ANSI IEEE C62 31-2006 Test Methods for Low- Voltage Gas-Tube Surge-Protective Device Components《低压充气管式电涌保护装置的标准试验规范》.pdf
《ANSI IEEE C62 31-2006 Test Methods for Low- Voltage Gas-Tube Surge-Protective Device Components《低压充气管式电涌保护装置的标准试验规范》.pdf》由会员分享,可在线阅读,更多相关《ANSI IEEE C62 31-2006 Test Methods for Low- Voltage Gas-Tube Surge-Protective Device Components《低压充气管式电涌保护装置的标准试验规范》.pdf(28页珍藏版)》请在麦多课文档分享上搜索。
1、IEEE Std C62.31-2006(Revision of IEEE Std C62.31-1987)IEEE Standard Test Methods forL o w - Voltage Gas-Tube Surge-ProtectiveDevice ComponentsI E E E3 Park Avenue New York, NY10016-5997, USA8 December 2006IEEE Power Engineering SocietySponsored by theSurge Protective Devices CommitteeIEEE Std C62.31
2、-2006(R2011)(Revision ofIEEE Std C62.31-1987)IEEE Standard Test Methods for Low-Voltage Gas-Tube Surge-Protective Device ComponentsSponsor Surge Protective Devices Committeeof theIEEE Power Engineering SocietyApproved 15 September 2006Reaffirmed 31 March 2011IEEE SA-Standards BoardApproved 8 January
3、 2007Reaffirmed 24 July 2012American National Standards InstituteThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2006 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 8 December 2006. Printed
4、in the United States of America.IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions ofany individual standard for educational classroom use can also be obtained through the Copyright ClearanceCenter.iv Copyright 2006 IEEE. All rights reserved.Introduct
5、ionThis standard applies to gas discharge-tubes for over-voltage protection applications on systems withoperating voltages equal to or less than 1000 V rms or 1200 V dc. These protective devices are designed forlimiting the voltages on balanced or unbalanced communication and on power circuits. This
6、 standardcontains a series of standard test-methods for determining the electrical characteristics of these gasdischarge-tube devices components. Gas discharge tubes are used to provide over-voltage protection in electrical circuits. When the devicesbreakdown voltage is exceeded, its normal high imp
7、edance state changes to a low impedance state to allowconduction of the surge discharge current. After the device conducts the surge discharge current, it interruptsthe flow of system follow current and returns to its high impedance state. In the event of continuing currentnot representing normal sy
8、stem conditions, the device continues to provide a low impedance path until anexternal bypass mechanism activates, the source of undesirable current is de-energized, or a coordinatedprotective current element operates. This standards test criteria and definitions provide a commonengineering language
9、 beneficial to user and manufacturer of gas-tube surge-protective devices components.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for
10、errata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By pu
11、blication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting i
12、nquiries into the legal validity or scope of those patents that are brought to its attention.This introduction is not part of IEEE Std C62.31-2006, IEEE Standard Test Methods for Low-Voltage Gas-TubeSurge-Protective Device Components.Copyright 2006 IEEE. All rights reserved vParticipantsThe followin
13、g is a list of participants in the Low-Voltage Gap Type Protective Devices Working Group: Hans-Wolfgang Oertel, ChairMichael J. Maytum, Vice ChairNisar Chaudhry, SecretaryThe following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disappr
14、oval, or abstention. Bill CurryLeonard DrewesBenny H. LeeMark LynnesBill TravisDonald B. TurnerS. K. Aggarwal Paul D. BarnhartRoger L. BoyellSteven R. Brockschink William A. ByrdJames S. CaseC. ChrysanthouBryan R. ColeTommy P. CooperStephen DareCarlo Donati Mark M. DrabkinGary R. EngmannWilliam R. G
15、oldbach Randall C. GrovesJohn E. HarderGary A. HeustonJoseph L. KoepfingerJim KulchiskySaumen K. KunduBenny H. LeeSolomon LeeWilliam LumpkinsG. L. LuriAlbert R. MartinMichael J. MaytumGary L. Michel Arthur S. Neubauer Michael S. Newman Hans-Wolfgang OertelBansi R. PatelPercy E. PoolMichael A. Robert
16、sThomas J. RozekDonald B. TurnerJoe D. WatsonJames W. WilsonLarry S. YoungDonald W. Zipsevi Copyright 2006 IEEE. All rights reserved.When the IEEE-SA Standards Board approved this standard on 15 September 2006, it had the followingmembership:Steve M. Mills, ChairRichard H. Hulett, Vice ChairDon Wrig
17、ht, Past ChairJudith Gorman, Secretary*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan H. Cookson, NIST RepresentativeMichelle D. TurnerIEEE Standards Program Manager, Document De
18、velopmentMatthew J. CegliaIEEE Standards Program Manager, Technical Program DevelopmentMark D. BowmanDennis B. BrophyWilliam R. GoldbachArnold M. GreenspanRobert M. GrowJoanna N. GueninJulian Forster*Mark S. HalpinKenneth S. HanusWilliam B. HopfJoseph L. Koepfinger*David J. LawDaleep C. MohlaT. W. O
19、lsenGlenn ParsonsRonald C. PetersenTom A. PrevostGreg RattaRobby RobsonAnne-Marie SahazizianVirginia C. SulzbergerMalcolm V. ThadenRichard L. TownsendWalter WeigelHowad L. WolfmanCopyright 2006 IEEE. All rights reserved. viiContents1. Scope 12. Definitions . 13. Service conditions 43.1 Normal servic
20、e conditions . 43.2 Unusual service conditions 44. Standard design test criteria. 54.1 General. 54.2 Ambient conditions 54.3 DC breakdown voltage test 54.4 Capacitance test . 64.5 Insulation resistance test 64.6 Impulse breakdown voltage test 74.7 Maximum single impulse discharge current test . 94.8
21、 Impulse life test 94.9 AC discharge current test. 104.10 Alternating follow-current test. 104.11 DC holdover test for two-electrode devices 114.12 DC holdover test for three-electrode devices 124.13 Transition time test 144.14 Impulse transverse voltage test 154.15 AC transverse voltage test . 174.
22、16 Voltage-current characteristic test . 174.17 Backup air gap devices 184.18 Failure mode 184.19 Fail-safe operation . 19Annex A (informative) Bibliography 20Copyright 2006 IEEE. All rights reserved. 1IEEE Standard Test Methods for Low-Voltage Gas-Tube Surge-Protective Device Components1. ScopeThis
23、 standard applies to gas-tube surge-protective device components for application on systems withvoltages less than or equal to 1000 V rms or 1200 V dc. These protective devices are designed to limitvoltage surges on balanced or unbalanced communication circuits and on power circuits operating fromdi
24、rect current (dc) to 420 Hz. This standard contains a series of standard test criteria for determining theelectrical characteristics of gas-tube surge-protective devices.The tests in this standard are intended as design tests as defined in The Authoritative Dictionary of IEEEStandard Terms B11and pr
- 1.请仔细阅读文档,确保文档完整性,对于不预览、不比对内容而直接下载带来的问题本站不予受理。
- 2.下载的文档,不会出现我们的网址水印。
- 3、该文档所得收入(下载+内容+预览)归上传者、原创作者;如果您是本文档原作者,请点此认领!既往收益都归您。
下载文档到电脑,查找使用更方便
10000 积分 0人已下载
下载 | 加入VIP,交流精品资源 |
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- ANSIIEEEC62312006TESTMETHODSFORLOWVOLTAGEGASTUBESURGEPROTECTIVEDEVICECOMPONENTS 低压 充气 管式电涌 保护装置 标准 试验

链接地址:http://www.mydoc123.com/p-1242480.html