DLA SMD-5962-91700 REV B-2004 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《操作放大器 高功率直线式混合微型电路》.pdf

《DLA SMD-5962-91700 REV B-2004 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《操作放大器 高功率直线式混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-91700 REV B-2004 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《操作放大器 高功率直线式混合微型电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing requirements to MIL-PRF-38534. 01-02-14 Raymond Monnin B Table I; Made correction to the third condition block for the output voltage test, IO= “2 mA“ should read “2 A“. Change under the unit block for the current limits test (ICL)

2、 to read “A“ instead of “mA“. Remove vendor cage 31757. Editorial changes troughout. -sld 04-04-21 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Steve Duncan D

3、EFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Gary Zahn COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Greg Lude MICROCIRCUIT, HYBRID, LINEAR, HIGH POWER, OPERATIONAL AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DE

4、FENSE DRAWING APPROVAL DATE 91-10-29 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-91700 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E231-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91700 DEFENSE

5、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected

6、 in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 91700 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish

7、designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates

8、 a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 PA09M Power operational amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assuranc

9、e level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class avail

10、able. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H scr

11、eening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H,

12、or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified

13、 quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X

14、See figure 1 8 Flange mount Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91700 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The

15、 lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VS). 40 V dc Output current (IO) 5.0 A Power dissipation (PD) 2/ 78 W Input voltage (differential). 40 V dc Input voltage (common mode) 40 V dc Lead temperature (soldering, 10 seconds). +300C Juncti

16、on temperature (TJ). +150C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Supply voltage (VS). 35 V dc Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, sta

17、ndards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT

18、 OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these doc

19、uments are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the re

20、ferences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation a

21、t the maximum levels may degrade performance and affect reliability. 2/ Derate at 1.8C/W above case temperature (TC) of +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91700 DEFENSE SUPPLY CENTER COLUMB

22、US COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance

23、of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall

24、be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified i

25、n MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the ele

26、ctrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in

27、table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-

28、PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and

29、 for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer i

30、n order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534

31、shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM pl

32、an shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition D. The test circuit shall be maintained by the manufa

33、cturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD

34、-883. (2) TCas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. Constant acce

35、leration may be performed after burn-in upon approval by the qualifying activity. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91700 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL

36、B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TC +125C VS= 35 dc unless otherwise specified Group A subgroups Device type Min Max Unit 1 85 2 140 Supply current IS VIN= 0 V dc, G = 100, VCM= 0 V dc 3 01 165 mA 1 -5.3 +5.3 2 -8.

37、3 +8.3 VIN= 0 V dc, G = 100, VS= 12 V dc 3 -7.7 +7.7 mV 1 -3.0 +3.0 2 -6.0 +6.0 VIN= 0 V dc, G = 100, VS= 35 V dc 3 -5.4 +5.4 mV 1 -3.5 +3.5 2 -6.5 +6.5 Input offset voltage VOSVIN= 0 V dc, G = 100, VS= 40 V dc 3 01 -5.9 +5.9 mV 1,3 100 pA Input bias current, +IN +IBVIN= 0 V dc, RBIAS 100 M 2 01 10.

38、0 nA 1,3 100 pA Input bias current, -IN -IBVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA 1,3 50.0 pA Input offset currentIOSVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA VS= 40 V dc, IO= 66 mA, RL= 500 4,5,6 33 V VS= 23.5 V dc, IO= 1 A, RL= 15 , TC= +125C 5 15 V VS= 38 V dc, IO= 2 A, RL= 15 , TC= +25C, -55C 4,6 30

39、V Output voltage VOVS= 21.3 V dc, IO= 3 A, RL= 3.75 , TC= +25C, -55C 4,6 01 11.3 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91700 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,

40、 OHIO 43216-5000 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C VS= 35 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Current limits ICLRL= 3.75 , VS= 32.2 V dc, TC

41、= +25C 4 01 3.4 6 A Stability/noise ENG = 1, CL= 1.5 nF 4,5,6 01 1.0 mV 4,6 25 500 Slew rate SRRL= 500 , VIN 4 VP-P 5 01 20 500 V/s Open loop gain AOLRL= 500 , f = 15 Hz, VIN 0.4 VP-P 4,5,6 01 80 dB Common mode rejection CMR VS= 34.5 V dc, f = dc, VCM= 22.5 V dc 4,5,6 01 64 dB 1/ During all group A

42、testing, terminal connection BAL (pin 2) is left open. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91700 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 7 DSCC FORM 2234 AP

43、R 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 38.35 39.37 1.510 1.550 B 19.30 19.81 .760 .780 C 7.37 .290 D 0.97 1.07 .038 .042 E 2.03 2.54 .080 .100 F 40 BSC 40 BSC G 12.7 BSC .500 BSC H 30.12 BSC 1.186 BSC J 15.06 BSC 0.593 BSC K 11.68 12.70 .460 .500 Q 3.84 4.09 .151 .161 R 25.

44、15 25.65.990 1.010 NOTES: 1. The U. S. preferred system of measurement is the metric SI. This case outline was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound shall take precedence. 2. Pin numbers are for ref

45、erence and may not be marked on package. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91700 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 8 DSCC

46、 FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 Output Balance (BAL) +VS +IN -IN -VS RL CLFIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI

47、ZE A 5962-91700 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters Final electri

48、cal parameters 1*, 2, 3, 4, 5, 6 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1, 4 End-point electrical parameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified