REG NASA-LLIS-1488-2004 Lessons Learned Commercial Off The Shelf (COTS) Digital Signal Processor Experienced Destructive Events as a Result of Ionizing Radiation Testing.pdf
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1、Lessons Learned Entry: 1488Lesson Info:a71 Lesson Number: 1488a71 Lesson Date: 2004-08-04a71 Submitting Organization: GRCa71 Submitted by: Thomas J. YoungSubject: Commercial Off The Shelf (COTS) Digital Signal Processor Experienced Destructive Events as a Result of Ionizing Radiation Testing Abstrac
2、t: The Fluids and Combustion Facility (FCF) project at the NASA Glenn Research Center subjected the Digital Signal Processor (DSP) based Data Acquisition board to ionizing radiation testing to simulate the International Space Station US Lab radiation environment. Components on the board were irradia
3、ted by a 200 MeV proton beam and were exposed to a ten year equivalent dose (600 Rads with a 1.5 Safety margin) of ionizing radiation. All exposures resulted in destructive events in the DSP chips on board. The Digital Signal Processor (DSP) based Data Acquisition board is a commercial off-the-shelf
4、 product that was not designed for space applications. There are four identical DSP chips on the board. The DSP chips are commercial microcircuits, also not intended for space applications. The DSP chips are utilized for image acquisition from FCF Serial Data Link (SDL) supported cameras. No other d
5、evices on the Data Acquisition boards were observed to fail, however the boards were not tested beyond about 1-2% of the total intended proton fluence when the specific SHARC DSP chips were exposed directly. Description of Driving Event: Initial testing produced destructive events on each of the two
6、 boards tested. Both boards had non-functional DSP chips, even though they had not been directly exposed to the beam. It is believed that stray protons in the test room caused the DSP chips to fail. Follow-up testing was performed on two additional boards. The first board had a DSP chip failure caus
7、ed by stray protons (1/1,000 to 1/10,000 the rate of full beam exposure and energy on the order of 100 MeV) during beam tuning. The board was replaced by the spare board and one of the DSP Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-chips exposed
8、 to the beam. The chip failed after 0.31% of the total intended fluence of 1 E 10 p+/cm2, with an over-current condition detected on the 3.3V supply line. This equates to a 5.5 day MTBF for one chip or 1.5 day MTBF for the whole board in the US Lab radiation environment The COTS board manufacturer w
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