DLA SMD-5962-87523 REV C-2011 MICROCIRCUIT LINEAR DUAL LINE DRIVER PROGRAMMABLE SLEW RATE MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R092-93. 93-04-12 M. A. Frye B Incorporate rev. A NOR. Drawing updated to reflect current requirements. Editorial changes throughout. drw 00-12-06 Raymond Monnin C Redraw. Update drawing to current requirements

2、. - drw 11-03-02 Charles F. SaffleTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Marcia B. Kelleher DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD M

3、ICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY N. A. Hauck MICROCIRCUIT, LINEAR, DUAL LINE DRIVER, PROGRAMMABLE SLEW RATE, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-07-24 AMSC N/A REVISION LEVE

4、L C SIZE A CAGE CODE 67268 5962-87523 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E248-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHE

5、ET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-875

6、23 01 P A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 9636A Dual line driver, programmable slew rate 1.2.2 Case outline. The case out

7、line are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage range V- to +1

8、5 V dc Negative supply voltage range -15 V dc to +0.5 V dc V+ to V- 0 to +30 V dc Output to ground 15 V dc Output source current -150 mA Output sink current 150 mA Storage temperature range -65C to +175C Internal power dissipation (PD) 1/ . 400 mW Lead temperature (soldering, 60 seconds) 300C Therma

9、l resistance, junction-to-case (JC): Case P . See MIL-STD-1835 Junction temperature (TJ) 175C 1.4 Recommended operating conditions. Positive supply voltage (+VCC) . +10.8 V dc to +13.2 V dc Negative supply voltage (-VCC) -13.2 V dc to -10.8 V dc Ambient operating temperature range (TA) -55C to +125C

10、 _ 1/ Rating applies to ambient temperature up to 125C. Above 125C ambient, derate linearly at 120C/W. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REV

11、ISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are

12、those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Cas

13、e Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Av

14、enue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a spe

15、cific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listi

16、ng (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow

17、 as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-

18、PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2

19、.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Switching time test circuit and waveforms. The switching time test circuit and waveforms shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified

20、herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup ar

21、e described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance cha

22、racteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage high VOH1RL= GND (RL= ) 1, 2, 3 All 5.0 6.0 V Output voltage high VOH2RL= GND (RL= 3.0 k) 1, 2, 3 All 5.0 6.0 V Output voltage high VOH3RL= GND (RL= 450) 1

23、, 2, 3 All 4.0 6.0 V Output voltage low VOL1RL= GND (RL= ) 1, 2, 3 All -6.0 -5.0 V Output voltage low VOL2RL= GND (RL= 3.0 k) 1, 2, 3 All -6.0 -5.0 V Output voltage low VOL3RL= GND (RL= 450) 1, 2, 3 All -6.0 -4.0 V Output resistance RO RL = 450 1, 2, 3 All 50 Positive output short circuit current 2/

24、 IOS+ VO= 0 V, VI= 0 V, RWS= 10 k 1, 2, 3 All -150 -15 mA Negative output short circuit current 2/ IOS- VO= 0 V, VI= 2.0 V 1, 2, 3 All 15 150 mA Output leakage current 2/ ICEXVCC= 0 V, VO= 6.0 V 1, 2, 3 All -100 100 A Input voltage high 3/ VIH1, 2, 3 All 2.0 V Input voltage low 4/ VIL1, 2, 3 All 0.8

25、 V Input clamp diode voltage VICII= 15 mA 1, 2, 3 All -1.5 V Input current low IILVI= 0.4 V 1, 2, 3 All -80 A Input current high IIHVI= 2.4 V 1, 2, 3 All 10 A VI= 5.5 V 100 Positive supply current I+ V+ = 12 V, V- = -12 V, RL= , RWS= 100 k, VI= 0 V 1, 2, 3 All 18 mA Negative supply current I- V+ = 1

26、2 V, V- = -12 V, RL= , RWS= 100 k, VI= 0 V 1, 2, 3 All -18 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVE

27、L C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Rise time trRWS= 10 k TA= 25C 9 All 0.8 1.4 s (see figure 2) RWS= 100 k 8.0 14 RWS= 500 k

28、 40 70 RWS= 1000 k 80 140 Fall time tfRWS= 10 k TA= 25C 9 All 0.8 1.4 s (see figure 2) RWS= 100 k 8.0 14 RWS= 500 k 40 70 RWS= 1000 k 80 140 1/ Unless otherwise specified; 10.8 V V+ 13.2 V, -13.2V V- -10.8 V, and 10 k RWS 500 k. 2/ Only one output shorted at a time. 3/ VIHguaranteed by the VOHtest.

29、4/ VILguaranteed by the VOLtest. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due

30、to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with

31、 a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). T

32、he certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conforman

33、ce as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land an

34、d Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or ne

35、tworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device type All Case outline P Terminal number Terminal symbol 1 WAVESHAPE CONTROL 2 IN A 3 IN B 4 GND 5 V- 6

36、 OUT B 7 OUT A 8 V+ FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 NOTES:

37、1. CLincludes jig and probe capacitance. 2. All diodes are FD700 or equivalent. 3. VIinput conditions: Amplitude = 3.0 V; offset = 0 V; pulse width = 500 s; PRR = 1.0 kHz; tr= tf= 10 ns. FIGURE 2. Switching time test circuit and waveforms. Provided by IHSNot for ResaleNo reproduction or networking p

38、ermitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-385

39、35, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D

40、. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the i

41、ntent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test re

42、quirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 9 Groups C and D end-point electrical p

43、arameters (method 5005) 1 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Te

44、sts shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 10 and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87523 DLA LAND AND

45、MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The tes

46、t circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent spe

47、cified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. M

48、icrocircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coo