SANS 4892-2-2008 Plastics - Methods of exposure to laboratory light sources Part 2 Xenon-arc lamps《塑料 暴露于实验室光源的方法 第2部分 氙弧灯》.pdf

《SANS 4892-2-2008 Plastics - Methods of exposure to laboratory light sources Part 2 Xenon-arc lamps《塑料 暴露于实验室光源的方法 第2部分 氙弧灯》.pdf》由会员分享，可在线阅读，更多相关《SANS 4892-2-2008 Plastics - Methods of exposure to laboratory light sources Part 2 Xenon-arc lamps《塑料 暴露于实验室光源的方法 第2部分 氙弧灯》.pdf（17页珍藏版）》请在麦多课文档分享上搜索。

1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-20900-1 SANS 4892-2:2008 Edition 1 ISO 4892-2:2006 Edition 2SOUTH AFRICAN NATIONAL STANDARD Plastics Methods of exposure to laboratory lig

4、ht sources Part 2: Xenon-arc lamps This national standard is the identical implementation of ISO 4892-2:2006 and is adopted with the permission of the International Organization for Standardization. Published by Standards South Africa 1 dr lategan road groenkloof private bag x191 pretoria 0001 tel:

5、012 428 7911 fax: 012 344 1568 international code + 27 12 www.stansa.co.za Standards South Africa This standard may only be used and printed by approved subscription and freemailing clients of the SABS.SANS 4892-2:2008 Edition 1 ISO 4892-2:2006 Edition 2 Table of changes Change No. Date Scope Nation

6、al foreword This South African standard was approved by National Committee StanSA TC 5120.70, Retro- reflection, in accordance with procedures of Standards South Africa, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in January 2008. This standard may only be u

7、sed and printed by approved subscription and freemailing clients of the SABS. Reference number ISO 4892-2:2006(E) ISO 2006INTERNATIONAL STANDARD ISO 4892-2 Second edition 2006-02-01 Plastics Methods of exposure to laboratory light sources Part 2: Xenon-arc lamps Plastiques Mthodes dexposition des so

8、urces lumineuses de laboratoire Partie 2: Lampes arc au xnon SANS 4892-2:2008This standard may only be used and printed by approved subscription and freemailing clients of the SABS.ISO 4892-2:2006(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing pol

9、icy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downloading this file, parties accept therein the responsibility of not infringing Adobes licensing policy. The ISO Central

10、 Secretariat accepts no liability in this area. Adobe is a trademark of Adobe Systems Incorporated. Details of the software products used to create this PDF file can be found in the General Info relative to the file; the PDF-creation parameters were optimized for printing. Every care has been taken

11、to ensure that the file is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. ISO 2006 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or

12、 utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11

13、 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2006 All rights reservedSANS 4892-2:2008This standard may only be used and printed by approved subscription and freemailing clients of the SABS.ISO 4892-2:2006(E) ISO 2006 All rights reserved iii Contents

14、Page Foreword iv 1 Scope . 1 2 Normative references . 1 3 Principle. 1 4 Apparatus 2 5 Test specimens . 6 6 Exposure conditions 6 7 Procedure 8 8 Exposure report 8 Annex A (informative) Filtered xenon-arc radiation Spectral power distribution . 9 Bibliography . 10 SANS 4892-2:2008This standard may o

15、nly be used and printed by approved subscription and freemailing clients of the SABS.ISO 4892-2:2006(E) iv ISO 2006 All rights reservedForeword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing I

16、nternational Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison

17、 with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of tech

18、nical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is draw

19、n to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 4892-2 was prepared by Technical Committee ISO/TC 61, Plastics, Subcommittee SC 6, Ageing, chemical and environmen

20、tal resistance. This second edition cancels and replaces the first edition (ISO 4892-2:1994), which has been technically revised. ISO 4892 consists of the following parts, under the general title Plastics Methods of exposure to laboratory light sources: Part 1: General guidance Part 2: Xenon-arc lam

21、ps Part 3: Fluorescent UV lamps Part 4: Open-flame carbon-arc lamps SANS 4892-2:2008This standard may only be used and printed by approved subscription and freemailing clients of the SABS.INTERNATIONAL STANDARD ISO 4892-2:2006(E) ISO 2006 All rights reserved 1 Plastics Methods of exposure to laborat

22、ory light sources Part 2: Xenon-arc lamps 1 Scope This part of ISO 4892 specifies methods for exposing specimens to xenon-arc light in the presence of moisture to reproduce the weathering effects that occur when materials are exposed in actual end-use environments to daylight or to daylight filtered

23、 through window glass. The specimens are exposed to filtered xenon-arc light under controlled conditions (temperature, humidity and/or wetting). Various types of xenon-arc light source and various filter combinations may be used to meet different requirements. Specimen preparation and evaluation of

24、the results are covered in other International Standards for specific materials. General guidance is given in ISO 4892-1. NOTE Xenon-arc exposures of paints and varnishes are described in ISO 11341. 2 Normative references The following referenced documents are indispensable for the application of th

25、is document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 4582, Plastics Determination of changes in colour and variations in properties after exposure to daylight under glass, natu

26、ral weathering or laboratory light sources ISO 4892-1, Plastics Methods of exposure to laboratory light sources Part 1: General guidance 3 Principle 3.1 A xenon arc, fitted with suitable filters and properly maintained, is used to simulate the spectral power distribution of daylight in the ultraviol

27、et (UV) and visible regions of the spectrum. 3.2 Specimens are exposed to various levels of light, heat, relative humidity and water (see 3.4) under controlled environmental conditions. 3.3 The exposure conditions may be varied by selection of a) the light filter(s); b) the irradiance level; SANS 48

28、92-2:2008This standard may only be used and printed by approved subscription and freemailing clients of the SABS.ISO 4892-2:2006(E) 2 ISO 2006 All rights reservedc) the temperature during exposure to light; d) the relative humidity in the chamber during light and dark exposures, when exposure condit

29、ions requiring control of humidity are used; e) the way the test specimens are wetted (see 3.4); f) the water temperature and wetting cycle; g) the relative lengths of the light and dark periods. 3.4 Wetting is usually produced by spraying the test specimens with demineralized/deionized water, by im

30、mersion in water or by condensation of water vapour onto the surfaces of the specimens. 3.5 The procedure may include measurements of the irradiance and radiant exposure in the plane of the specimens. 3.6 It is recommended that a similar material of known performance (a control) be exposed simultane

31、ously with the test specimens to provide a standard for comparative purposes. 3.7 Intercomparison of results obtained from specimens exposed in different apparatus should not be made unless an appropriate statistical relationship has been established between the apparatuses for the particular materi

32、al exposed. 4 Apparatus 4.1 Laboratory light source 4.1.1 General The light source shall comprise one or more quartz-jacketed xenon-arc lamps which emit radiation from below 270 nm in the ultraviolet through the visible spectrum and into the infrared. In order to simulate daylight, filters shall be

33、used to remove short-wavelength UV radiation (method A, see Table 1). Filters to minimize irradiance at wavelengths shorter than 310 nm shall be used to simulate daylight through window glass (method B, see Table 2). In addition, filters to remove infrared radiation may be used to prevent unrealisti

34、c heating of the test specimens, which can cause thermal degradation not experienced during outdoor exposures. NOTE Solar spectral irradiance for a number of different atmospheric conditions is described in CIE Publication No. 85. The benchmark daylight used in this part of ISO 4892 is that defined

35、in Table 4 in CIE No. 85:1989. 4.1.2 Spectral irradiance of xenon-arc lamps with daylight filters Filters are used to filter xenon-arc emissions in order to simulate daylight (CIE Publication No. 85:1989, Table 4). The minimum and maximum levels of the relative spectral irradiance in the UV waveleng

36、th range are given in Table 1 (see also Annex A). SANS 4892-2:2008This standard may only be used and printed by approved subscription and freemailing clients of the SABS.ISO 4892-2:2006(E) ISO 2006 All rights reserved 3 Table 1 Relative spectral irradiance of xenon-arc lamps with daylight filters a,

37、 b(method A) Spectral passband ( = wavelength in nm) Minimum c% CIE No. 85:1989, Table 4 d, e% Maximum c% 290 0,15 290 u u 320 2,6 5,4 7,9 320 u 360 28,2 38,2 39,8 360 u 400 54,2 56,4 67,5 aThis table gives the irradiance in the given passband, expressed as a percentage of the total irradiance betwe

38、en 290 nm and 400 nm. To determine whether a specific filter or set of filters for a xenon-arc lamp meets the requirements of this table, the spectral irradiance must be measured from 250 nm to 400 nm. The total irradiance in each wavelength passband is then summed and divided by the total irradianc

39、e from 290 nm to 400 nm. bThe minimum and maximum limits in this table are based on more than 100 spectral irradiance measurements with water- and air-cooled xenon-arc lamps with daylight filters from different production lots and of various ages 3 , used in accordance with the recommendations of th

40、e manufacturer. As more spectral irradiance data become available, minor changes in the limits are possible. The minimum and maximum limits are at least three sigma from the mean for all the measurements. cThe minimum and maximum columns will not necessarily sum to 100 % because they represent the m

41、inima and maxima for the measurement data used. For any individual spectral irradiance, the percentages calculated for the passbands in this table will sum to 100 %. For any individual xenon-arc lamp with daylight filters, the calculated percentage in each passband shall fall within the minimum and

42、maximum limits given. Exposure results can be expected to differ if obtained using xenon-arc apparatus in which the spectral irradiances differ by as much as that allowed by the tolerances. Contact the manufacturer of the xenon-arc apparatus for specific spectral irradiance data for the xenon-arc la

43、mp and filters used. dThe data from Table 4 in CIE Publication No. 85:1989 is the global solar irradiance on a horizontal surface for an air mass of 1,0, an ozone column of 0,34 cm at STP, 1,42 cm of precipitable water vapour and a spectral optical depth of aerosol extinction of 0,1 at 500 nm. These

44、 data are target values for xenon-arc lamps with daylight filters. eFor the solar spectrum represented by Table 4 in CIE No. 85:1989, the UV irradiance (between 290 nm and 400 nm) is 11 % and the visible irradiance (between 400 nm and 800 nm) is 89 %, expressed as a percentage of the total irradianc

45、e between 290 nm and 800 nm. The percentage of the UV irradiance and that of the visible irradiance incident on specimens exposed in xenon-arc apparatus may vary due to the number of specimens being exposed and their reflectance properties. 4.1.3 Spectral irradiance of xenon-arc lamps with window gl

46、ass filters Filters are used to filter the xenon-arc lamp emissions in order to simulate daylight which has passed through window glass. The minimum and maximum levels of the relative spectral irradiance in the UV region are given in Table 2 (see also Annex A). SANS 4892-2:2008This standard may only

47、 be used and printed by approved subscription and freemailing clients of the SABS.ISO 4892-2:2006(E) 4 ISO 2006 All rights reservedTable 2 Relative spectral irradiance for xenon-arc lamps with window glass filters a, b(method B) Spectral passband Minimum cCIE No. 85:1989, Table 4 plus effect of wind

48、ow glassd, eMaximum c( = wavelength in nm) % % % 300 0,29 300 u u 320 0,1 u 1 2,8 320 u 360 23,8 33,1 35,5 360 u 400 62,4 66,0 76,2 aThis table gives the irradiance in the given passband, expressed as a percentage of the total irradiance between 290 nm and 400 nm. To determine whether a specific fil

49、ter or set of filters for a xenon-arc lamp meets the requirements of this table, the spectral irradiance must be measured from 250 nm to 400 nm. The total irradiance in each passband is then summed and divided by the total irradiance between 290 nm and 400 nm. bThe minimum and maximum limits in this table are based on more than 30 spectral irradiance measurements with water- and air-cooled xenon-arc lamps with window glass filters from different production lots and of various ages 3 ,