at 236 C, instead of 233 C (i.e. 233 C + 3,0 K). This tolerance is k

38、nown as the “lower tolerance”. In addition to the measurement errors and variations due to mass production, the influences of the test board have to be considered. The measured temperatures of the electronic components depend also on the position on the test board because of the longitudinal and tra

39、nsversal temperature spread in the furnace and along the test board (see Figure 2). These temperature differences are the result of the heat flow conditions in the furnace and around the test board. The actual temperature of a device can be up to 3,5 K higher than the measured values at the position

40、 where the device is mounted on the test board. The temperature dependence on the device position was measured independently before measuring the device temperatures on the assembled test board. Figure 2 Position of the assembled devices and temperature dependence on the device position The thermal

41、mass on the test board, which represents the coldest solder joint on the serial boards, was designed to include the relevant position-dependent tolerances. The upper temperature tolerances consist of the position-dependent temperature tolerances of 2 K to 3,5 K and the above mentioned +3 K. This leads to a total upper tolerance of 5 K to 6,5 K. IEC Temperature Transversal temperature profile Direction of transportation Device position on test board Longitudinal temperature profile PD IEC/TR 60068-3-12:2014