DLA SMD-5962-76042 REV G-2005 MICROCIRCUIT DIGITAL LOW POWER SCHOTTKY TTL MULTIVIBRATOR MONOLITHIC SILICON《硅单片多谐振荡器肖脱基小功率TTL数字微型电路》.pdf

《DLA SMD-5962-76042 REV G-2005 MICROCIRCUIT DIGITAL LOW POWER SCHOTTKY TTL MULTIVIBRATOR MONOLITHIC SILICON《硅单片多谐振荡器肖脱基小功率TTL数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-76042 REV G-2005 MICROCIRCUIT DIGITAL LOW POWER SCHOTTKY TTL MULTIVIBRATOR MONOLITHIC SILICON《硅单片多谐振荡器肖脱基小功率TTL数字微型电路》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED E Changes in accordance with NOR 5962-R033-96. -tn 96-01-16 Michael A. Frye F Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 03-08-14 Raymond Monnin G Make correction to marking paragraph 3.5. rrp 05

2、-11-15 Raymond Monnin CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV G G G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Monica L. Grosel DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING

3、CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, MULTIVIBRATOR, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE

4、76-11-24 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 14933 76042 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E028-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

5、43218-3990 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in

6、the following example: 76042 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LS221 Dual monostable mutivibrator with Schmitt

7、-trigger inputs and clear 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square leadless chip carr

8、ier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range . -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V dc at -18 mA to +5.5 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD) 1/ . 149 mW L

9、ead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc minimim to 5.5 V dc maximum Minimum high level input voltage (VIH) . +2.0 V dc Maximum

10、 low level input voltage (VIL) +0.7 V dc Case operating temperature range (TC) . -55C to +125C 1/ Must withstand the added PDdue to short circuit test (e.g., IOS). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 7

11、6042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herei

12、n. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcir

13、cuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/

14、 or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedenc

15、e. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as speci

16、fied herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved

17、program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not

18、affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535

19、, appendix A and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic d

20、iagrams shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The elect

21、rical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer

22、s PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performan

23、ce characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V, IOH= -400 A, VIH= 2.0 V, VIL= 0.7 V 1, 2,3 All 2.5 V Low level output voltage VOLVCC= 4.5 V, IOL= 4 mA, VIH= 2.0 V, VIL= 0.7 V

24、 1, 2, 3 All 0.4 V Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA TC= +25C 1 All -1.5 V High level input current IIH1VCC= 5.5 V, VIH= 2.7 V 1, 2, 3 All 20 A IIH2VCC= 5.5 V, VIH= 5.5 V 1, 2, 3 All 100 A Low level input current at A IIL1VCC= 5.5 V, VIL= 0.4 V 1, 2, 3 All -0.4 mA Low level input curren

25、t at B or clear IIL2VCC= 5.5 V, VIL= 0.4 V 1, 2, 3 All -0.8 mA Short circuit output current IOSVCC= 5.5 V, VOUT= 0.0 V 1/ 1, 2, 3 All -15 -150 mA Supply current (quiescent) ICC1VCC= 5.5 V 1, 2, 3 All 11 mA Supply current (triggered) ICC2VCC= 5.5 V 2/ 1, 2, 3 All 27 mA Functional tests See 4.3.1c 7 A

26、ll Propagation delay time, tPHL19 All 80 ns A to Q VCC= 5.0 V, RL= 2 K 5% CL= 15 pF 10% 10, 11 All 112 ns 9 All 85 ns Rext= 2 K Cext= 80 pF CL= 50 pF 10% 10, 11 All 128 ns Propagation delay time, tPLH19 70 A to Q 3/ CL= 15 pF 10% 10, 11 All 98 ns 9 All 75 CL= 50 pF 10% 10, 11 All 113 ns Propagation

27、delay time, tPHL29 65 B to Q CL= 15 pF 10% 10, 11 All 91 ns 9 All 70 ns CL= 50 pF 10% 10, 11 All 105 ns 9 All 55 ns Propagation delay time, B to Q tPLH2CL= 15 pF 10% 10, 11 All 77 ns 9 All 60 CL= 50 pF 10% 10, 11 All 90 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction o

28、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C unl

29、ess otherwise specified Group A subgroupsDevice type Limits Unit Min Max Propagation delay time, tPHL39 All 55 ns clear to Q VCC= 5.0 V, RL= 2 K 5% CL= 15 pF 10% 10, 11 All 77 ns 9 All 60 ns Rext= 2 K Cext= 80 pF CL= 50 pF 10% 10, 11 All 90 ns Propagation delay time, tPLH39 All 65 clear to Q 3/ CL=

30、15 pF 10% 10, 11 All 91 ns 9 All 70 ns CL= 50 pF 10% 10, 11 All 105 ns Width of Q output pulse A tp19 All 150 or B to Q or Q CL= 15 pF 10% 10, 11 All 210 ns 9 All 160 ns CL= 50 pF 10% 10, 11 All 214 ns Width of Q output pulse A tp29 All 70 or B to Q or Q VCC= 5.0 V, RL= 2 K 5% Rext= 2 K CL= 15 pF 10

31、% 10, 11 All 98 ns 9 All 75 ns Cext= 0 2/ 3/ CL= 50 pF 10% 10, 11 All 102 ns Width of Q output pulse A tp39 All 810 or B to Q or Q VCC= 5.0 V, RL= 2 K 5% Rext= 10 K CL= 15 pF 10% 10, 11 All 915 ns 9 All 850 ns Cext= 100 pF 3/ CL= 50 pF 10% 10, 11 All 975 ns Width of Q output pulse A tp49 All 7.5 ms

32、or B to Q or Q VCC= 5.0 V, RL= 2 K 5% Rext= 10 K CL= 15 pF 10% 10, 11 All 10.5 ms 9 All 10.3 ms Cext= 1 F 2/ 3/ CL= 50 pF 10% 10, 11 All 14.4 ms 1/ Not more than one output should be shorted at a time, and the duration of the short-circuit condition should not exceed one second. 2/ This test is guar

33、anteed if not tested to the specified limits. 3/ Propagation delay time testing and pulse width testing may be performed using either CL= 15 pF or CL= 50 pF. However, the manufacturer must certify and guarantee that the microcircuits meet the switching test limits specified for a 50 pF load. Provide

34、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 Device type 01 01 Case outlines E and F 2 Terminal number Term

35、inal symbol Terminal symbol 1 1A NC 2 1B 1A 3 1 CLR 1B 4 1 Q 1CLR 5 2Q 1 Q 6 2Cext NC 7 2Rext/Cext 2Q 8 GND 2Cext 9 2A 2Rext/Cext 10 2B GND 11 2 CLR NC 12 2 Q 2A 13 1Q 2B 14 1Cext 2 CLR 15 1Rext/Cext 2 Q 16 VCC NC 17 - - - 1Q 18 - - - 1Cext 19 - - - 1Rext/Cext 20 - - - VCC FIGURE 1. Terminal connect

36、ions. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 Inputs Outputs CLR A B Q Q L X X L H X H X L H X

37、X L L H H L H H * L H NOTES: H = High level (steady state) = one high-level pulse L = Low level (steady state) = one low-level pulse = transition from low to high level x = irrelevant = transition from high to low level * This latch is conditioned by taking either A high or B low while CLR is in the

38、 inactive state. FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic

39、 diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76042 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 9 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compli

40、ance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of complian

41、ce. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers produc

42、t meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notificatio

43、n of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available o

44、nshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to

45、 quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing o

46、r acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in

47、 table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The

48、following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 7 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR