ANSI IEEE C37.66-2005 Standard Requirements for Capacitor Switches for AC Systems (1 kV to 38 kV) IEEE 3 Park Avenue New York NY 10016-5997 USA 22 March 2006 IEEE Power Engineering.pdf
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1、IEEE Std C37.66-2005(Revision ofANSI C37.66-1969)IEEE Standard Requirements forCapacitor Switches for AC Systems (1 kV to 38 kV)I E E E3 Park Avenue New York, NY 10016-5997, USA22 March 2006IEEE Power Engineering SocietySponsored by theSwitchgear CommitteeRecognized as an IEEE Std C37.66-2005 Americ
2、an National Standard (ANSI) (Revision of ANSI C37.66-1969) IEEE Standard Requirements for Capacitor Switches for AC Systems (1 kV to 38 kV) Sponsor Switchgear Committee of the IEEE Power Engineering Society Approved 1 February 2006 American National Standards Institute Approved 22 September 2005 IEE
3、E-SA Standards Board Abstract: Required definitions, ratings, and procedures for performing design tests, production tests, and construction requirements for capacitor switches for ac systems from 1 kV to 38 kV are covered. Keywords: back-to-back capacitor switching, capacitor load, capacitor switch
4、es, inrush current, operation, pole discrepancy, probability of restrike classification, restrike, simultaneous operation _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2006 by the Institute of Electrical and Electronics Engineers,
5、 Inc. All rights reserved. Published 22 March 2006. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearan
6、ce Center. Introduction This introduction is not part of IEEE Std C37.66-2005, IEEE Standard Requirements for Capacitor Switches for AC Systems (1 kV to 38 kV). This standard has been revised and updated from the 1969 version of ANSI C37.66-1969 (R1982), incorporating significant improvements that r
7、eflect present capacitor switch technology. These improvements include changes and additions in the following areas: a) b) c) d) e) f) g) Inclusion of solid and gas insulated switches Expansion of the ratings data through 38 kV Creation of probability of restrike classifications C2, C1, and C0 Addit
8、ion of Annex A (informative)Fault handling ratings for capacitor switches Addition of Annex B (informative)Consideration of inrush current in back-to-back capacitor switching Addition of Annex C (informative)Simultaneous opening of single-phase capacitor switches on ungrounded wye capacitor installa
9、tions Addition of Annex D (informative)Altitude correction factors Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodi
10、cally. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publicatio
11、n of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquir
12、ies into the legal validity or scope of those patents that are brought to its attention. Copyright 2006 IEEE. All rights reserved. ivParticipants At the time this standard was completed, the Capacitor Switches Working Group had the following membership: Harold J. Hirz, Chair Robert Behl Frank DeCesa
13、ro Marcel Fortin William Hurst Mark McVey Carl Reigart Kirk Smith Mel Smith John St. Clair Edward Steele David Stone John Wood Elbert Worland Jan Zawadzki The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Donal
14、d Akers Roy Alexander Chris Ambrose John Angelis Edwin Averill Shankha Basu Behdad Biglar Thomas Blair Anne Bosma Harvey Bowles Raymond Capra Tommy Cooper R. Daubert Byron Davenport Larry Davis Frank DeCesaro James Domo Randall Dotson Denis Dufournet Amir El-Sheikh Gary Engmann Marcel Fortin Mietek
15、Glinkowski Randall Groves John E. Harder Ian Harvey Harold Hirz Edward Horgan, Jr. George House William Hurst Robert Jeanjean Joseph L. Koepfinger David Krause Thomas LaRose John Leach George N. Lester Jason Lin Jeffrey Lord Gregory Luri Jose E. Mattei Neil McCord Nigel McQuin Gary Michel Alec Monro
16、e Georges Montillet Peter Morgan Frank Muench Jeffrey Nelson T. W. Olsen Thomas Pekarek Radhakrishnan Ranjan Radharishna Rebbapragada Joseph Rostron Timothy Royster James Ruggieri Surya Santoso Devki Sharma H. M. Smith James Smith John St. Clair Allan St. Peter David Stone Stanton Telander Michael T
17、oney Joseph Tumidajski Waldemar Von Miller Charles Wagner Steven Whalen James Wilson John Wood Elbert Worland Jan Zawadzki Copyright 2006 IEEE. All rights reserved. vWhen the IEEE-SA Standards Board approved this standard on 22 September 2005, it had the following membership: Steve M. Mills, Chair R
18、ichard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C.
19、Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Rich
20、ard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Jennie Steinhagen IEEE Standards Project Editor vi Copyright 2006 IEEE. All rights reserved. Contents 1. Scope 1 2. Normative references 1 3. Definitions 2 4. Service conditions 3 4.1 Usual service conditions 3 4.2 Unusual service
21、 conditions 3 5. Ratings 4 5.1 General 4 5.2 Rating information. 5 5.3 Rated maximum voltage 5 5.4 Rated power frequency 5 5.5 Rated peak fault-making current 5 5.6 Rated symmetrical fault-making current . 5 5.7 Rated capacitive switching current 7 5.8 Rated peak withstand current. 7 5.9 Rated short
22、-time (symmetrical) withstand current and duration 7 5.10 Rated high-frequency transient-making current 7 5.11 Rated transient inrush frequency . 7 5.12 Rated lightning impulse withstand voltage 8 5.13 Rated control voltages and ranges . 9 6. Design tests. 9 6.1 General 9 6.2 Insulation (dielectric)
23、 tests. 10 6.3 Short-time current tests 12 6.4 Rated fault-making current tests 12 6.5 Operating duty tests. 14 6.6 Condition of capacitor switch after short-time current tests, rated fault-making current tests, and operating duty tests (see 6.3, 6.4, and 6.5) 16 6.7 Temperature rise tests 17 6.8 Ra
24、dio influence voltage tests . 18 6.9 Mechanical life tests 20 6.10 Control wiring tests . 20 7. Production tests 20 vii Copyright 2006 IEEE. All rights reserved. 8. Construction requirements 20 8.1 Grounding provision 20 8.2 Manual operating provision. 20 8.3 Position indicator. 21 8.4 Nameplate mar
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