IEEE C37 081A-1997 en Supplement to IEEE Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis 8 3 2 Recove.pdf

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1、iIEEE Std C37.081a-1997 (R2007)(Supplement to IEEE Std C37.081-1981)Supplement to IEEE Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis8.3.2: Recovery Voltage for Terminal Faults; Asymmetrical Short-Circuit CurrentSponsorSwitchgear Committeeo

2、f theIEEE Power Engineering SocietyApproved 9 December 1997Reaffirmed 21 March 2007IEEE Standards BoardAbstract: The transient recovery voltage needs to be modified when interrupting asymmetrical currents.The voltage rate R, the peak voltage E2 and the rate of change of current di/dt all change with

3、 theasymmetrical current zero. Guidance is provided on how to make these corrections when compared to thesymmetrical case.Keywords: asymmetrical current, correction factors, major current zeros, minor current zeros, X/R ratioThe Institute of Electrical and Electronics Engineers, Inc.345 East 47th St

4、reet, New York, NY 10017-2394, USACopyright 1998 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1998. Printed in the United States of AmericaISBN 1-55937-994-4iiIEEE Standards documents are developed within the IEEE Societies and the Standards Coordinati

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15、is standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be requ

16、ired by an IEEE standard or for conducting inquiries into the legal validity or scopeof those patents that are brought to its attention.iiiIntroduction(This introduction is not part of IEEE Std C37.081a-1997, Supplement to IEEE Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Ra

17、ted on a Symmetrical Current Basis8.3.2: Recovery Voltage for Terminal Faults; AsymmetricalShort-Circuit Current.)This supplement was prepared by the Working Group on Synthetic Testing of The High Voltage Circuit BreakerSubcommittee. At the time this guide was approved the working group had the foll

18、owing membership:H. Melvin Smith, Chair Anne BosmaDenis DufournetCharles HandHarold HessRobert JeanJeanGeorge MontilletYasin MusaEric RuossJames SailorsRoger SarkinenKirk SmithGuy St. JeanWim van der Linden The following persons were on the balloting committee:Roy W. AlexanderJ. G. AngelisRichard H.

19、 ArndtSteve AtkinsonL. Ronald BeardHarvey L. BowlesMatthew BrownJohn H. BrunkeRaymond L. CapraAlexander DixonJ. J. DravisC. J. DvorakPeter W. DwyerRuben D. GarzonLouis W. GaussaKeith I. GrayKenneth HendrixHarold L. HessJerry M. JerabekP. L. KolarikDavid G. KumberaStephen R. LambertWard E. LaubachJoh

20、n G. LeachGeorge N. LesterDon LottE. L. LuehringP. C. MayoAndrew K. McCabeLawrence V. McCallWilliam C. McKayDon C. MillsAlec C. MonroeGeorges F. MontilletF. J. MuenchJames F. ODonnellRaymond P. OLearyA. F. ParksDavid F. PeeloGordon O. PerkinsR. Kris RanjanJames C. RansomDavid N. ReynoldsHugh C. Ross

21、Tim E. RoysterLarry H. SchmidtE. W. SchmunkCurt A. SchwalbeDevki N. SharmaGuy St. JeanDavid L. SwindlerJohn S. TanneryStan H. TelanderFrederick C. TeufelThomas J. TobinEdward F. VeverkaCharles L. WagnerivWhen the IEEE Standards Board approved this supplement on 9 December 1997, it had the following

22、membership:Donald C. Loughry, Chair Richard J. Holleman, Vice Chair Andrew G. Salem, Secretary Clyde R. CampStephen L. DiamondHarold E. EpsteinDonald C. FleckensteinJay Forster*Thomas F. GarrityDonald N. HeirmanJim IsaakBen C. JohnsonLowell JohnsonRobert KennellyE. G. “Al” KienerJoseph L. Koepfinger

23、*Stephen R. LambertLawrence V. McCallL. Bruce McClungMarco W. MigliaroLouis-Franois PauGerald H. PetersonJohn W. PopeJose R. RamosRonald H. ReimerIngo RschJohn S. RyanChee Kiow TanHoward L. Wolfman*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. Aggar

24、walAlan H. CooksonNoelle HumenickIEEE Standards Project EditorvCLAUSE PAGERevisions to IEEE Std C37.081-1981.18.3.2 Recovery voltage for terminal faults; asymmetrical short-circuit current 1Annex B (Informative)41Supplement to IEEE Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breaker

25、s Rated on a Symmetrical Current Basis8.3.2: Recovery Voltage for Terminal Faults; Asymmetrical Short-Circuit CurrentRevisions to IEEE Std C37.081-1981The contents of this supplement will be incorporated into IEEE Std C37.081 in a future edition. At that time figuresand tables will be labeled sequen

26、tially. This supplement is intended to be used in conjunction with IEEE Std C37.081-1981. Editing instructions necessary to incorporate this supplement into IEEE Std C37.081 are provided in bold italics.8.3.2 Recovery voltage for terminal faults; asymmetrical short-circuit currentReplace subclause 8

27、.3.2 with the following:The transient recovery voltage rate R and peak E2, together with the di/dt of the current at current zero forasymmetrical faults needs to be modified in accordance with the degree of asymmetry of the fault current. The normalpower frequency recovery voltage is sinusoidal with

28、 a value equal to that of the symmetrical fault current case.The basis of rating for asymmetrical faults is a fully offset current with a decrement based on an X/R of 17. The totalcurrent dc component and voltage are shown in Figure 8.3.2-1 for this condition. From this it can be seen that currentze

29、ros occur at the times shown in Table 8.3.2-1 with the corresponding degree of asymmetry D.For circuit breakers with rated maximum voltages of 121 kV to 242 kV and for 362 kV test duties 1 to 3 as listed inC37.09-1979 Table 2, the di/dt rated rate R and E2values are adjusted using the correction fac

30、tor F1in Table 8.3.2-12 Copyright 1998 IEEE All Rights ReservedIEEE Std C37.081a-1997 RECOVERY VOLTAGE FOR TERMINAL FAULTSfor the current zero at which interruption is attempted. For TRVs with T2not exceeding 500 s, the reduction of di/dtfor current injection methods may be obtained by reducing the

31、charging voltage of the voltage circuit.For the other rated maximum design voltages listed, the di/dt and the rated rate R are also adjusted by the same factorF1. During the relatively long T2times for these ratings there is a significant change in the power frequency voltage,and the peak E2needs to

32、 be further modified because of this. The correction factor FEfor the adjustment of the peakvoltage E2is listed in Table 8.3.2-1. The correction factor FEis calculated using the equations of Annex B.When the test is made for clearance at the end of a major loop, the dc form of the recovery voltage w

33、ill adequatelycover the first quarter loop of the recovery voltage (of an equivalent direct test). For clearance at the end of a minorloop of current, the dc form of the reduced recovery voltage will not cover the basis of rating condition since, in thiscase, the power-frequency recovery voltage con

34、tinues to rise after the onset of the TRV. Figure 8.3.2-1 Total current dc component and voltageCircuit interruption after a minor loop with reduced di/dt and resulting TRV is assumed to be less severe than theequivalent symmetrical test. If it is required to prove this condition, there are three po

35、ssibilities:a) The test is performed with asymmetrical current conditions with the voltage source charged as for thesymmetrical test. It must be recognized that this represents a considerable increase in severity above that ofan equivalent direct test since both di/dt and the TRV are higher.b) The t

36、est is performed as under a) except that the inductance of the injection circuit is increased in inverseproportion to di/dt. In this case, the di/dt value is correct but the TRV is higher.c) The test is performed with an ac recovery voltage.Copyright 1998 IEEE All Rights Reserved 3ASYMMETRICAL SHORT

37、-CIRCUIT CURRENT IEEE Std C37.081a-1997Table 8.3.2-1 Correction factors for adjustment of peak voltageCurrentzero no.LooptypeTime ofzerosAsymmetryfactorDCorrectionfactor F1Correction factor FE362 kV 550 kV 800 kV100% 4060% 100% 4060% 100%1 Major 14.64 0.723 0.733 0.573 0.594 0.475 0.575 0.4422 Minor

38、 18.93 0.657 0.716 0.854 0.836 0.940 0.853 0.9703 Major 30.58 0.508 0.890 0.784 0.799 0.715 0.785 0.6924 Minor 36.27 0.447 0.869 0.959 0.947 1.018 0.958 1.0385 Major 46.79 0.354 0.956 0.883 0.893 0.835 0.884 0.8196 Minor 53.34 0.306 0.934 0.995 0.987 1.036 0.995 1.0497 Major 63.16 0.246 0.983 0.933

39、0.940 0.900 0.934 0.8898 Minor 70.27 0.210 0.966 1.007 1.001 1.035 1.007 1.0444 Copyright 1998 IEEE All Rights ReservedIEEE Std C37.081a-1997Annex B (Informative)Add Appendix B as follows:Correction factor calculationThe correction factors may be determined using the following equations:Correction f

40、actor F1= where:D is current with major loop+D is current with minor loopD is the per unit asymmetric factorX/R is 17NAF is Natural Amplitude Factor for the dependent time coordinate of the transient recovery voltageFor voltage ratings with T2times greater than 500 s, the following equations were us

41、ed: = 2 x pi x fWhere D is the per unit asymmetric factor, all angles are in radians, amplitude factor (AF) for E2is 1.44; assumes firstpole to clear factor of 1.5.Correction factor FE= crest factor (CF)/AFSubstituting NAF in CF:1 D2()DX()R-NAF AF 1arcXR-tan T2+sin+=CF NAF 1() a0sin a0T2+()sin+=a0arc Dcos arc1 D2XR-tan=FE1AF- AF arcXR-tan T2+sin a0sin a0T2+()sin+t=