BS QC 790303-1994 Specification for harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Blank detail specification - L.pdf
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1、BRITISH STANDARD BS QC 790303:1994 IEC748-4-1: 1993 Specification for Harmonized system of quality assessment for electronic components Semiconductor devices Integrated circuits Blank detail specification Linear digital-to-analogue converters (DAC)BSQC790303:1994 BSI 10-1999 ISBN 0 580 35524 1 Amend
2、ments issued since publication Amd. No. Date CommentsBSQC790303:1994 BSI 10-1999 i Contents Page National foreword ii Introduction 1 1 Marking and ordering information 2 2 Application related description 3 3 Specification of the function 3 4 Limiting values 3 5 Operating conditions 4 6 Electrical ch
3、aracteristics 4 7 Programming 7 8 Mechanical and environmental ratings, characteristics and data 7 9 Additional information 7 10 Screening 8 11 Quality assessment procedures 8 12 Structural similarity procedures 8 13 Test conditions and inspection requirements 8 14 Additional measurement method 16BS
4、QC790303:1994 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee, ECL/-. It is identical with IEC Publication IEC748-4.1:1993(QC790303) Semiconductor devices Integrated circuits Part4: Interface integra
5、ted circuits Section1: Blank detail specification for linear digital-to-analogue converters (DAC) published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ system of quality assessment for electronic components. This blank detail specification
6、 is one of a series of blank detail specifications for semiconductor devices to be used with BSQC700000:1991 Harmonized system of quality assessment for electronic components. Generic specification for discrete devices and integrated circuits and BSQC790100:1991 Harmonized system of quality assessme
7、nt for electronic components. Semiconductor devices. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Cross-references International Standard a Corresponding British Standard IEC68-2-17 BS2011 Environmental testing Part2.1Q:1981 Test Q. Sealing (Identical) IEC
8、747-1 BS6493 Semiconductor devices Part1 Discrete devices Section1.1:1984 General (Identical) IEC747-10 BS QC700000:1991 Harmonized system of quality assessment for electronic components. Generic specification for discrete devices and integrated circuits (Identical) BS6493 Semiconductor devices Part
9、2. Integrated circuits IEC748-1 Section2.1:1985 General (Identical) IEC748-4 Section2.4:1989 Recommendations for interface integrated circuits (Identical) IEC748-11 BS QC790100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for
10、semiconductor integrated circuits excluding hybrid circuits (Identical) IEC749 BS6493 Semiconductor devices Part3:1985 Mechanical and climatic test methods (Identical) QC001002 BS QC001002:1991 Rules of Procedure of the IEC Quality Assessment System for Electronic Components(IECQ) (Identical) a Unda
11、ted in the text.BSQC790303:1994 BSI 10-1999 iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obliga
12、tions. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, pages1to16 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv b
13、lankBSQC790303:1994 BSI 10-1999 1 Introduction The IEC Quality Assessment System for Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic
14、components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for
15、semiconductor devices and shall be used with the following IEC publications: 747-10/QC700000, Semiconductor devices Discrete devices and integrated circuits Part10: Generic specification for discrete devices and integrated circuits. 748-11/QC790100, Semiconductor devices Integrated circuits Part11:
16、Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Required information Numbers shown in brackets on this and the following pages correspond to the following items of required information, which should be entered in the spaces provided. Identification of the det
17、ail specification 1 The name of the National Standards Organization under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the generic and sectional specifications. 4 The national number of the detail specification,
18、 date of issue and any further information, if required by the national system. Identification of the component 5 Main function and type number. 6 Information on typical construction (materials, the main technology) and the package. If the device has several kinds of derivative products, those diffe
19、rences should be indicated, e.g.features of the characteristics in the comparison table. If the device is electrostatic sensitive, a caution statement shall be added in the detail specification. 7 Outline drawing, terminal identification, marking and/or reference to the relevant document for outline
20、s. 8 Category of assessed quality according to2.6 of the generic specification. 9 Reference data. Example of reference data: Linear D/A converter with a single input and an invariable reference or linear multiplying D/A converter with double inputs, one of the two being a variable analogue reference
21、; Unipolar and/or bipolar circuitry; Voltage or current output; Offset and gain-adjustable errors or zero-scale and full-scale non-adjustable errors, etc. (Indication of these essential values.) Throughout this standard, the texts given in square brackets are intended for guidance to the specificati
22、on writer and shall not be included in the detail specification. When confusion may arise as to whether a paragraph is only instruction to the writer or not, the paragraph shall be indicated between brackets.BSQC790303:1994 2 BSI 10-1999 1 Marking and ordering information 1.1 Marking See2.5 of the g
23、eneric specification. The detail specification shall prescribe the information marked for the relevant types, such as letters, figures and/or codes. When the marking contains information other than that specified in2.5 of the generic specification, such as that used for the manufacturers internal us
24、e, it shall be distinguished. If all the information has already appeared in box7 of the front page, this shall be indicated. Name (address) of responsible NAI (and possibly of body from which specification is available). 1 Number of IECQ detail specification, plus issue number and/or date. QC790303
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