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    BS QC 790303-1994 Specification for harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Blank detail specification - L.pdf

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    BS QC 790303-1994 Specification for harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Blank detail specification - L.pdf

    1、BRITISH STANDARD BS QC 790303:1994 IEC748-4-1: 1993 Specification for Harmonized system of quality assessment for electronic components Semiconductor devices Integrated circuits Blank detail specification Linear digital-to-analogue converters (DAC)BSQC790303:1994 BSI 10-1999 ISBN 0 580 35524 1 Amend

    2、ments issued since publication Amd. No. Date CommentsBSQC790303:1994 BSI 10-1999 i Contents Page National foreword ii Introduction 1 1 Marking and ordering information 2 2 Application related description 3 3 Specification of the function 3 4 Limiting values 3 5 Operating conditions 4 6 Electrical ch

    3、aracteristics 4 7 Programming 7 8 Mechanical and environmental ratings, characteristics and data 7 9 Additional information 7 10 Screening 8 11 Quality assessment procedures 8 12 Structural similarity procedures 8 13 Test conditions and inspection requirements 8 14 Additional measurement method 16BS

    4、QC790303:1994 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee, ECL/-. It is identical with IEC Publication IEC748-4.1:1993(QC790303) Semiconductor devices Integrated circuits Part4: Interface integra

    5、ted circuits Section1: Blank detail specification for linear digital-to-analogue converters (DAC) published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ system of quality assessment for electronic components. This blank detail specification

    6、 is one of a series of blank detail specifications for semiconductor devices to be used with BSQC700000:1991 Harmonized system of quality assessment for electronic components. Generic specification for discrete devices and integrated circuits and BSQC790100:1991 Harmonized system of quality assessme

    7、nt for electronic components. Semiconductor devices. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Cross-references International Standard a Corresponding British Standard IEC68-2-17 BS2011 Environmental testing Part2.1Q:1981 Test Q. Sealing (Identical) IEC

    8、747-1 BS6493 Semiconductor devices Part1 Discrete devices Section1.1:1984 General (Identical) IEC747-10 BS QC700000:1991 Harmonized system of quality assessment for electronic components. Generic specification for discrete devices and integrated circuits (Identical) BS6493 Semiconductor devices Part

    9、2. Integrated circuits IEC748-1 Section2.1:1985 General (Identical) IEC748-4 Section2.4:1989 Recommendations for interface integrated circuits (Identical) IEC748-11 BS QC790100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for

    10、semiconductor integrated circuits excluding hybrid circuits (Identical) IEC749 BS6493 Semiconductor devices Part3:1985 Mechanical and climatic test methods (Identical) QC001002 BS QC001002:1991 Rules of Procedure of the IEC Quality Assessment System for Electronic Components(IECQ) (Identical) a Unda

    11、ted in the text.BSQC790303:1994 BSI 10-1999 iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obliga

    12、tions. Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, pages1to16 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.iv b

    13、lankBSQC790303:1994 BSI 10-1999 1 Introduction The IEC Quality Assessment System for Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic

    14、components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for

    15、semiconductor devices and shall be used with the following IEC publications: 747-10/QC700000, Semiconductor devices Discrete devices and integrated circuits Part10: Generic specification for discrete devices and integrated circuits. 748-11/QC790100, Semiconductor devices Integrated circuits Part11:

    16、Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Required information Numbers shown in brackets on this and the following pages correspond to the following items of required information, which should be entered in the spaces provided. Identification of the det

    17、ail specification 1 The name of the National Standards Organization under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the generic and sectional specifications. 4 The national number of the detail specification,

    18、 date of issue and any further information, if required by the national system. Identification of the component 5 Main function and type number. 6 Information on typical construction (materials, the main technology) and the package. If the device has several kinds of derivative products, those diffe

    19、rences should be indicated, e.g.features of the characteristics in the comparison table. If the device is electrostatic sensitive, a caution statement shall be added in the detail specification. 7 Outline drawing, terminal identification, marking and/or reference to the relevant document for outline

    20、s. 8 Category of assessed quality according to2.6 of the generic specification. 9 Reference data. Example of reference data: Linear D/A converter with a single input and an invariable reference or linear multiplying D/A converter with double inputs, one of the two being a variable analogue reference

    21、; Unipolar and/or bipolar circuitry; Voltage or current output; Offset and gain-adjustable errors or zero-scale and full-scale non-adjustable errors, etc. (Indication of these essential values.) Throughout this standard, the texts given in square brackets are intended for guidance to the specificati

    22、on writer and shall not be included in the detail specification. When confusion may arise as to whether a paragraph is only instruction to the writer or not, the paragraph shall be indicated between brackets.BSQC790303:1994 2 BSI 10-1999 1 Marking and ordering information 1.1 Marking See2.5 of the g

    23、eneric specification. The detail specification shall prescribe the information marked for the relevant types, such as letters, figures and/or codes. When the marking contains information other than that specified in2.5 of the generic specification, such as that used for the manufacturers internal us

    24、e, it shall be distinguished. If all the information has already appeared in box7 of the front page, this shall be indicated. Name (address) of responsible NAI (and possibly of body from which specification is available). 1 Number of IECQ detail specification, plus issue number and/or date. QC790303

    25、 2 ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: Generic specification: Publication747-10/QC700000 Sectional specification: Publication748-11/QC790100 and national references if different. 3 National number of detail specification. This box need not be used if the national number repe

    26、ats the IECQ number. 4 BLANK DETAIL SPECIFICATION FOR: LINEAR DIGITAL-TO-ANALOGUE CONVERTERS (DAC) Type number(s) of the relevant device(s). Ordering information: see subclause1.2 of this standard. 5 Mechanical description Outline references Standard package reference should be given, IEC number (ma

    27、ndatory if available) and/or national number. Outline drawing may be transferred to or given with more details in clause8 of this standard. 7 Short description Application: Function: Typical construction: Si, monolithic, bipolar, MOS. Encapsulation: cavity or non-cavity. Comparison table of characte

    28、ristics for variant products. CAUTION: Electrostatic sensitive devices. 6 Terminal identification drawing showing pin assignments, including graphical symbols. Categories of assessed quality From subclause2.6 of the generic specification. 8 Marking letters and figures, or colour code. The detail spe

    29、cification shall prescribe the information to be marked on the device, if any. See subclause2.5 of the generic specification and/or subclause1.1 of this standard. Reference data Reference data on the most important properties to permit comparison between types. 9 Information about manufacturers who

    30、have components qualified to this detail specification is available in the current Qualified Products List.BSQC790303:1994 BSI 10-1999 3 1.2 Ordering information The following minimum information is necessary to order a specific device, unless otherwise specified: precise type reference (and nominal

    31、 voltage value, if required); IECQ reference of detail specification with issue number and/or date when relevant; category of assessed quality as defined in clause9 of the sectional specification and, if required, screening sequence as defined in clause8 of the sectional specification; packaging for

    32、 delivery; any other particulars. 2 Application related description Information on the application of the device in equipment or circuits and its relations to the associated devices shall be given here. The contents will depend on the function to be described. 3 Specification of the function A detai

    33、led block diagram or equivalent circuit information of the integrated circuit shall be given, if necessary. 4 Limiting values (absolute maximum rating system) This clause is not for inspection purposes. These values apply over the operating temperature range, unless otherwise specified. Any specific

    34、 mechanical or environmental ratings particular to the device and any interdependence of limiting conditions should be stated here. Curves shall preferably be given under clause9 of the detail specification. Sub-clause Parameters a Symbol Value Unit Min. Max. 4.1 4.2 4.3.1 4.3.2 4.3.3 4.4 4.5 4.6 4.

    35、7 4.8 4.9 4.10 Power supply voltages (see note of clause5 of this standard) Power supply currents (where appropriate) Digital input voltage Input voltage of the reference amplifier (where appropriate) or Differential input voltage of the reference amplifier (whereappropriate) Analogue output voltage

    36、(s) Reference input current(s) (where appropriate) Analogue output current(s) (where applicable) Other terminal voltage and/or currents Power dissipation Short-circuit output current Duration of the short circuit (where appropriate) V CCV EE I CC I EE V I V REF V REF(D) V O I REF I O P tot I OS t OS

    37、 V V mA mA V V V V mA mA V and/or mA W mA s a See IEC748-1, Amendment1, chapter VI, notes1 and2 of10.4.1. Sub-clause Parameters of temperature limiting values b Symbol Value Unit Min. Max. 4.11 4.12 Operating temperature Storage temperature T ambT stg C C b See IEC748-1, Amendment1, chapter VI, note

    38、 of10.4.2.BSQC790303:1994 4 BSI 10-1999 5 Operating conditions (within the specified operating temperature range) Operating conditions are specified in the relevant measuring methods (see748-4, chapter IV, section 3, category II). See13.3 of this standard for inspection requirements. General conditi

    39、ons of measurement and corresponding values: 6 Electrical characteristics These characteristics requirements are based on linear digital-to-analogue converters with a single input and an invariable reference or linear multiplying digital-to-analogue converters with double inputs, one of the two bein

    40、g a variable analogue reference. The symbols, terms and conditions of electrical characteristics are given here in conformance with the relevant part of IEC748-4. See terms and definitions chapter II, category II, clause2 and conditions of electrical characteristics, chapter III, section 2, category

    41、 II, clause4. Curves should preferably be given under clause9 of this standard. The following characteristics apply over the full operating ambient temperature range, unless otherwise stated. Where the stated performance of the circuit varies over the operating ambient temperature range, the values

    42、of the appropriate characteristics shall be stated at25 C and at the extremes of the operating temperature range. 5.1 Power supply voltage(s) note V CC V EE 5.2 Power supply current(s) I CC I EE 5.3 Digital input(s): 5.3.1 All bits logic “1” V IHB I IHA 5.3.2 All bits logic “0” V ILA I ILA NOTEFor b

    43、ipolar converters: V CC(positive supply voltage), V EE(negative supply voltage), withrespectto ground reference. For unipolar converters: V CC(positive supply voltage) onlywithrespect to ground reference.BSQC790303:1994 BSI 10-1999 5 Table of the electrical characteristics 6.1 Static characteristics

    44、 Sub-clause Static characteristics Symbol Value Unit Min. Max. 6.1.1 6.1.2 6.1.3 a 6.1.4 6.1.5 6.1.6 6.1.7 6.1.8 6.1.9 Reference bias current or Reference bias voltage (where appropriate) and change of the reference voltage versus temperature Input voltage high level and Input voltage low level (whe

    45、re appropriate) Input current high level (where appropriate) and/or Input current low level (where appropriate) Output current or output voltage sensitivity with a change of each supply voltage (where appropriate) Analogue output currents (where appropriate) output current(s) range unipolar and/or b

    46、ipolar full scale or gain point zero scale or offset point Analogue output voltage (where appropriate) output voltage(s) range unipolar and/or bipolar full scale or gain point zero scale or offset point Short-circuited current for analogue output (where appropriate) I REF V REF %V REF V IH V IL I IH

    47、 I IL k SVS(I) k SVS(V) I O I O V O V O I OS mA V V/ C V V mA mA % FS/ % V CC mA mA V V mA, A a V ILand V IHare not measured but are measurement conditions to define other characteristics.BSQC790303:1994 6 BSI 10-1999 Table of the electrical characteristics 6.2 Characteristics of conversion errors S

    48、ub-clause Characteristics of conversion errors Symbol Value Unit Min. Max. 6.2.1 6.2.2 6.2.3 6.2.4 6.2.5 6.2.6 6.2.7 6.2.8 6.2.9 6.2.10 6.2.11 6.2.12 Offset error (where appropriate) Gain error (where appropriate) (End point) linearity error (where appropriate) Best straight line linearity error (wh

    49、ere appropriate) Full-scale error (where appropriate) Zero-scale error (where appropriate) unipolar configuration Absolute linearity error (where appropriate) Differential linearity error Bipolar converter: full-scale asymmetry (ifapplicable) Bipolar zero error (if applicable) Temperature coefficient for unipolar and/or bipolar zero scale or offset point (if applicab


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