BS ISO 10934-2-2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy《光学和光学仪器 显微镜学词汇 光学显微镜的先进技术》.pdf
《BS ISO 10934-2-2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy《光学和光学仪器 显微镜学词汇 光学显微镜的先进技术》.pdf》由会员分享,可在线阅读,更多相关《BS ISO 10934-2-2007 Optics and optical instruments - Vocabulary for microscopy - Advanced techniques in light microscopy《光学和光学仪器 显微镜学词汇 光学显微镜的先进技术》.pdf(14页珍藏版)》请在麦多课文档分享上搜索。
1、 g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58microscopy Part 2: Advanced techniques in light microscopyICS 01.040.37; 37.020Optics and optical i
2、nstruments Vocabulary for BRITISH STANDARDBS ISO 10934-2:2007BS ISO 10934-2:2007This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 March 2007 BSI 2007ISBN 978 0 580 50409 9Amendments issued since publicationAmd. No. Date Commentscontract. Use
3、rs are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations. National forewordThis British Standard was published by BSI. It is the UK implementation of ISO 10934-2:2007.The UK participation in its preparation was entrusted by Techn
4、ical Committee CPW/172, Optics and photonics, to Subcommittee CPW/172/5, Microscopes.A list of organizations represented on CPW/172/5 can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a Reference numberISO 10934-2:2007(E)INTERNAT
5、IONAL STANDARD ISO10934-2First edition2007-03-01Optics and optical instruments Vocabulary for microscopy Part 2: Advanced techniques in light microscopyOptique et instruments doptique Vocabulaire relatif la microscopie Partie 2: Techniques avances en microscopie optique BS ISO 10934-2:2007ii iiiFore
6、word ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a techn
7、ical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
8、electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to
9、 the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for
10、identifying any or all such patent rights. ISO 10934-2 was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 5, Microscopes and endoscopes. ISO 10934 consists of the following parts, under the general title Optics and optical instruments Vocabulary for microscopy: Par
11、t 1: Light microscopy Part 2: Advanced techniques in light microscopy BS ISO 10934-2:2007blank1Optics and optical instruments Vocabulary for microscopy Part 2: Advanced techniques in light microscopy 1 Scope This part of ISO 10934 specifies terms and definitions to be used in the field of advanced l
12、ight microscopy. 2 Terms and definitions NOTE Terms shown in bold within a definition or a note are defined elsewhere within this part of ISO 10934. 2.1 acousto-optical modulator electronically-tunable device used to control the direction and/or intensity of a laser by an acoustically-induced diffra
13、ction grating in a crystal 2.2 acousto-optical tunable filter AOTF electronically-tunable filter for selection of wavelengths by an acoustically-induced diffraction grating in a crystal 2.3 aliasing phenomenon caused by sampling at too low a frequency (i.e. lower than the Nyquist frequency) resultin
14、g in the loss of information and/or the creation of spurious information 2.4 auto-focus method of bringing an object automatically into focus, controlled by an imaging software algorithm and/or a hardware device that detects the object position 2.5 axial resolution resolution in the direction of the
15、 optical axis 2.6 background subtraction removal of that part of the signal that is present in the absence of the object, to reveal underlying image information 2.7 binning mode of operation of an image sensor where the charge of adjacent pixels is accumulated and is read out as a single value BS IS
16、O 10934-2:20072 2.8 confocal microscopy state in which, ideally, a point in the object field is illuminated by a diffraction-limited spot of light, and light emanating from this point is focused upon and detected from an area smaller than the central area of the diffraction disc situated in the corr
17、esponding position in a subsequent field plane 2.9 channel particular signal path containing one type of image information 2.10 co-localization overlay of images with coincidence of pixels corresponding to the same object points 2.11 confocal microscope microscope in which, ideally, a point in the o
18、bject plane is illuminated by a diffraction-limited spot of light, and light emanating from this point is focused upon and detected from an area smaller than the central area of the diffraction disc situated in the corresponding position in a subsequent field plane NOTE 1 An image of an extended are
19、a is formed either by scanning the object, or by scanning the illuminated and detected spots simultaneously. NOTE 2 The confocal principle leads to improved axial resolution by suppression of light from out-of-focus planes. 2.11.1 laser-scanning confocal microscope confocal microscope (2.11) in whic
20、h the light source is a laser 2.11.2 multiple-beam confocal microscope confocal microscope (2.11) using more than one illuminated and detected spot simultaneously 2.11.3 Nipkow disc confocal microscope confocal microscope (2.11) in which the scanning of the illuminated and detected spots is performe
21、d using a Nipkow disc (2.11.3.1) 2.11.3.1 Nipkow disc opaque disc with many ideally identical small holes arranged in Archimedean spirals 2.11.3.2 Tandem-scanning confocal microscope Nipkow disc confocal microscope (2.11.3) in which the illuminating light and the detected light pass through separate
22、 holes 2.11.4 spectral confocal microscope confocal microscope (2.11) in which a spectrum is recorded corresponding to spatial positions in an object 2.11.5 theta confocal microscope confocal microscope (2.11) in which two objectives positioned at an angle, , with respect to one another, and with fo
23、cal points coincident in the object, are used for excitation and collection respectively 2.11.6 white-light confocal microscope confocal microscope (2.11) using an illumination source and a detector operating throughout the visible spectrum BS ISO 10934-2:200732.11.7 confocal point spread function p
24、roduct of the point spread functions (2.35) of the illuminating and detecting optical systems in a confocal microscope (2.11) 2.11.8 confocal volume effective volume around each point in the object which gives rise to the image in a confocal microscope (2.11) 2.11.9 4 Pi confocal microscope confocal
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