IEEE 1624-2008 en Organizational Reliability Capability《组织可靠性能力的IEEE标准》.pdf
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1、IEEE Std 1624-2008IEEE Standard for OrganizationalReliability Capability IEEE3 Park Avenue New York, NY 10016-5997, USA5 February 2009IEEE Reliability Standards Committee Sponsored by theIEEE Reliability Society1624TMIEEE Std 1624TM-2008 IEEE Standard for Organizational Reliability Capability Sponso
2、r IEEE Reliability Standards Committee of the IEEE Reliability Society Approved 26 September 2008 IEEE-SA Standards Board Abstract: Organizational reliability capability and the identification of the criteria for assessing the reliability capability of an organization are defined. Keywords: assessme
3、nt, organizational reliability capability, reliability capability, reliability management, reliability program, supply chain The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2009 by the Institute of Electrical and Electronics Engineers
4、, Inc. All rights reserved. Published 5 February 2009. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clea
5、rance Center. iv Copyright 2009 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1624-2008, IEEE Standard for Organizational Reliability Capability. This standard establishes the criteria for assessing the reliability capability of an organization. Organizational rel
6、iability capability is characterized by key processes and associated metrics. This standard can be used for self-assessment by organizations or for supplier/customer relationship development between members of a supply chain. The standard could also be used to assure conformance to existing supplier
7、/customer reliability requirements. This standard does not seek to create or propose creation of certifying bodies to assess reliability capability of a company. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the prov
8、isions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in com
9、pliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-reg
10、ulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards shoul
11、d be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with an
12、y amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standard
13、s.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. v Copyright 2009 IEEE. All rights reserved. Errata Errata, if any, for this and al
14、l other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee
15、/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection ther
16、ewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of A
17、ssurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be o
18、btained from the IEEE Standards Association. vi Copyright 2009 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Reliability Standards Working Group had the following membership: Michael Pecht, Chair Diganta Das, Vice Cha
19、ir Jerry Cartwright, Secretary Michael H. Azarian, Technical Editor Alan Wood, Associate Technical Editor Jon Elerath Louis J. Gullo Harold Hart Tyrone Jackson Ari Jain Fred Schenkelberg Jack Sherman Sanjay Tiku The following members of the individual balloting committee voted on this standard. Ball
20、oters may have voted for approval, disapproval, or abstention. Gary Arntson Ali Al Awazi Michael H. Azarian Bakul Banerjee Hugh Barrass Thomas Basso Juris Borzovs Pieter Botman J. Bruder Jeffrey Burnworth Massimo Cardaci Juan Carreon Norbert Carte Lawrence Catchpole Keith Chow Raul Colcher John Cole
21、 Geoffrey Darnton Diganta Das Thomas Dineen Carlo Donati Ernest Duckworth Sourav Dutta Jon Elerath Harriet Feldman David Friscia Gregg Giesler Lewis Gray Randall Groves Louis J. Gullo John Harauz Werner Hoelzl Gary Hoffman Robert Holibaugh Atsushi Ito Mark Jaeger Piotr Karocki Jim Kulchisky Saumen K
22、undu David J. Leciston Albert Livshitz Edward Mccall Gary Michel William Milam James Moore Jerry Murphy Rajesh Murthy Prajit Nair Michael S. Newman Satoshi Oyama Donald Parker Kevin Patton Mark Paulk William Petit Ulrich Pohl Edward Rafter Annette Reilly Michael Roberts Robert Robinson Charles Roger
23、s Terence Rout Michael Rush Robert Schaaf Fred Schenkelberg Richard Schrenker Stephen Schwarm Jack Sherman Hyeong Sim Carl Singer James E. Smith Luca Spotorno Thomas Starai Raymond Strittmatter Walter Struppler Marcy Stutzman Alourdes Sully Thomas Tullia John Vergis Charlene Walrad Mark Walton John
24、Walz Alan Wood Oren Yuen Janusz Zalewski Alexandru Zamfirescuvii Copyright 2009 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 26 September 2008, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith
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