IEC 62490-2-2010 ESL measuring method - Part 2 Surface mount capacitors for use in electronic equipment《ESL测量方法.第2部分 电子设备用表面安装电容器》.pdf

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1、 IEC 62490-2 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 2: Surface mount capacitors for use in electronic equipment Mthode de mesure de lESL Partie 2: Condensateurs pour montage en surface utiliss dans les quipements lectroniques IEC 62490-2:2010 colour

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16、ice clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62490-2 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 2: Surface mount capacitors for use in electronic equipment Mthode de mesure de lESL Partie 2: Condensateu

17、rs pour montage en surface utiliss dans les quipements lectroniques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE N ICS 31.060.01 PRICE CODE CODE PRIX ISBN 978-2-88912-069-7 Registered trademark of the International Electrotechnical Commission Marque dpose de l

18、a Commission Electrotechnique Internationale colour inside 2 62490-2 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 Terms and definitions .6 4 Test fixture and compensation chip 6 4.1 Test fixture6 4.2 The open, short, and load compensation chip9 4.2.1 The open compensation chip

19、.9 4.2.2 The load compensation chip 9 4.2.3 The short compensation chip.9 5 Measuring method10 5.1 Measuring equipment 10 5.2 Measurement conditions10 5.3 Measurement points 10 5.4 Frequency and signal level10 5.5 Measurement procedure11 5.5.1 General .11 5.5.2 Open compensation.11 5.5.3 Load compen

20、sation .11 5.5.4 Short compensation.12 5.5.5 ESL measurement .13 6 Items to be indicated in the test result report 13 Annex A (informative) Theoretical ESL value of the short compensation chip.14 Figure 1 Lead frame and thin coating types of surface mount capacitors and the specification of the dime

21、nsions (L, W, and H)5 Figure 2 Surface mount capacitors with face down terminal .5 Figure 3 Test fixture and terminals of test fixture .6 Figure 4 Connection diagram .7 Figure 5 Sectional view of the test fixture with an inserted surface mount capacitor pressured to the terminals of the test fixture

22、 .8 Figure 6 Example of surface mount capacitor mounted on terminals of test fixture.8 Figure 7 Front view of mounting position of objects on test fixture9 Figure 8 Measurement points.10 Figure 9 Open compensation-chip position.11 Figure 10 Load compensation-chip position .12 Figure 11 Short compens

23、ation-chip position.12 Figure A.1 Points of contact of the short compensation chip and terminals of test fixture .15 Table A.1 The calculation results of inductance of the short compensation chip.14 62490-2 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ESL MEASURING METHOD Part 2: Surface m

24、ount capacitors for use in electronic equipment FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on

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33、egal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this p

34、ublication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62490-2 has been prepared by IEC technical committee

35、 40: Capacitors and resistors for electronic equipment. The text of this standard is based on the following documents: FDIS Report on voting 40/2045/FDIS 40/2057/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Th

36、is publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 62490-2 IEC:2010 A list of all the parts in the IEC 62490 series, under the general title ESL measuring method, can be found on the IEC web site. The committee has decided that the contents of this publication will

37、remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cove

38、r page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 62490-2 IEC:2010 5 ESL MEASURING METHOD Part 2: Surface mount capacitors for use in electr

39、onic equipment 1 Scope This part of IEC 62490 provides the ESL measuring method for the surface mount capacitors for use in electronic equipment. W H L W L H IEC 1732/10 IEC 1731/10 Figure 1a Lead frame electrode terminal Figure 1b Thin coating electrode terminal Figure 1 Lead frame and thin coating

40、 types of surface mount capacitors and the specification of the dimensions (L, W, and H) The ESL measurement method can be applicable to the surface mount capacitors with the following properties, but not limited to these: a) capacitance range: 10 F to 1 000 F; b) size: L W = 3,2 mm 1,6 mm to 7,3 mm

41、 4,3 mm, H = 4,0 mm; c) ESL range: 5 nH or less. NOTE The surface mount capacitors in this document are limited to capacitors with lead frame or with thin coated terminals, see Figure 1. The scope of this document does not include capacitors with face down terminals, see Figure 2. 1 IEC 1733/10 Key

42、1 terminals (shaded section) Figure 2 Surface mount capacitors with face down terminal 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of

43、 the referenced document (including any amendments) applies. IEC 60384-1:2008, Fixed capacitors for use in electronic equipment Part 1: Generic specification 6 62490-2 IEC:2010 3 Terms and definitions For the purpose of this document, the terms and definitions given in IEC 60384-1 and the following

44、apply. 3.1 equivalent series inductance L ESL inductive part of the impedance of capacitors NOTE The unit of ESL is Henry (H). 4 Test fixture and compensation chip 4.1 Test fixture (Low ESL measuring equipment) Lc Lp Hp Hc Lc Lp Hc Hp Terminal of test fixture Capacitor to be measured Zoom 0,5 0,1 1,

45、0 0,1 IEC 1734/10 Dimensions in millimetres Figure 3a Top view of test fixture Figure 3b Enlarge view of the terminals of test fixture Figure 3 Test fixture and terminals of test fixture The test fixture shall have the following features. a) The test fixture has a 4-terminal structure. The capacitor

46、s can be mounted on the test fixture as shown in Figure 3. The terminals of the test fixture shall be connected to the low current terminal (Lc), the low voltage terminal (Lp), the high current terminal (Hc), and the high voltage terminal (Hp). 62490-2 IEC:2010 7 Hp Lp Hc Lc Lp Lc Hp Hc 1 2 4 3 7* 5

47、 6 3 IEC 1735/10 Key 1 one of fixture terminals (shaded section) 2 capacitor (dashed line) 3 capacitor terminal (dotted section) 4 fixture (within dashed-dotted line) * Connect sheaths of 4 coaxial cables to each other within very short distance of fixture terminals 5 coaxial cables (dotted section)

48、 6 ESL measuring equipment (thick line) 7 connect shielding wire (dotted line) Figure 4 Connection diagram b) Anchoring the capacitor with pressure terminals which make stable contact provides high repeatability and reproducibility (see Figure 5). 8 62490-2 IEC:2010 * * * 2 5 1 Pressure Pressure 3 4

49、 5 3 4 IEC 1736/10 Key 1 lid of test fixture for fixing capacitor (thick line) 2 capacitor (dashed line) 3 capacitor terminal (dotted section) * 0,5 mm 0,1 mm * See Figure 3. 4 terminals of test fixture (shaded section) 5 guides for capacitor (shaded section) Figure 5 Sectional view of the test fixture with an inserted surface mount capacitor pressur