ANSI IEEE C37.081-1981 Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis《基于对称原理的额定交流高压断路器的综合故障检测指南》.pdf

《ANSI IEEE C37.081-1981 Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis《基于对称原理的额定交流高压断路器的综合故障检测指南》.pdf》由会员分享，可在线阅读，更多相关《ANSI IEEE C37.081-1981 Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis《基于对称原理的额定交流高压断路器的综合故障检测指南》.pdf（35页珍藏版）》请在麦多课文档分享上搜索。

1、ANSI/IEEE C37.081-1981 (R2007)An American National StandardIEEE Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current BasisSponsorSwitchgear Committeeof theIEEE Power Engineering SocietySecretariatInstitute of Electrical and Electronics Engineers, IncNa

2、tional Electrical Manufacturers AssociationApproved September 14, 1978Reaffirmed March 21, 2007IEEE Standards BoardApproved December 1, 1980Reaffirmed October 17, 1988American National Standards Institute Copyright 1981 byThe Institute of Electrical and Electronics Engineers, Inc345 East 47th Street

3、, New York, NY 10017No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without theprior written permission of the publisher.iiIEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the StandardsCoordina

4、ting Committees of the IEEE Standards Board. Members of the committees serve voluntarily and withoutcompensation. They are not necessarily members of the Institute. The standards developed within IEEE represent aconsensus of the broad expertise on the subject within the Institute as well as those ac

5、tivities outside of IEEE whichhave expressed an interest in participating in the development of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no otherways to produce, test, measure, purchase, market, or provide other goods a

6、nd services related to the scope of the IEEEStandard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to changebrought about through developments in the state of the art and comments received from users of the standard. EveryIEEE Standard is subjected to

7、 review at least once every five years for revision or reaffirmation. When a document ismore than five years old, and has not been reaffirmed, it is reasonable to conclude that its contents, although still ofsome value, do not wholly reflect the present state of the art. Users are cautioned to check

8、 to determine that they havethe latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliationwith IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together withappr

9、opriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate tospecific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiateaction to prepare appropriate respons

10、es. Since IEEE Standards represent a consensus of all concerned interests, it isimportant to ensure that any interpretation has also received the concurrence of a balance of interests. For this reasonIEEE and the members of its technical committees are not able to provide an instant response to inte

11、rpretation requestsexcept in those cases where the matter has previously received formal consideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board345 East 47th StreetNew York, NY 10017USAiiiForeword(This Foreword is not a part of ANSI

12、/IEEE C37.081-1981, IEEE Guide for Synthetic Fault Testing of AC High-Voltage CircuitBreakers Rated on a Symmetrical Current Basis.)This is a new guide developed to provide a basis for synthetic testing of circuit breakers and to establish the criteria fortesting to demonstrate the short circuit rat

13、ing of circuit breakers.The guide contains typical circuits for use in demonstrating interrupting capabilities, but these circuits are those ingeneral use and they should not exclude the development or introduction of additional circuits.The Standards Committee on Power Switchgear, C37, which review

14、ed and approved this Guide, had the followingpersonnel at the time of approval:C.L. Wagner, Chair John D. Hopkins, Secretary J.E. Beehler (Executive Vice-Chairman of High Voltage Switchgear Standards)W. E. Laubach (Executive Vice-Chairman of Low Voltage Switchgear Standards)S. H. Telender (Executive

15、 Vice-Chairman of IEC Activities)ivThis guide was prepared by the Working Group on Synthetic Testing of the Power Circuit Breaker Subcommittee. Atthe time this guide was approved the working group had the following membership:T. F. Garrity, Chair D. M. BenensonR. G. ColclaserC. F. CromerC. D. Fahrnk

16、opfJ. PorterJ. G. Reckleff*A. RishworthW. N. RothenbuhlerE. RuossG. St. JeanH. N. SchneiderE. G. SolorzanoJ. A. UrbanekE. F. VeverkaG. A. Votta*Chairman at time of publicationOrganization Represented Name of RepresentativeAssociation of American Railroads . VacantAssociation of iron and Steel Engine

17、ers J. M. TillmanElectric Light and Power Group K. G. AdgateJ. E. BeehlerR. L. Capra (Alt)H. G. DarronH. F. FrusK. D. HendrixR. L. Lindsey (Alt)E. E. Ramm (Alt)F. R. SolisInstitute of Electrical and Electronics Engineers. M. J. Beachy (Alt)R. N. Bell (Alt)H. H. FahnoeR. E. FriedrichM. J. MaierC. A.

18、Mathews (Alt)D. C. Musgrave (Alt)G. W. WalshH. F. WhiteNational Electrical Manufacturers Association . A. P. ColaiacoR. W. DunhamD. G. PortmanG. A. WilsonW. R. WilsonTennessee Valley Authority Robert C. St. ClairTesting Laboratory Group . L. FrierE. J. HuberR. W. Seelbach (Alt)U.S. Department of the

19、 Army Robert H. BruckU.S. Department of the Interior, Bureau of Reclamation Edward M. TomsicU.S. Department of Defense, Defense Communications Agency . VacantU.S. Department of the Navy, Naval Facilities Engineering Command . D. M. HannemannvAt the time this guide was approved, the Power Circuit Bre

20、aker Subcommittee had the following membership:G. A. Wilson, Chair H. W. AnderlJ. E. BeechlerD. M. BenensonL. E. BrothersR. G. ColclaserB. G. CourseyJ. C. CoonC. F. CromerC. R. CusickA. DupontC. J. DvorakP. W. DwyerJ. D. FinleyR. E. FriedrichT. F. GarrityJ. P. GeraghtyW. F. GilesK. I. GrayR. D. Hamb

21、rickG. R. HanksW. E. HarperM. HudisW. C. Huening, JrP. L. KolarikS. R. LambertD. M. LarsonG. N. LesterM. J. MaierJ. A. ManeatisR. A. McMasterG. J. MeindersZ. NeriI. E. OliverR. A. PaceG. O. PerkinsJ. G. ReckleffA. B. RishworthW. N. RothenbuhlerL. H. SchmidtH. N. SchneiderG. G. SchockeltR. D. Settemb

22、riniE. G. SolorzanoT. J. ToybinC. J. TruaxE. F. VeverkaG. A. VottaC. L. WagnerD. R. WebsterW. R. WilsonB. F. WirtzC. E. ZanzieWhen the IEEE Standards Board approved this guide on September 14, 1978, it had the following membership:Joseph L. Koepfinger, Chair Irvin N. Howell, Jr, Vice Chair Ivan G. E

23、aston, Secretary William E. AndrusC. N. BerglundEdward J. CohenWarren H. CookDavid B. DobsonR. O. DuncanCharles W. FlintJay ForsterRalph I. HauserLoering M. JohnsonIrving KolodnyWilliam R. KruesiThomas J. MartinJohn E. MayDonald T. MichaelVoss A. MooreWilliam S. MorganRobert L. PritchardBlair A. Row

24、leyRalph M. ShowersB. W. WhittingtonviCLAUSE PAGE1. Introduction.11.1 General. 11.2 Scope and Purpose . 12. Definitions.23. References.24. Short-Circuit Current Interruption Process .34.1 Circuit Breaker Performance During Interruption; Basic Intervals . 34.2 State of Interrupting Process . 45. Basi

25、c Principles of Synthetic Test 45.1 Principles 45.2 Basic Components 46. Synthetic Test Circuits 56.1 Current Injection Method. 56.2 Voltage Injection Method 86.3 Duplicate Circuit Method. 86.4 Synthetic Test Circuits; Choice of Methods 97. Requirements for Synthetic Test Methods97.1 High-Current In

26、terval. 107.2 Interaction Interval. 107.3 High-Voltage Interval 107.4 Discussion 108. Parameters, Test Procedures, and Tolerances.108.1 High-Current Interval; Voltage of Current Circuit 108.2 Interaction Interval Current Injection Circuit . 128.3 High-Voltage Circuit 139. Short-Line Fault 1510. Mult

27、iple Loops1510.1 Method with Single Application of the Voltage Circuit 1510.2 Method with Multiple Application of Voltage Circuits. 1611. Circuit Breakers Equipped with Parallel Impedance 1611.1 General. 1611.2 Four Part Test Method . 17viiCLAUSE PAGE12. Duty Cycle 1812.1 Test Duties for Synthetic T

28、esting. 1812.2 Test Methods 1913. Test Records2113.1 General. 2113.2 Current Measurements . 2113.3 Voltage Measurements. 21Annex A (informative) Distorted Current; Derivation 23Copyright 1981 IEEE All Rights Reserved 1An American National StandardIEEE Guide for Synthetic Fault Testing of AC High-Vol

29、tage Circuit Breakers Rated on a Symmetrical Current Basis1. Introduction1.1 GeneralTo develop and test high-voltage circuit breakers to meet present and future system capabilities requires demonstrationof performance at power levels in excess of the capacity of test laboratories or utility systems.

30、 Various means havebeen developed in the past to extend test capabilities such as two part testing or unit testing. A major extension of testcapability results from the use of multiple source circuits.ANSI C37.06-1979, 1 1, establishes current and voltage requirements which may not be possible to ac

31、hieve on directtests. Multiple source circuits, generally identified as synthetic circuits, can achieve the required characteristics.1.2 Scope and PurposeThis guide is intended to provide a basis for synthetic testing of circuit breakers (see ANSI/IEEEC37.04-1979 2) andto establish the criteria for

32、testing to demonstrate the short-circuit current rating of circuit breakers on a single phasebasis.It is recognized that other test requirements exist (such as capacitor switching, or line dropping) but they will bereserved for future consideration.The guide contains typical circuits for demonstrati

33、ng interrupting capability. These circuits are those in general useand their inclusion should not exclude the development of additional circuits to demonstrate specific capabilities.The purpose of this guide is to establish criteria for synthetic testing and for the proper evaluation of results. Suc

34、hcriteria will establish validity of the test method without imposing restraints on innovation and improvement of testcircuitry.1Numbers in brackets correspond to those of the References, Section 3 of this guide.2 Copyright 1981 IEEE All Rights ReservedANSI/IEEE C37.081-1981 GUIDE FOR SYNTHETIC FAUL

35、T TESTING OF AC HIGH-VOLTAGE2. Definitionsauxiliary circuit breaker: The circuit breaker used to disconnect the current circuit from direct connection with thetest circuit breaker.current circuit: That part of the synthetic test circuit from which the major part of the power frequency current isobta

36、ined.current injection method: A synthetic test method in which the voltage circuit is applied to the test circuit breakerbefore power frequency current zero.direct test: A test in which the applied voltage, current, and recovery voltage is obtained from a single power source,which may be comprised

37、of generators, transformers, networks, or combinations of these.distorted current: The current through the test circuit breaker which is influenced by the arc voltage of both the testand auxiliary circuit breakers during the high current interval (Fig 9).injected current: The current which flows thr

38、ough the test circuit breaker from the voltage source of a currentinjection circuit when this circuit is applied to the test circuit breaker.injected-current frequency: The frequency of the injected current.injection time: The time with respect to the power frequency current zero when the voltage ci

39、rcuit is applied.post-arc current: The current which flows through the arc gap of a circuit breaker immediately after current zero, andwhich has a substantially lower magnitude than the test current.prospective current: The current that would flow if it were not influenced by the circuit breaker.syn

40、thetic test: A test in which the major part of, or the total current, is obtained from one source (current circuit), andthe major part of, or all of the transient recovery voltage from a separate source or sources (voltage circuit).test circuit breaker: The circuit breaker under test.voltage circuit

41、: That part of the synthetic test circuit from which the major part of the test voltage is obtained.voltage-injection method: A synthetic test method in which the voltage circuit is applied to the test circuit breakerafter power frequency current zero.3. References1 ANSI C37.06-1979, Preferred Ratin

42、gs and Related Required Capabilities for AC High-Voltage Circuit BreakersRated on a Symmetrical Current Basic (Consolidated Edition)2 2 ANSI/IEEE C37.04-1979, Rating Structure for AC High-Voltage Circuit Breakers Rated on a Symmetrical CurrentBasis (Consolidated Edition, including Supplements C37.04

43、a, C37.04b, and C37.04c) 3 ANSI/IEEE C37.09-1979, Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical CurrentBasis (Consolidated Edition) 2ANSI documents are available from The American National Standards Institute, 1430 Boardway, New York, N.Y. 10018.Copyright 1981 IEEE All R

44、ights Reserved 3CIRCUIT BREAKERS RATED ON A SYMMETRICAL CURRENT BASIS ANSI/IEEE C37.081-19814. Short-Circuit Current Interruption Process4.1 Circuit Breaker Performance During Interruption; Basic IntervalsThe Circuit breaker has two basic positions: closed and opened. In the closed position the circ

45、uit breaker conducts fullcurrent with negligible voltage drop across its contacts. In the open position it conducts negligible current but with fullvoltage across the contacts. This defines two main stresses, the current stress and the voltage stress, that are separatedin time.However, the main func

46、tion of the circuit breaker is neither to conduct nor to isolate. It performs its main function inchanging from one condition to the other, that is, the switching operation. If closer attention is paid to the voltage andcurrent stresses during the interrupting test (Fig 1), three main intervals can

47、be recognized.Figure 1 Three Basic Intervals of Interrupting Process4.1.1 High-Current IntervalThe high-current interval is the time from contact separation to the significant change in arc voltage preceding theinteraction and high-voltage intervals.4.1.2 Interaction IntervalThe interaction interval

48、 is the time from the significant change in arc voltage prior to current zero to the time when thecurrent including the post arc current, if any, ceases to flow through the test breaker.4.1.3 High-Voltage IntervalThe high-voltage interval is the time from the moment when the current including the po

49、st arc current, if any, ceasesto flow through the test breaker to the end of the test.4 Copyright 1981 IEEE All Rights ReservedANSI/IEEE C37.081-1981 GUIDE FOR SYNTHETIC FAULT TESTING OF AC HIGH-VOLTAGE4.2 State of Interrupting ProcessThe three intervals described in 4.1.1 to 4.1.3 follow each other immediately, that is, they cover the whole interruptingprocess without any discontinuities, even though it might be difficult to establish precisely the moment when oneinterval ends and the other begins. However, this accuracy may not be required.4.2.1 State of Interru