IEEE C57 12 91-2011 en Test Code for Dry-Type Distribution and Power Transformers《干式配电和电力变压器试验规程》.pdf

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1、IEEE Standard Test Code forDry-Type Distribution and Power TransformersSponsored by the Transformers CommitteeIEEE 3 Park Avenue New York, NY 10016-5997 USA 13 February 2012 IEEE Power rather they are contained in appropriate standards such as IEEE Std C57.12.01 or in user specifications. Keywords:

2、dry-type transformer, IEEE C57.12.91, power transformer The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2012 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 13 February 2012. Printed in th

3、e United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2012 IEEE. All rights reserved. Introduct

4、ion This introduction is not part of IEEE Std C57.12.91-2011, IEEE Standard Test Code for Dry-Type Distribution and Power Transformers. This standard is a voluntary consensus standard. Its use may become mandatory only when required by a duly constituted legal authority or when specified in a contra

5、ctual agreement. To meet specialized needs and to allow for innovation, specific changes are permissible when mutually determined by the user and the manufacturer, provided these changes do not violate existing laws and are considered technically adequate for the function intended. This revision of

6、IEEE Std C57.12.91-2001 incorporates changes to Clause 5, Clause 10, and Clause 11. Clause 5 has been restructured and now uses more clauses and subclauses to enable quicker identification of required information, although the content remains substantially the same. An additional subclause, 5.6, des

7、cribes connections to be used for resistance measurements and methods of reporting the measurements to aid consistency in the test reports provided by manufacturers. The note in 5.4 defining the value for Tkhas been clarified. A similar note, which appears in Clause 11, has also been revised to read

8、 the same as the note in 5.4 for consistency. The wording of this note was different in Clause 5 and Clause 11 in the previous revision of this standard. Clause 10 and Clause 11 have been changed to incorporate minor revisions and corrections to the text as a result of comments received after the pr

9、evious revision of the standard. Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers

10、of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This docume

11、nt is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document

12、available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be am

13、ended from time to time through the issuance of amendments, v Copyright 2012 IEEE. All rights reserved. corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order t

14、o determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA website or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE

15、 standards development process, visit the IEEE-SA website. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interp

16、retations can be accessed at the following URL: http:/standards.ieee.org/findstds/interps/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken

17、 by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA website http:/standards.ieee.org/about/sasb/

18、patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiri

19、ng to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, o

20、r determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or nondiscriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, a

21、nd the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2012 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, th

22、e Dry-Type Transformers Test Code Working Group had the following membership: Derek Foster, Chair David Barnard, Vice Chair Robert Casey Ballard Ray Bartnikas Carl Bush Yunxiang Chen Larry Davis Marcel Fortin Mark Gromlovits Michael Haas Timothy Holdway Mike Iman Charles Johnson Sheldon Kennedy Timo

23、thy Lewis Richard Marek Walter Morehart Jerry Murphy Martin Navarro Dhiru Patel Jeewan Puri Subhas Sarkar David Stankes Dave Wiegand The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William J. Acker

24、man Satish K. Aggarwal Samuel Aguirre I. Antweiler Carlo Arpino Peter Balma Paul Barnhart Steven Bezner Wallace Binder Thomas Bishop Thomas Blackburn William Bloethe Chris Brooks Derek Brown Carl Bush Antonio Cardoso Arvind K. Chaudhary Jerry Corkran Willaim Darovny Gary Donner Randall Dotson Gary E

25、ngmann Joseph Foldi Bruce Forsyth Marcel Fortin Derek Foster David Gilmer Edwin Goodwin James Graham William Griesacker Randall Groves Bal Gupta Ajit Gwal Roger Hayes Gary Heuston Timothy Holdway Philip Hopkinson Charles Johnson Stephen Jordan Chad Kennedy Gael Kennedy Yuri Khersonsky Joseph L. Koep

26、finger Jim Kulchisky Saumen Kundu John Lackey Chung-Yiu Lam Stephen Lambert Aleksandr Levin Greg Luri Richard Marek J. Dennis Marlow John W. Matthews William McBride Gary Michel Daniel Mulkey Jerry Murphy K. R. M. Nair Michael S. Newman Raymond Nicholas Lorraine Padden Bansi Patel Brian Penny Howard

27、 Penrose Charles Perry Christopher Petrola Alvaro Portillo Lewis Powell Paulette Payne Powell Iulian Profir Johannes Rickmann Michael Roberts Charles Rogers Marnie Roussell Thomas Rozek Dinesh Sankarakurup Bartien Sayogo Gil Shultz Hyeong Sim James Smith Jerry Smith David Stankes Gary Stoedter David

28、 Tepen S. Thamilarasan Joe Uchiyama John Vergis David Wallach John Wang Roger Wicks James Wilson Jian Yu vii Copyright 2012 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 7 December 2011, it had the following membership: Richard H. Hulett, Chair John Kulick, Vi

29、ce Chair Robert M. Grow, Past President Judith Gorman, Secretary Masayuki Ariyoshi William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosd

30、ahl Sam Sciacca Mike Seavey Curtis Siller Phil Winston Howard Wolfman Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Lisa Perry IE

31、EE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development viii Copyright 2012 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. General . 2 4.1 Test definitio

32、ns 2 4.2 Test requirements 2 4.3 Test sequence . 2 4.4 Instrumentation 3 5. Resistance measurements . 3 5.1 General 3 5.2 Measurements 3 5.3 Determination of cold temperature 4 5.4 Conversion of resistance measurements 5 5.5 Resistance measurement methods . 5 5.6 Resistance measurement connections a

33、nd reporting 6 6. Polarity and phase-relation tests . 7 6.1 Subtractive and additive polarity . 7 6.2 Polarity testssingle-phase transformers 9 6.3 Polarity and phase-relation testspolyphase transformers 11 7. Ratio tests 14 7.1 General .14 7.2 Tolerances for ratio .15 7.3 Ratio test methods 15 8. N

34、o-load losses and excitation current 17 8.1 General .17 8.2 No-load loss test .18 8.3 Waveform correction of no-load losses 20 8.4 Determination of excitation (no-load) current 20 9. Load losses and impedance voltage .21 9.1 General .21 9.2 Factors affecting the values of load losses and impedance v

35、oltage 21 9.3 Tests for measuring load losses and impedance voltage .22 9.4 Calculation of load losses and impedance voltage from test data .29 9.5 Zero-phase-sequence impedance 31 10. Dielectric tests .33 10.1 Factory dielectric tests 33 10.2 Dielectric tests in the field 35 10.3 Applied-voltage te

36、sts 35 10.4 Induced-voltage tests 36 10.5 Impulse tests .37 ix Copyright 2012 IEEE. All rights reserved. 10.6 Impulse tests on transformer neutrals .40 10.7 Detection of failure during impulse test40 10.8 Insulation-power-factor tests 41 10.9 Insulation-resistance tests .42 11. Temperature test 44 1

37、1.1 General .44 11.2 Ambient temperature measurements 44 11.3 Surface temperature measurements 45 11.4 Cold-resistance measurements 45 11.5 Hot-resistance measurement .45 11.6 Calculation of average winding temperature rise .46 11.7 Correction factors .47 11.8 Temperature rise test loading methods .

38、49 12. Short-circuit tests .55 12.1 Scope 55 12.2 Short-circuit testing techniques 55 12.3 Test requirements .61 12.4 Test procedure 62 12.5 Failure detection techniques .65 12.6 Analysis of test results and visual inspection .67 12.7 Proof of satisfactory performance .70 12.8 Required information f

39、or transformer short-circuit test reports 71 13. Audible sound-level measurements .71 13.1 General .71 13.2 Instrumentation .72 13.3 Test conditions 72 13.4 Microphone positions .73 13.5 Sound level measurements .74 13.6 Optional-frequency analysis measurements .74 14. Mechanical design tests .76 14

40、.1 Components involved in lifting or moving .76 14.2 Tests of sealed dry-type transformers .76 15. Calculated data 77 15.1 Reference temperature 77 15.2 Total losses .77 15.3 Efficiency .77 15.4 Voltage regulation 77 16. Minimum information to be included in certified test data .79 16.1 Order data .

41、79 16.2 Rating data 79 16.3 Test data 79 16.4 Calculated data .80 16.5 Certification statement and approval 80 Annex A (informative) Bibliography 81 1 Copyright 2012 IEEE. All rights reserved. IEEE Standard Test Code for Dry-Type Distribution and Power Transformers IMPORTANT NOTICE: This standard is

42、 not intended to ensure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use

43、subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE

44、 or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard describes methods for performing tests specified in IEEE Std C57.12.01 and other referenced standards applicable to dry-type distribution and power transformers.1It is intended for use as a basis for per

45、formance, safety, and the proper testing of dry-type distribution and power transformers. This standard applies to all dry-type transformers except instrument transformers, step-voltage and induction voltage regulators, arc furnace transformers, rectifier transformers, specialty transformers, and mi

46、ne transformers. 1.2 Purpose The purpose of this standard is to provide information regarding the procedures for the testing of dry-type transformers. Transformer requirements and specific test criteria are not a part of this standard but are contained in appropriate standards such as IEEE Std C57.1

47、2.01 or in user specifications. 1Information on references can be found in Clause 2. IEEE Std C57.12.91-2011 IEEE Standard Test Code for Dry-Type Distribution and Power Transformers 2 Copyright 2012 IEEE. All rights reserved. 2. Normative references The following referenced documents are indispensab

48、le for the application of this document (i.e., they should be understood and used; therefore, each referenced document is cited in text, and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the refere

49、nced document (including any amendments or corrigenda) applies. IEEE Std 4, IEEE Standard Techniques for High-Voltage Testing. IEEE Std C57.12.01, IEEE Standard General Requirements for Dry-Type Distribution and Power Transformers, Including Those with Solid-Cast and/or Resin Encapsulated Windings.2,3IEEE Std C57.12.01-2005, IEEE Standard General Requirements for Dry-Type Distribution and Power Transformers, Including Those with Solid-Cast and/or Resin Encapsulated Windings (Clause 7, Clause 9, 4.1.6, 5.10, 5.10.2, 5.10.3.2, 7.3.6.1, Table 5, and Table 15). I