DLA SMD-5962-06256 REV B-2012 MICROCIRCUIT LINEAR 1 4 GHz CURRENT FEEDBACK AMPLIFIER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline X. Make changes to 1.2.4, 1.3, and figure 1. -rrp 07-10-17 R. HEBER B Delete references to device class M requirements. Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 12-12-06 C. SAFFLE REV SHEET REV SH

2、EET REV STATUS REV B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY RAJESH PITHADIA DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT

3、OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY ROBERT M. HEBER MICROCIRCUIT, LINEAR, 1.4 GHz, CURRENT FEEDBACK AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 07-09-17 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-06256 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E059-13 Provided by IHSNo

4、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06256 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class level

5、s consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN

6、. 1.2 PIN. The PIN is as shown in the following example: 5962 - 06256 01 Q H C Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classe

7、s Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 EL5166

8、 1.4 GHz, current feedback amplifier with enable 02 EL5167 1.4 GHz, current feedback amplifier without enable 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certif

9、ication and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style H GDFP1-F10 or CDFP2-F10 10 Flat pack X CDFP3-F10 10 Flat pack 1.2.5 Lead finish. The lead finish is a

10、s specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06256 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.

11、3 Absolute maximum ratings. 1/ 2/ Supply voltage between +VSand -VS. 12.6 V Maximum continuous output current . 20 mA Current into +VIN, -VIN, and Enable pins . 4 mA Power dissipation 144 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case

12、s H and X 177C/W Pin voltages -VS-0.5 V to +VS+0.5 V Storage temperature range -65C to +150C Ambient operating temperature range . -55C to +125C Die junction temperature +150C Electrostatic discharge (ESD): Human body model (HBM) 3500 V Machine model (MM) . 300 V 1.4 Recommended operating conditions

13、. Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these

14、 documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electroni

15、c Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700

16、Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations un

17、less a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ TA= +25C. Provided by IHSNot for ResaleNo reproduction or networking perm

18、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06256 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance

19、with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical

20、dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics

21、 and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical te

22、st requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PI

23、N number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/

24、compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirement

25、s of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7

26、 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MIC

27、ROCIRCUIT DRAWING SIZE A 5962-06256 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max DC

28、performance. Offset voltage VOS1,2,3 All -13 13 mV Transimpedance ROL1,2,3 All 0.05 5 M Input characteristics. Common mode rejection ratio CMRR VCM= 3 V 1,2,3 All 52 dB Input current common mode rejection -ICMR 1,2,3 All -3.5 3.5 A/V Input current +IINVIN= 0 V 1,2,3 All -40 40 A Input current -IINVI

29、N= 0 V 1,2,3 All -40 40 A Input resistance +RIN1,2,3 All 25 250 k Output characteristics. Output voltage swing VORL= 150 to GND 1,2,3 All 3.6 4.1 V RL= 1 k to GND 1,2,3 3.8 4.3 Output current IOUTRL= 10 to GND 1,2,3 All 105 200 mA Supply. Supply current enabled ISONNo load 1,2,3 All 12 mA Supply cur

30、rent disabled +ISOFFNo load 1,2,3 All 1 25 A -ISOFF1,2,3 -25 -1 Power supply rejection ratio PSRR DC, VS= 4.75 V to 5.25 V 1,2,3 All 40 dB Input current power supply rejection -IPSR DC, VS= 4.75 V to 5.25 V 1,2,3 All -0.5 2 A/V Enable. CE pin input high current IIHCECE = +VS1,2,3 01 1 25 A CE pin in

31、put low current IILCECE = -VS1,2,3 01 -1 1 A CE input high voltage for power-down VIHCE1,2,3 01 +VS- 1 V CE input low voltage for power-down VILCE1,2,3 01 +VS- 3 V 1/ +VS= +5 V, -VS= -5 V, RF= 392 for AV= 1 and RL= 150 unless otherwise specified. Provided by IHSNot for ResaleNo reproduction or netwo

32、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06256 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Device types 01 02 Case outlines H and X Terminal number Terminal symbol 1 NC NC 2 -IN -IN 3 +IN +IN 4 -VS-VS5 N

33、C NC 6 OUT OUT 7 +VS+VS8 CE NC 9 NC NC 10 NC NC NC = no connection. FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06256 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISI

34、ON LEVEL B SHEET 7 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shal

35、l not affect the form, fit, or function as described herein. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classe

36、s Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufact

37、urers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 10

38、15 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and

39、V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance in

40、spection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections, and as specified herein. 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-88

41、3 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives sh

42、all be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturers TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upo

43、n request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herei

44、n. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table II herein. b. For device classes Q and V, the devices or test vehicle shall be subjected

45、to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA= +25C 5C, after exposure, to the subgroups specified in table II herein. Provided by IH

46、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06256 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. Test requirements Subgroups (in a

47、ccordance with MIL-PRF-38535, table III) Device class Q Device class V Interim electrical parameters (see 4.2) - - Final electrical parameters (see 4.2) 1, 2, 3 1/ 1, 2, 3 1/ Group A test requirements (see 4.4) 1, 2, 3 1, 2, 3 Group C end-point electrical parameters (see 4.4) 1, 2, 3 1, 2, 3 Group D

48、 end-point electrical parameters (see 4.4) 1 1 Group E end-point electrical parameters (see 4.4) - - 1/ PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microc