IEEE 1232 1-1997 en Trial Use - Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) Data and Knowledge Specificat.pdf

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1、 IEEE Std 1232.1-1997IEEE Std 1232.1-1997IEEE Trial-Use Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments(AI-ESTATE): Data and Knowledge SpecificationIEEE Standards Coordinating Committee 20 (SCC 20) onAbbreviated Test Language for All Systems (ATLAS)5 September

2、1997 SH 94521The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1997 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1997. Printed in the United States of America.ISBN 1-55937-912-XNo par

3、t of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1232.1-1997IEEE Trial-Use Standard forArtificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Data and Kn

4、owledge SpecificationSponsored byIEEE Standards Coordinating Committee 20 (SCC 20) onAbbreviated Test Language for All Systems (ATLAS)Approved 20 March 1997IEEE Standards BoardAbstract:Formal models for information used in system diagnosis are defined. As part of theAI-ESTATE set of standards, this

5、standard includes several models that form the basis for a for-mat to facilitate exchange of persistent diagnostic information between two reasoners, and alsoprovides a formal typing system for the services defined in the AI-ESTATE service specification.Keywords:AI-ESTATE, artificial intelligence, d

6、iagnosis, enhanced diagnostic inference model,fault tree model IEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Standards Board. Members of the committees serve voluntarily andwithout compensation. They are not necessarily members

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9、 to change brought about through developments inthe state of the art and comments received from users of the standard. Every IEEE Standard is sub-jected to review at least every five years for revision or reaffirmation. When a document is morethan five years old and has not been reaffirmed, it is re

10、asonable to conclude that its contents,although still of some value, do not wholly reflect the present state of the art. Users are cautioned tocheck to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, rega

11、rdless ofmembership affiliation with IEEE. Suggestions for changes in documents should be in the form of aproposed change of text, together with appropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards asthey relate to specific

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13、urrence of a balance of interests. For this reason, IEEE and the members of itssocieties and Standards Coordinating Committees are not able to provide an instant response tointerpretation requests except in those cases where the matter has previously received formalconsideration. Comments on standar

14、ds and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use isgranted by the Institute of Electrical and Electronics Enginee

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16、 for educational class-room use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect t

17、o the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.iii

18、IntroductionThis introduction is not part of IEEE Std 1232.1-1997, IEEE Trial-Use Standard for Artificial Intelligence Exchangeand Service Tie to All Test Environments (AI-ESTATE): Data and Knowledge Specification.The AI-ESTATE (Artificial Intelligence Exchange and Service Tie to All Test Environmen

19、ts) set of standardsis intended to provide a formal framework for exchanging diagnostic knowledge and constructing diagnosticreasoners. The intent is to provide a standard framework for identifying required information for diagnosisand defining the diagnostic information in a machine-processable way

20、. In addition, software interfaces arebeing defined whereby diagnostic tools can be developed to process the diagnostic information in a consis-tent and reliable way.This component standard of the AI-ESTATE family defines formal models for information used in systemdiagnosis. It is not the intent of

21、 IEEE Std 1232.1-1997 to define the information needed for testing systems.Such standards exist (e.g., IEEE Std 716-1995, IEEE Std 1226-1993, and IEEE Std 1149.1-1990) and can beused in conjunction with this standard. This standard defines the relationships between test information andthe diagnoses

22、that can be drawn from that information.Specifically,this standard includes several models, defined in EXPRESS (ISO 10303-11: 1994), which areused in two ways. First, these models form the basis for a format to facilitate exchange of persistent diagnosticinformation between two reasoners. The format

23、 used is based on EXPRESS-I (ISO/TR 10303-12: 1997) andis directly derivable from the EXPRESS models. Second, these models provide a formal typing system for theservices defined in the AI-ESTATE service specification. The types of information used by the services definedby AI-ESTATE shall conform to

24、 the information defined by the models in this standard.This standard is organized with a model in the body defining common entities to all types of diagnosis. Sev-eral normative annexes are included that define reasoning-specific models. Currently, normative annexeshave been defined for a fault tre

25、e model (i.e., a fixed decision tree based on identified test outcomes) and anenhanced diagnostic inference model (i.e., a propositional model tying test outcomes to possible diagnoses).Both types of models are in wide use in industry today, which indicates their wide acceptance in systemdiagnoses.

26、It is anticipated that additional models will be defined in the future, perhaps addressing concernsof diagnostic constraints, diagnostic rules, and diagnostic neural networks. In all cases, the underlying themewill be diagnosis.Publication of this trial-use standard for comment and criticism has bee

27、n approved by the In-stitute of Electrical and Electronics Engineers. Trial-use standards are effective for 24 monthsfrom the date of publication. Comments for revision will be accepted for 18 months after pub-lication. Suggestions for revision should be directed to the Secretary, IEEE Standards Boa

28、rd,445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, and should be received no laterthan 5 September 1999. It is expected that following the 24-month period, this trial-use stan-dard, revised as necessary, shall be submitted to the IEEE Standards Board for approval as afull-use standard. ivAt

29、 the time that this standard was completed, the Al-ESTATE subcommittee had the following membership:John W. Sheppard, Data and Knowledge Representation Working Group, Co-ChairGregory P. Bowman,Data and Knowledge Representation Working Group, Co-ChairLeslie A. Orlidge, AI-ESTATE, Co-Chair Helmut Sche

30、ibenzuber, AI-ESTATE,Co-ChairOther individuals who have contributed review and comments are:Guy AdamDarrell BartzMichael BlairGregory BowmanDavid BrooksLawrence D. CarpenterElaine CasharRichard ChurcherGeorge ClariusChristopher ConnellyJames Cottrell Bernard DathySomnath DebBernd DinklageRob Fletche

31、rSteve FortierKen FoxArnold GreenspanGreg GriffesGary HardenburgMike HeilmanJohn HeiserFrancis KearnsJames LewisRichard MaguireMichael MartinRobert McGarveyHarry McGuckin James MillsMukund ModiTom NewtonDave NicholsHans ObermeierEd PerkinsJean PouillyJohn Powell N. RamachandranBill ReevesBill Rodrig

32、uezDavid RoggendorffHoward SavageMike SeaveyJohn SheppardLee ShombertWilliam R Simpson Joseph StancoWilliam TaylorKirk ThompsonJrg UrbanRichard WegerDan WeissTim WilmeringWill YoungJonas strandTimothy BearsChristus BezirtzoglouMaria BosticPatrice BrardRonald BrooksFrank Conforti Serhat EnanChristine

33、 FisherJacques FlandroisSharon GoodallT. Winston Griffin Arthur HannJames HannaLeonard HaynesDan InmanJon J. KasprickHelmuth KaunzingeBrian KellePaul Knese Mats LanderholmRichard LazarusJiunn-Jyh LinPeter LordColin MaunderKrishna PattipatiRichard WalkervThe following persons were on the balloting co

34、mmittee:When the IEEE Standards Board approved this standard on 20 March 1997, it had the followingmembership:Donald C. Loughry,ChairRichard J. Holleman,Vice ChairAndrew G. Salem,Secretary*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalAlan H

35、. CooksonLisa S. YoungIEEE Standards Project EditorGuy AdamMichel BantegnieJean-Yves BarbierDarrell O. BartzStephen M. BowenGregory BowmanAlan L. BridgesAntonius BunsenLarry D. CarpenterE. Elaine CasharRichard D. ChurcherWilliam ColmerBernard DathyJeffrey S. DeanBernd DinklageMichael T. EllisHorst D

36、. EyWilliam Brit FrankSharon GoodallMichael N. GranieriGary L. HardenburgRaymond L. HasenstabRobert G. HayesMike HeilmanJohn E. HeiserWesley HigakiJohn LeutheJames L. LewisAlfred LowensteinMichael S. MartinRobert L. McGarveyJames M. MillsMukund U. ModiCharles MorrisDavid S. MorrisRichard E. NeeseHan

37、s ObermeierRoy OishiLeslie A. OrlidgeDennis C. PetersonNarayanan RamachandranWilliam E. ReevesDavid RoggendorffWilliam E. Russell, Jr.Eric SacherHelmut ScheibenzuberJohn B. SchroederMichael L. SeaveyJohn W. SheppardLee A. ShombertWilliam R. SimpsonJoseph J. StancoRobert StasonisLawrence J. Stockwell

38、William John TaylorKirk D. ThompsonC. Richard UnkleRonald WaxmanJ. Richard WegerDaniel H. WeissLynn WheelwrightKenneth D. WilkinsonRoger L. WilliamsTimothy J. WilmeringGregory WinterWill W. YoungRobert W. ZimbardiClyde R. CampStephen L. DiamondHarold E. EpsteinDonald C. FleckensteinJay Forster*Thoma

39、s F. GarrityDonald N. HeirmanJim IsaakBen C. JohnsonLowell JohnsonRobert KennellyE. G. “Al” KienerJoseph L. Koepfinger*Stephen R. LambertLawrence V. McCallL. Bruce McClungMarco W. MigliaroLouis-Franois PauGerald H. PetersonJohn W. PopeJose R. RamosRonald H. ReimerIngo RschJohn S. RyanChee Kiow TanHo

40、ward L. WolfmanviContentsCLAUSE PAGE1. Overview. 11.1 Scope 21.2 Purpose. 31.3 Application. 31.4 Conventions used in this document . 42. References 43. Definitions 54. Description. 54.1 Objectives 54.2 Interchange format. 64.3 Relationship to AI-ESTATE architecture 64.4 Extensibility . 65. Specifica

41、tion 85.1 Overview 85.2 AI-ESTATE Common Element Model . 86. Conformance 46ANNEXAnnex A (informative) Bibliography 47Annex B (informative) Summary of EXPRESS Terms 50B.1 Schema. 50B.2 Entity 51B.3 Attribute . 51B.4 Type Definition 52B.5 Subtypes/Supertypes53B.6 External schema references 54B.7 Const

42、raints and WHERE clauses. 55B.8 Page references in EXPRESS-G 56B.9 Functions 57viiANNEX PAGEAnnex C (normative) AI-ESTATE Fault Tree Model 58C.1 fault_tree_model 59C.2 fault_tree_step 60C.3 test_result . 61C.4 Fault Tree Model EXPRESS specification 62C.5 Example model 63C.6 Conformance 77Annex D (no

43、rmative) AI-ESTATE Enhanced Diagnostic Inference Model. 79D.1 diagnostic_inference 80D.2 enhanced_diagnostic_inference_model . 81D.3 inference. 81D.4 outcome_inference. 83D.5 test_inference . 84D.6 Enhanced diagnostic inference model EXPRESS specification 84D.7 Example model 85D.8 Conformance 102vii

44、iIEEE Trial-Use Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE):Data and Knowledge Specification1. OverviewThis standard describes a set of formal data and knowledge specifications consisting of the logical represen-tation of devices, their constitu

45、ents, the failure modes of those constituents, and tests of those constituents.This standard is one component of a set of AI-ESTATE standards. The data and knowledge specification pro-vides a standard representation of the common data elements required for system test and diagnosis. Thiswill ensure

46、portability of test-related knowledge bases for intelligent system test and diagnosis.The goals of this component of the AI-ESTATE standard, formally defined in IEEE Std 1232-1995,1aresummarized as follows: Incorporate domain specific terminology; Facilitate portability of diagnostic knowledge; Perm

47、it extensibility of diagnostic knowledge.This standard shall use the vocabulary and semantics of the test and diagnosis domain by incorporating ter-minology from Clause 3 of IEEE Std 12321995, existing IEEE standards, and trial-use standards wherepossible. Deviations from this shall be kept to a min

48、imum and shall be explicitly defined to the user at firstoccurrence.This AI-ESTATE standard shall provide a controlled extension mechanism to allow inclusion of new tech-nology outside the scope of the AI-ESTATE data and knowledge specification definitions.IEEE Std 1232.1-1997 defines information mo

49、dels for knowledge bases to be used in the context of test anddiagnosis, and from these models, to derive a data interchange format. The specifications in this standard1Information on references can be found in Clause 2.IEEEStd 1232.1-1997 AI-ESTATE2shall support fully portable diagnostic knowledge. No host computer dependence shall be contained in theAI-ESTATE standards. Host system dependence shall not be included in the AI-ESTATE data and knowl-edge specification.IEEE Std 1232.1-1997 shall define key data and knowledge specification formats. Implementations that useonly these sp