DLA SMD-5962-78003 REV K-2005 MICROCIRCUIT LINEAR HIGH VOLTAGE OPERATIONAL AMPLIFIER MONOLITHIC SILICON《硅单片大功率运算扬声器 线性微型电路》.pdf

《DLA SMD-5962-78003 REV K-2005 MICROCIRCUIT LINEAR HIGH VOLTAGE OPERATIONAL AMPLIFIER MONOLITHIC SILICON《硅单片大功率运算扬声器 线性微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-78003 REV K-2005 MICROCIRCUIT LINEAR HIGH VOLTAGE OPERATIONAL AMPLIFIER MONOLITHIC SILICON《硅单片大功率运算扬声器 线性微型电路》.pdf（9页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Pg 2: Added outline letter X. Pg 6: Added package X. Pg 10: Added package X. 78-05-17 N. A. Hauck B Pg 2, 4, 11: Added device 02. 79-04-12 N. A. Hauck C Pg 2, 4, 5, 8, 12: Added device 03. Pg 10: Correct table II. Pg 11: Correct 6.3 80-04-21 N. A

2、. Hauck D Format changes. Table I corrections. Delete device 03 in X package. 80-10-02 N. A. Hauck E Table I and II corrections. Change package designations for all devices. Add device 04. 81-10-09 N. A. Hauck F Table I and II corrections, changed to approved source, and general update to document.

3、83-03-03 N. A. Hauck G Add one vendor, CAGE 34333. Add two packages, C-2 and D-4. Make changes to 1.3, 4.3.1, table I, table II, and figure 1. Change to military drawing format. Delete one vendor, CAGE 04713. 90-02-01 M. A. Frye H Drawing updated to reflect current requirements. - ro 01-06-20 R. Mon

4、nin J Add information to paragraph 3.5. - ro 04-04-02 R. Monnin K Correction to paragraph 3.5. Editorial changes throughout. - drw 05-06-10 R. Monnin CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV K K K K K K K K OF SHEETS SHEET 1

5、 2 3 4 5 6 7 8 PMIC N/A PREPARED BY William E. Shoup DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY A. J. Foley COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, LINEAR, HIGH VOLTAGE OP

6、ERATIONAL AMPLIFIER, MONOLITHIC AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 78-03-27 SILICON AMSC N/A REVISION LEVEL K SIZE A CAGE CODE 14933 78003 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E656-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license

7、 from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78003 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance

8、 with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 78003 01 G C Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device types. The device types identify the circuit function as follow

9、s: Device type Generic number Circuit function 01 LM144 High voltage operational amplifier 02 2640 High voltage operational amplifier 03 LM143 High voltage operational amplifier 04 1536 High voltage operational amplifier 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as

10、 follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line X MACY1-X8 8 Can 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. S

11、upply voltage (VS): Positive supply voltage: Device types 01, 03, and 04 . +40 V dc Device type 02 +50 V dc Negative supply voltage: Device types 01, 03, and 04 . -40 V dc Device type 02 -50 V dc Differential input voltage: Device types 01, 03, and 04 . 80 V dc Device type 02 . 100 V dc Internal pow

12、er dissipation 680 mW 1/ 2/ Input voltage 40 V dc 3/ Output short circuit duration . 5 seconds Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction resistance (TJ) . +175C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 _ 1/ Derate above +75C, ca

13、ses G and X are at 9.3 mW/C, case P at 8.0 mW/C, and case 2 at 11.4 mW/C. 2/ Must withstand the added PDdue to short circuit test, e.g., IOS. 3/ For supply voltage less than 40 V, the absolute maximum input voltage is equal to the supply voltage.Provided by IHSNot for ResaleNo reproduction or networ

14、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78003 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage: Device types 01, 03, and 04 . +40 V dc Device

15、type 02 . +50 V dc Negative supply voltage: Device types 01, 03, and 04 . -40 V dc Device type 02 . -50 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks fo

16、rm a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENS

17、E STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are ava

18、ilable online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited

19、 herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix

20、 A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML produ

21、ct in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or funct

22、ion of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

23、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78003 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appe

24、ndix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance charac

25、teristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Mark

26、ing shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. Special marking for device class Q. The date code may be reduced to 3 digits (i.e. 026 where 0 is the last digit of the year a

27、nd 26 is the seal week) for device class Q. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance wit

28、h MIL-PRF-38535 to identify when the QML flow option is used 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA pri

29、or to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each

30、 lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility

31、 and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in ac

32、cordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufactu

33、rer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA=

34、+125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer.Provided by IHSNot for ResaleNo reproduction or networking permitted without license

35、 from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78003 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Devic

36、e type Limits Unit Min MaxInput offset voltage VIO1 01, 03, 04 5 mV 2, 3 7 1 02 4 2, 3 6 Input offset current IIO1 01, 03, 04 3 nA 2, 3 7 RS= 100 k 1 02 12 2, 3 35 Input bias current IIB1 01, 03, 04 20 nA 2, 3 35 1 02 25 2, 3 50 Supply voltage rejection ratio SVRR 4, 5, 6 All 100 V/V Output voltage

37、swing VO1, 2, 3 01, 03, 04 22 V VS= 36 V, TA= +25C 1 04 30 1, 2, 3 02 35 Large signal voltage gain AVOLVO= 10 V, RL= 2 k, 4 01, 03, 04 100 kV/V TA= +25C 5, 6 50 VO= 30 V, RL= 5 k 4 02 100 5, 6 75 Common mode rejection ratio CMRR 4, 5, 6 All 80 dB See footnotes at end of table. Provided by IHSNot for

38、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78003 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Condit

39、ions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxInput voltage range VIRTA= +25C 1 01, 03, 04 24 V 02 25 Supply current ICC1 01, 03, 04 4.0 mA 2, 3 4.5 1 02 3.8 2, 3 4.0 Short circuit current IOSTA= +25C 1 All 12 mA Slew rate 2/ SR AV= 1, TA= +25C 4 0

40、1, 03, 04 1.4 V/s 02 3 1/ Unless otherwise specified: RS= 50 , RL= 5 k; VS= 28 V for device types 01, 03, 04, and RS= 100 , VS= 40 V for device type 02. 2/ If not tested, shall be guaranteed to the limits specified in table I herein. 4.3 Quality conformance inspection. Quality conformance inspection

41、 shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 sha

42、ll be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document re

43、vision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) T

44、est duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78003 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 7

45、 DSCC FORM 2234 APR 97 Device types 01, 02, 03, 04 Case outlines G P X 2 Terminal number Terminal symbol 1 BALANCE BALANCE BALANCE NC 2 -INPUT -INPUT -INPUT BALANCE 3 +INPUT +INPUT +INPUT NC 4 -VS-VS-VSNC 5 BALANCE BALANCE BALANCE -INPUT 6 OUTPUT OUTPUT OUTPUT NC 7 +VS+VS+VS+INPUT 8 NC / COMPENSATIO

46、N (SEE NOTE 1) COMPENSATION NC NC 9 - - - NC 10 - - - -VS11 - - - NC 12 - - - BALANCE 13 - - - NC 14 - - - NC 15 - - - OUTPUT 16 - - - NC 17 - - - +VS18 - - - NC 19 - - - NC 20 - - - COMPENSATION NOTES: 1. For device type 02 only, pin 8 is bandwidth control. 2. NC = No connection FIGURE 1. Terminal

47、connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78003 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MI

48、L-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 4, 5, 6 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, ap