JEDEC JESD340-1967 Standard for the Measurement of CRE.pdf
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1、JEDEC STANDARD Standard for the Measurement of CRE JESD340 (Previously known as RS-340 and/or EIA-340) NOVEMBER 1967 (Reaffirmed: April 1981, April 1999, March 2009) JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, an
2、d approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeabil
3、ity and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without reg
4、ard to whether or not their adoption may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications. The information included in JEDEC
5、 standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become
6、an ANSI standard. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or call (703)
7、907-7559 or www.jedec.org Published by JEDEC Solid State Technology Association 2009 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individual agrees no
8、t to charge for or resell the resulting material. PRICE: Please refer to the current Catalog of JEDEC Engineering Standards and Publications online at http:/www.jedec.org/Catalog/catalog.cfm Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC
9、 and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or
10、call (703) 907-7559 (Reaffirmed 4/81, 4/99) EIA STANDARD f or The Measurement of (Gel ELECTRONIC INDUSTRIES ASSOCIATION STANDARD RS-340 Formulated by JE 0 EC Semiconductor Device Council NOTICE EIA engineering standards are designed to serve the public interest through eliminating mis- understanding
11、s between manufacturers and purchasers, facilitating interchangeability and improve- ment of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such standards shall not in any respect pre- clude any member or n
12、on-member of EIA from manufacturing or selling products not conforming to such standards, nor shall the existence of such standards preclude their voluntary use by those other than EIA members whether the standard is to be used either domestically or internationally. Recommended standards are adopte
13、d by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the recommended standards. Published by ELECTRONIC
14、INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, N. W., Washington, D. C. 20006 STANDARD FOR THE MEASUREMENT OF IC,j (From Standards Proposal No. 917 formulated under the cognizance of JEDEC Committee JS-8 on Consumer Product Devices.) 1. INTRODUCTION 1.1 This standard offers an easily
15、-measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement tech- nique allows rapid testing. Its close correlation to AC stability will help to establish the interchange- ability of a device. 1
16、.2 The symbol used for this common-emitter short-circuit feedback parameter is (CreI. The magnitude bars are included for three reasons: (a) They reflect the true nature of the parameter in that it is an admittance magnitude rather than a susceptance. (b) They eliminate the need for a minus sign. Th
17、is prevents the confusion prevalent when the maxima of a minus quantity are to be considered. Cc) They reduce the possibility of mistaking the parameter for the imaginary portion of a reverse transfer matrix parameter (C, for the Y-parameter or C, for the Z-para- meter). 1.3 The parameter is express
18、ed as a capacitance rather than an immitance because the latter is frequency dependent. It is desirable to allow easy correlation of the parameter with different measure- ment frequencies. (C,I as defined and measured very closely resembles C, (the short circuit Y-para- meter) which is the reason fo
19、r the subscript Ire”. 1.4 It fits directly into the usual stability equations. A typical example is the equation for stability for a narrow-band amplifier with single-tuned interstages. s= 2 (Gs + %e) oe + GL) 1 + cos (tire + $fe) W IGel lyfe I All of the terms in this equation except for IC,I are e
20、ither swamped by circuit constants or are rela- tively constant. 1.5 IC,I is easily measured on relatively inexpensive equipment. It is a “plug-in-and-read” type of measurement. Because it is not a bridge measurement no adjustments or balancing are required. Rs.340 Page 2 1.6 IC,J is a measurement o
21、n an active, full-biased, transistor. In this it differs from Ccb which is defined for zero emitter bias current. 1.7 It is a three-terminal admittance measurement. Thus it doesnt fall heir to the numerous dif- ficulties and inaccuracies of the two-terminal measurement, Cob. 1.8 The low frequencies
22、used enable the measurements to be more easily reproduced. Correlation is improved. It is granted that the measurement of feedback at the actual operating frequency is the more efficacious method for determining stability performance; but the intent of IC,eI is to provide a suitable means for judgin
23、g transistor interchangeability over the widest possible range of transistor types, applications, and frequencies. 2. DEFINITION 2.1 IC,eJ is a three-terminal admittance measurement. It is defined as the magnitude of the small- signal short-circuit reverse-transfer admittance, lYreI. of a fully-bias
24、ed transistor connected in the com- mon-emitter configuration, divided by the angular velocity, w. w is equal to 2 a f where f is the frequency of measurement. ICr,I is derived from the Y-parameters although it is not itself a Y-parameter by rigorous definition. 2.2 The definition of Y, is formally
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