DLA SMD-5962-87713 REV A-1991 MICROCIRCUITS DIGITAL HMOS MULTI-PROTOCOL SERIAL CONTROLLER MONOLITHIC SILICON《硅单块 系列控制器多协议高性能金属氧化物半导体 数字微型电路》.pdf
《DLA SMD-5962-87713 REV A-1991 MICROCIRCUITS DIGITAL HMOS MULTI-PROTOCOL SERIAL CONTROLLER MONOLITHIC SILICON《硅单块 系列控制器多协议高性能金属氧化物半导体 数字微型电路》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-87713 REV A-1991 MICROCIRCUITS DIGITAL HMOS MULTI-PROTOCOL SERIAL CONTROLLER MONOLITHIC SILICON《硅单块 系列控制器多协议高性能金属氧化物半导体 数字微型电路》.pdf(15页珍藏版)》请在麦多课文档分享上搜索。
1、SMD-59b2-87713 REV A 59 999999b 00075l18 5 W, NOTICE OF REVISION (NOR) (See MIL-STD-480 for instructions) This revision described below has been authorized for the document listed. I I DATE (YYMMDD) Form Approved OM6 NO. 0704-0188 91/ 11/ 14 2. CAGE CODE 67268 4, CAGE CODE 67268 Public reporting bur
2、den for this collection is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and canpleting and reviewing the collection of Information. Send comnents regarding this burden estimate or
3、any other aspect of this collection of information, including suggestions for reducing this burden, to Washington Headquarters Services, Directorate for Information Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302, and to the Office of Information rv Affairs
4、. Office of Manaaement and OC 70503. 3. NOR NO. 5, DOCUMENT NO, 5962-87713 1. ORIGINATOR NAME AND ADDRESS Defense Electronics Supply Center Dayton, Ohio 45444-5277 7. REVISION LETTER ICurrent Ini t ia1 6, TITLE OF DOCUMENT MICROCIRCUITS, DIGITAL, HMOS, MULTI-PROTOCOL, SERIAL CONTROLLER, MONOLITHIC S
5、ILICON I A 9, CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIES H REVISION COMPLETED (Signature) DATE (YYMMDD) 10, DESCRIPTION OF REVISION J./ Sheet 1: Revisions ltr column: add “A“ Revisions description column; add “Changes in accordance with NOR 5962-R035-92“. Revisions date column: add “91-11-1
6、4“, Sheet 5: Change Table I, Data setup tompos. edge (tow) FROM: 150 ns Max to 150 ns Min Notes : I/ These changes were previously approved 10 Jan 91 for incorporation into the next action of drawing 5962-87713, Jl. THIS SECTION FOR GOVERNMENT USE ONLY CHECK ONE uISTING DOCUMENT SUPPLEMENTED BY THIS
7、 NOR MAY BE USED IN c 1 REVISED DOCUMENT MUST BE I CUSTODIAN OF MASTER WCUMENT RECEIVED BEFORE MANUFACTURER SHALL MAKE ABOVE REVISION AND MAY -TF THIS IJjANGF. FU- I b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DFC-FCC 12, ACTIVITY ACCOMPLISHING REVISION DESC-ECC D Form 1693 9 Ja 88 I DAT
8、E (YYMMDD) 91/ 11/14 k131f distribution is unlimited. DESC FORM 193 YAY 86 ._ _-_ - Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. 1. SCOPE 1.1 SCO e. This drawing describes device requirements for class B microcircuits in accordance rith 1.%;s I
9、I i Condi ti ons I I 4.5 v 5 vcc 5.5 v I11 1 unless otherwise specified I I Min I Max I l I II I I I I I 1t0.5 I I I IIOL = 2.0 m4 I 1, 2, 3 1 0.45 I V 1 I I1 1 IIoH = -200 pA IV I I I1 I )VIN = VCC(max) to O V 1 *10 I PA II I I I not tested) I I 1vOUT = VCC(max) to 4.5 v i *io 1 VA II I Idata bus I
10、 I1 I Ivcc = 5.5 v Pee 4*3.1c 1 II 1 I“ 40301c I I1 I ISee 4.301c I II 1 I -55C 5 TC 5 t125C I I I f “IL Test 11 1 1, 2, 3 1-0.5 1 0.8 1 V - Input 1 ow vol tage Input high vol tage I I vIH 1 I VOL I 1 I I(pin 10 is guaranteed but I 11 1 1, 2, 3 I 2.2 IVCC I v - output 1 ow vol tage f 1, 2, 3 1 2.4 I
11、 I 1, 2, 3 I j i, 2, 3 1 I 1, 2, 3 I I 240 1 mA I II 1 I4 1 1lOIpF Output high vol tage I VOH Input leakage current 1 IIL Output float leakage 1 IOFL current I I Vcc supply current i Icc I I 1 I Input capacitance 1 CIN Output capacitance i COUT Inputloutput capacitance 1 CI10 Functional tests 14 1 1
12、151pF I I I 4 1 I201pF ISee 4.3.ld I I I 9,10,11 1 I 250 I 4000 I ns I I 1 9,1oY1 i 105 1 2000 I ns 1 1 9,10,11 I 105 I 2000 i ns 1 II I I I 1 9,10,11 I O 1 30 I ns I II I 1 g,io,ii 1 o I 30 ns 21 11 - I Itcy I 1 Clock period CLK low time ItL I - 21 II 21 - I I I I CLK high time i kH CLK rise time I
13、 tr Clock fa1 1 time ! - 2/ 11 g/ - See footnotes at end of table. 5962-87713 STANDARDIZED SIZE A MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 4 DAYTON, OHIO 45444 * U S. GOVERNMENT PRINTING OFFICE. 1987-549496 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduc
14、tion or networking permitted without license from IHS-,-,-TABLE I. Electrical performance characteristics - Continued. STANDARDIZED MILITARY DRAWING Test 5962-87713 SIZE A Ao, A1 setup to Ro neg. edge Ao, A1 data output del ay Ao, A1 hold after R-D neg. edge Tm neg. edge to data output del ay Ro pul
15、se width Output float delay CS, Ao, A1 setup to VIT neg. edge 73, - Ao, Al hold after WR pos. edge WR pulse width Data setup to WR pos. edgt Data hold after pos. ITT setup top neg. F“ hold after pos. 7lT pul se width - edge edge edge fp;T neg. edge to TP TFlTK neg. edge to data del ay output del ay
16、I I I I i Conditions i Group A I unless otKerwisZ specified 1 I I 21 I 9,10,11 I I I ICL = 150 pF 2-1 I 9,10,11 I I I 21 I 9,10,11 I I I ICL = 150 PF 21 I 9,10,11 1 I RD RR I 21 I 9,10,11 I I 9,10,11 DF Symbol I -55C Tc 5 +12!jQC I 4.5 v vcc 5.5 v Isubgroups - AR AD - - I I I - 21 I I I - 21 I 9,10,
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