DLA SMD-5962-04205 REV A-2012 MICROCIRCUIT HYBRID 0 5 AMP GATE DRIVE OPTOCOUPLER.pdf
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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Updated drawing paragraphs. -sld 12-01-17 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/w
2、ww.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, HYBRID, 0.5 AMP GATE DRIVE OPTOCOUPLER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 04-08-13 AMSC N/A REVIS
3、ION LEVEL A SIZE A CAGE CODE 67268 5962-04205 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E061-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LE
4、VEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a
5、choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 04205 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (s
6、ee 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s)
7、identify the circuit function as follows: Device type Generic number Circuit function 01 HCPL-5151 Optocoupler, single channel, 0.5 Amp 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirem
8、ents of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space a
9、pplications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possib
10、le limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requiremen
11、ts of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the
12、 manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION L
13、EVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line 1.2.5 Lead finish. The
14、 lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC-VEE) . 0 V dc to +35.0 V dc Average input current (IFAVG) . 25 mA 2/ Peak transient input current (IF PK), ( 5 V 1, 2, 3 01 9.0 mA Threshold input voltage High to low VFHLIO= 0 mA, VO 5 V
15、1, 2, 3 01 0.8 V Input forward voltage VFIF= 10 mA 1, 2, 3 01 1.2 1.8 V Input reverse breakdown voltage BVRIR= 10 A 1, 2, 3 01 5 V UVLO Threshold VUVLO+VO 5 V, IF= 10 mA 1, 2, 3 01 11.0 13.5 V VUVLO-9.5 12.0Input-output leakage current 5/ 6/ II-OVI-O = 1500 Vdc, RH 45 %, t = 5 seconds, TA= +25C 1 01
16、 1.0 A Propagation delay time to high output level 7/ tPLHRg = 47 , Cg = 3 nF, f = 10 kHz, Duty cycle = 50% 9, 10, 11 01 0.10 0.50 s Propagation delay time to low output level 7/ tPHL9, 10, 11 01 0.10 0.50 s Pulse width distortion PWD 9, 10, 11 01 0.30 s Propagation delay difference between any two
17、parts 8/ PDD (tPHLtPLH) 9, 10, 11 01 -0.35 0.35 s See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6
18、DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output high level common mode transient immunity 9/, 10/, 12/ |CMH| IF= 10mA, VCM= 1000V, VCC= 30 V, TA=
19、 +25C 9 01 10 kV/s Output low level common mode transient immunity 9/, 11/, 12/ |CML| VF= 0 V, VCM= 1000V, VCC= 30 V, TA= +25C 9 01 10 kV/s 1/ Maximum pulse width = 50 s, maximum duty cycle = 0.5%. 2/ Maximum pulse width = 10 s, maximum duty cycle = 0.2%. This value is intended to allow for componen
20、t tolerances for designs with IOpeak minimum = 0.5 A. 3/ In this test VOHis measured with a dc load current. When driving capacitive loads VOHwill approach VCCas IOH approaches zero amps. 4/ Maximum pulse width = 1 ms, maximum duty cycle = 20%. 5/ This is a momentary withstand test, not an operating
21、 condition. 6/ Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together. 7/ This load condition approximates the gate load of a 1200 V/25 A IGBT. 8/ The difference between tPHLand tPLHbetween any two of the same devices under the same test
22、 condition. 9/ Pins 1 and 4 need to be connected to LED common. 10/ Common mode transient immunity in the high state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will remain in the high state (i.e., VO 15.0 V). 11/ Common mode transient immunity in the
23、low state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will remain in the low state (i.e., VO 1.0 V). 12/ |CMH| and |CML| shall be tested as part of device initial characterization and after design or process changes. |CMH| and |CML| shall be guaranteed
24、 to the limits specified in table 1 for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FO
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